title: Measurement of refractive index and thickness of transparent plate by dual-wavelength interference.
abstract: We developed an accurate and efficient method for measuring the refractive indices of a transparent plate by analyzing the transmitted intensity versus angle of incidence. By using two different wavelengths, we resolved the 2pi-ambiguity inherent to the phase measurement involving a thick medium, leading to independent determination of the absolute index of refraction and the thickness with a relative uncertainty of 10(-5). The validity and the accuracy of our method were confirmed with a standard reference material. Furthermore, our method is insensitive to environmental perturbations, and simple to implement, compared to the conventional index measurement methods providing similar accuracy.
authors.affiliation: Department of Physics, Pusan National University Busan 609-735, Korea.
authors.forename: Hee Joo
authors.initials: HJ
authors.lastname: Choi
authors.forename: Hwan Hong
authors.initials: HH
authors.lastname: Lim
authors.forename: Han Seb
authors.initials: HS
authors.lastname: Moon
authors.forename: Tae Bong
authors.initials: TB
authors.lastname: Eom
authors.forename: Jung Jin
authors.initials: JJ
authors.lastname: Ju
authors.forename: Myoungsik
authors.initials: M
authors.lastname: Cha