title: Angle-resolved photoemission spectroscopy and imaging with a submicrometre probe at the SPECTROMICROSCOPY-3.2L beamline of Elettra.
abstract: The extensive upgrade of the experimental end-station of the SPECTROMICROSCOPY-3.2L beamline at Elettra synchrotron light source is reported. After the upgrade, angle-resolved photoemission spectroscopy from a submicrometre spot and scanning microscopy images monitoring the photoelectron signal inside selected acquisition angle and energy windows can be performed. As a test case, angle-resolved photoemission spectroscopy from single flakes of highly oriented pyrolitic graphite and imaging of the flakes with image contrast owing to rotation of the band dispersion of different flakes are presented.
authors.affiliation: Elettra-Sincrotrone Trieste ScPA, SS 14 km, 163.5 in AREA Science Park, Basovizza, Trieste, Italy.
authors.forename: Pavel
authors.initials: P
authors.lastname: Dudin
authors.forename: Paolo
authors.initials: P
authors.lastname: Lacovig
authors.forename: Claudio
authors.initials: C
authors.lastname: Fava
authors.forename: Eugenio
authors.initials: E
authors.lastname: Nicolini
authors.forename: Anna
authors.initials: A
authors.lastname: Bianco
authors.forename: Giuseppe
authors.initials: G
authors.lastname: Cautero
authors.forename: Alexei
authors.initials: A
authors.lastname: Barinov