Plasma functionalization of AFM tips for measurement of chemical interactions.
In this paper, a new, fast, reproducible technique for atomic force microscopy (AFM) tips functionalization used for chemical interaction measurements is described. Precisely, the deposition of an aminated precursor is performed through plasma-enhanced chemical vapor deposition (PECVD) in order to create amine functional groups on the AFM tip and cantilever. The advantages of the precursor, aminopropyltriethoxysilane (APTES), were recently demonstrated for amine layer formation through PECVD deposition on polymeric surfaces. We extended this procedure to functionalize AFM probes. Titration force spectroscopy highlights the successful functionalization of AFM tips as well as their stability and use under different environmental conditions.
Volcke
Cedric
C
Biomedical Diagnostics Institute (BDI), Dublin City University, Collins Avenue, Glasnevin, Dublin 9, Ireland. cedric.volcke@fundp.ac.be
Gandhiraman
Ram Prasad
RP
Gubala
Vladimir
V
Doyle
Colin
C
Fonder
G
G
Thiry
Paul A
PA
Cafolla
Attilio A
AA
James
Bryony
B
Williams
David E
DE
D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods*; D011437:Propylamines / Q000737:chemistry; D012821:Silanes / Q000737:chemistry
D011437:Propylamines; D012821:Silanes; C477625:amino-propyl-triethoxysilane