title: Reflectometer for measurements of scattering from photodiodes and other low scattering surfaces.
abstract: We have designed and tested a simple instrument to measure the diffuse reflectance of good quality optical surfaces such as the surfaces of semiconductor detectors with uncertainties of ~3%. Measurements have been performed on Si photodiodes and on a sample of known reflectance at two different wavelengths.
authors.forename: R
authors.initials: R
authors.lastname: Köhler
authors.forename: J L
authors.initials: JL
authors.lastname: Luther
authors.forename: J
authors.initials: J
authors.lastname: Geist