title: Determination of dielectric permittivity and thickness of a metal layer from a surface plasmon resonance experiment.
abstract: In this paper we present a fast method for the determination of dielectric permittivity epsilon= -epsilon(r) + iepsilon(i) and thickness d of metal layers from surface plasmon resonance reflection curves. The method is an iteration process using starting parameters derived directly from a reflection curve. The method is tested with simulations and is applied to experimental results. Accuracies reached for silver layers between 25-100 nm and gold layers between 40-75 nm are better than: epsilon(r) +/-1%; epsilon(i) +/-13% and d +/-8%.
authors.forename: H E
authors.initials: HE
authors.lastname: Bruijn
authors.forename: R P
authors.initials: RP
authors.lastname: Kooyman
authors.forename: J
authors.initials: J
authors.lastname: Greve