title: Index profile simulation for a planar microlens by electromigration.
abstract: This paper describes how to predict the refractive-index profile in a field assisted ion-exchange process. Since the dielectric constant varies during the ion exchange, the field correction has been considered using the Lorentz-Lorenz formula. The index profile of a planar microlens is simulated by numerically solving a drift-diffusion equation for dopant ions in a glass and the result agrees well with the measured one.
authors.forename: X
authors.initials: X
authors.lastname: Zhu
authors.forename: H
authors.initials: H
authors.lastname: Sugiyama
authors.forename: K
authors.initials: K
authors.lastname: Iga