Dense high aspect ratio hydrogen silsesquioxane nanostructures by 100 keV electron beam lithography.
We investigated the fabrication of dense, high aspect ratio hydrogen silsesquioxane (HSQ) nanostructures by 100 keV electron beam lithography. The samples were developed using a high contrast developer and supercritically dried in carbon dioxide. Dense gratings with line widths down to 25 nm were patterned in 500 nm-thick resist layers and semi-dense gratings with line widths down to 10 nm (40 nm pitch) were patterned in 250 nm-thick resist layers. The dense HSQ nanostructures were used as molds for gold electrodeposition, and the semi-dense HSQ gratings were iridium-coated by atomic layer deposition. We used these methods to produce Fresnel zone plates with extreme aspect ratio for scanning transmission x-ray microscopy that showed excellent performance at 1.0 keV photon energy.
Vila-Comamala
Joan
J
Paul Scherrer Institut, Villigen CH-5232, Switzerland. joan.vila@psi.ch
Gorelick
Sergey
S
Guzenko
Vitaliy A
VA
Färm
Elina
E
Ritala
Mikko
M
David
Christian
C