Theoretical model of errors in micromirror-based three-dimensional particle tracking.
Several recently developed particle-tracking and imaging methods have achieved three-dimensional sensitivity through the introduction of angled micromirrors into the observation volume of an optical microscope. We model the imaging response of such devices and show how the direct and reflected images of a fluorescent particle are affected. In particle-tracking applications, asymmetric image degradation manifests itself as systematic tracking errors. Based on our results, we identify strategies for reducing systematic errors to the 10nm level in practical applications.
Center for Nanoscale Science and Technology, National Institute of Standards and Technology,Gaithersburg, Maryland 20899, USA. andrew.berglund@nist.gov
Andrew J
AJ
Berglund
Matthew D
MD
McMahon
Jabez J
JJ
McClelland
J Alexander
JA
Liddle
D001704:Biopolymers / Q000032:analysis*; D003198:Computer Simulation; D004867:Equipment Design; D019544:Equipment Failure Analysis; D021621:Imaging, Three-Dimensional / Q000379:methods*; D007909:Lenses; D008853:Microscopy / Q000295:instrumentation*; D008962:Models, Theoretical; D010316:Particle Size; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity
D001704:Biopolymers