Accurate diffuse reflection measurements in the infrared spectral range.
A sphere arrangement for directional-hemispherical reflectance measurements in the 1-15-microm wavelength range is tested for its accuracy. Comparative measurements with the fundamental PTB sphere reflectometer in the overlapping spectral range between 1.0 and 1.1 microm indicate no systematic measurement uncertainties of the new device. The uncertainty of the reflectance measured by it is therefrom deduced to be +/-0.01 for the 1-5.6-microm wavelength range.
Richter
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Erb
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