Phase shifting thin film multilayers for Michelson interferometers.
The design and construction of a set of four high reflectance metal-dielectric thin film multilayers which produce phase changes on reflection that differ by 90 degrees in the 0.55-0.77-microm spectral range are described. This provides the basis for a new type of optical Doppler Michelson imaging interferometer for use in upper atmospheric studies in which achromatic phase shifts are produced without mirror motions.
McCall
S H
SH
Dobrowolski
J A
JA
Shepherd
G G
GG