Ion microscopy with resonant ionization mass spectrometry: time-of-flight depth profiling with improved isotopic precision.
There are four generally mutually exclusive requirements that plague many mass spectrometric measurements of trace constituents: (1) the small size (limited by the depth probed) of many interesting materials requires high useful yields to simply detect some trace elements, (2) the low concentrations of interesting elements require efficient discrimination from isobaric interferences, (3) it is often necessary to measure the depth distribution of elements with high surface and low bulk contributions, and (4) many applications require precise isotopic analysis. Resonant ionization mass spectrometry has made dramatic progress in addressing these difficulties over the past five years.
Pellin
Michael J
MJ
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA. pellin@anl.gov
Veryovkin
Igor V
IV
Levine
Jonathan
J
Zinovev
Alexander
A
Davis
Andrew M
AM
Stephan
Thomas
T
Tripa
C Emil
CE
King
Bruce V
BV
Savina
Michael R
MR