Index profile simulation for a planar microlens by electromigration.
This paper describes how to predict the refractive-index profile in a field assisted ion-exchange process. Since the dielectric constant varies during the ion exchange, the field correction has been considered using the Lorentz-Lorenz formula. The index profile of a planar microlens is simulated by numerically solving a drift-diffusion equation for dopant ions in a glass and the result agrees well with the measured one.
Zhu
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X
Sugiyama
H
H
Iga
K
K