title: Determination of the extinction coefficient of dielectric thin films from spectrophotometric measurements.
abstract: Data obtained from reflectance and transmittance measurements are used to determine the extinction coefficient. We show that accuracy is limited by the substrate quality and interface roughnesses of the layer.
authors.forename: J P
authors.initials: JP
authors.lastname: Borgogno
authors.forename: E
authors.initials: E
authors.lastname: Pelletier