Reflectometer for measurements of scattering from photodiodes and other low scattering surfaces.
We have designed and tested a simple instrument to measure the diffuse reflectance of good quality optical surfaces such as the surfaces of semiconductor detectors with uncertainties of ~3%. Measurements have been performed on Si photodiodes and on a sample of known reflectance at two different wavelengths.
Köhler
R
R
Luther
J L
JL
Geist
J
J