Photothermal deflection technique for measuring thermal nonlinearities in semiconductor glasses.
The photothermal deflection technique is used to determine the thermal nonlinearity in samples of glasses doped with CdS(x)Se(1-x). Values of the nonlinear refractive index are derived at low frequencies; they compare with recently obtained dc values in similar, but not equal, glasses.
Bertolotti
M
M
Ferrari
A
A
Sibilia
C
C
Suber
G
G
Apostol
D
D
Jani
P
P