title: Optical characterization of thin films by guided waves.
abstract: The study of guided waves in a thin layer allows a precise characterization of refractive index and thickness. Optical anisotropy can also be measured. We show how this technique can be applied to the characterization of a multilayer structure.
authors.forename: E
authors.initials: E
authors.lastname: Pelletier
authors.forename: F
authors.initials: F
authors.lastname: Flory
authors.forename: Y
authors.initials: Y
authors.lastname: Hu