title: Thickness and refractive index dispersion measurement in a thin film using the Haidinger interferometer.
abstract: A Haidinger interferometer setup was adapted for accurate measurement of thickness and refractive index dispersion in transparent films using some spectral lines of a commercial argon-ion laser. Experimental results are reported and compared with those from other available methods.
authors.forename: E A
authors.initials: EA
authors.lastname: de Oliveira
authors.forename: J
authors.initials: J
authors.lastname: Frejlich