Prospects for 3D imaging of dopant atoms in ceramic interfaces.
Expanding upon recent experimental results for a Y-doped Sigma13 alpha-Al(2)O(3) grain boundary, we explore through simulation the extent to which plan-view imaging of buried interfaces may be possible (cf. the more usual cross-section imaging). As we show in detail, that case was significantly aided by the normal to the interface plane being a high-order zone axis orientation, giving the visibility of the Y atoms a remarkable insensitivity to the specimen thickness and the depth of the interface plane. The visibility along lower order zone axis orientations and the visibility of different dopant species are discussed.
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Bunkyo, Tokyo, Japan. scott@sigma.t.u-tokyo.ac.jp
Scott D
SD
Findlay
Naoya
N
Shibata
Shinya
S
Azuma
Yuichi
Y
Ikuhara