title: Measurement of electric field distribution using a conventional transmission electron microscope.
abstract: A simple and quick method to measure the electric field distribution near a specimen using a conventional transmission electron microscope has been developed. The electric field distribution around a field emitter needle was measured to evaluate the performance of the method. It was found that this method allows us to measure the 2D distribution of electric field quantitatively with error of <10% with submicron spatial resolution. The dedicated aperture and software to construct an automated analysis system have been developed.
authors.affiliation: Department of Quantum Engineering, Nagoya University, Nagoya, Japan. khsasaki@nagoya-u.jp
authors.forename: Katsuhiro
authors.initials: K
authors.lastname: Sasaki
authors.forename: Hiroto
authors.initials: H
authors.lastname: Mori
authors.forename: Nobuyuki
authors.initials: N
authors.lastname: Tanaka
authors.forename: Hidekazu
authors.initials: H
authors.lastname: Murata
authors.forename: Chiaki
authors.initials: C
authors.lastname: Morita
authors.forename: Hiroshi
authors.initials: H
authors.lastname: Shimoyama
authors.forename: Kotaro
authors.initials: K
authors.lastname: Kuroda