title: A bi-prism interferometer for hard X-ray photons.
abstract: Micro-fabricated bi-prisms have been used to create an interference pattern from an incident hard X-ray beam, and the intensity of the pattern probed with fluorescence from a 30 nm-thick metal film. Maximum fringe visibility exceeded 0.9 owing to the nano-sized probe and the choice of single-crystal prism material. A full near-field analysis is necessary to describe the fringe field intensities, and the transverse coherence lengths were extracted at APS beamline 8-ID-I. It is also shown that the maximum number of fringes is dependent only on the complex refractive index of the prism material.
authors.affiliation: Brookhaven National Laboratory, Upton, NY 11973, USA.
authors.forename: A F
authors.initials: AF
authors.lastname: Isakovic
authors.forename: A
authors.initials: A
authors.lastname: Stein
authors.forename: J B
authors.initials: JB
authors.lastname: Warren
authors.forename: A R
authors.initials: AR
authors.lastname: Sandy
authors.forename: S
authors.initials: S
authors.lastname: Narayanan
authors.forename: M
authors.initials: M
authors.lastname: Sprung
authors.forename: J M
authors.initials: JM
authors.lastname: Ablett
authors.forename: D P
authors.initials: DP
authors.lastname: Siddons
authors.forename: M
authors.initials: M
authors.lastname: Metzler
authors.forename: K
authors.initials: K
authors.lastname: Evans-Lutterodt