title: Contouring by electronic speckle pattern interferometry employing dual beam illumination.
abstract: In this paper we extend and study the method for generating contours of diffuse objects employing a dual beam illumination coupled with electronic speckle pattern interferometry. The sensitivity and the orientation of the contour planes are analyzed. A novel method for tilting the planes of contours and experimental results incorporating phase shifting and fringe analysis are also presented. The theoretical and the experimental results show good agreement.
authors.forename: C
authors.initials: C
authors.lastname: Joenathan
authors.forename: B
authors.initials: B
authors.lastname: Pfister
authors.forename: H J
authors.initials: HJ
authors.lastname: Tiziani