Measurement of the refractive-index profile in polycrystalline germanium-silicon alloy GRIN crystals.
The refractive index as a function of spatial coordinate in three Czochralski grown germanium-silicon alloy GRIN crystals has been measured using ac interferometric techniques. The interferometer is capable of high phase resolution and is computer controlled for real-time data processing. The measured refractive-index profiles were compared to theoretical profiles which were calculated from a model based on the segregation effect of silicon in germanium.
D P
DP
Naughton
J J
JJ
Miceli
D T
DT
Moore