Photothermal deflection technique for measuring thermal nonlinearities in semiconductor glasses.
The photothermal deflection technique is used to determine the thermal nonlinearity in samples of glasses doped with CdS(x)Se(1-x). Values of the nonlinear refractive index are derived at low frequencies; they compare with recently obtained dc values in similar, but not equal, glasses.
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M
Bertolotti
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A
Ferrari
C
C
Sibilia
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G
Suber
D
D
Apostol
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P
Jani