Characterization of ion-exchanged planar microlenses by ray tracing.
For the design and optimization of the fabrication condition of distributed-index planar microlenses, it is necessary to evaluate the N. A., focal length, focused spot, and aberration of a fabricated lens. In this paper, a ray tracing method is improved for this purpose, and properties of planar microlenses aie evaluated. An ion concentration matrix is proposed to simplify lens design.
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