title: Thickness matching in planar multilayer waveguides.
abstract: A theoretical method is described from which the thickness of an arbitrary layer in a dielectric multilayer stack is determined if all other thicknesses and all refractive indices are given, such that a prescribed effective index for a given mode of the stack is obtained. The same theory can determine the optimal cover thickness of such a stack for prism coupling. Experimental verification shows effective indices that are in agreement with the designed values.
authors.forename: H J
authors.initials: HJ
authors.lastname: Frankena
authors.forename: J
authors.initials: J
authors.lastname: Jong
authors.forename: H
authors.initials: H
authors.lastname: Oltmans
authors.forename: H
authors.initials: H
authors.lastname: van Brug