Tests performed with the improved MEGA spectrometer.
In a previous paper [S. Engman and P. Lindblom, Appl. Opt. 23, 3341 (1984)] a new type of spectrometer, based on the multiechelle grating arrangement (MEGA) principle, was described. The expected resolution and principles of operation were verified. However, at that time the spectrometer was equipped with poor gratings that did not allow its testing in spectroscopic applications. Since then, new gratings have been obtained and improvements made to the system. This paper reports the spectroscopic tests made with the improved instrument. It is shown that the MEGA spectrometer is a useful new tool for optical spectroscopy.
O
O
Gustafsson
P
P
Lindblom