Optical constant determination of thin films.
A method for the determination of the complex index of thin films is described based on the reflectance of the film in the presence and absence of a transparent overcoat film. It is shown that by proper choice of overcoat film, the real and imaginary components (n and k) of the index can be separated so that a simple graphical representation is achieved for unique determination of n and k.
Gupta
M C
MC