title: Phase shifting thin film multilayers for Michelson interferometers.
abstract: The design and construction of a set of four high reflectance metal-dielectric thin film multilayers which produce phase changes on reflection that differ by 90 degrees in the 0.55-0.77-microm spectral range are described. This provides the basis for a new type of optical Doppler Michelson imaging interferometer for use in upper atmospheric studies in which achromatic phase shifts are produced without mirror motions.
authors.forename: S H
authors.initials: SH
authors.lastname: McCall
authors.forename: J A
authors.initials: JA
authors.lastname: Dobrowolski
authors.forename: G G
authors.initials: GG
authors.lastname: Shepherd