title: Modified elliptically polarized light Z-scan method for studying third-order nonlinear susceptibility components.
abstract: The normal elliptically polarized light Z-scan method is modified by adding a quarter-wave plate and an analyzer before the detector. The normalized transmittance formulas of modified elliptically polarized light Z-scan are obtained for media with negligible nonlinear absorption. Compared with normal linearly and elliptically polarized light Z-scan methods, an increase of sensitivity by a factor of larger than 4 is achieved for the real part of third-order susceptibility component's measurements using this modified elliptically polarized light Z-scan method. The analytical results are verified by studying the real part of independent susceptibility components of CS(2) liquid. Moreover, the potential application for cross-polarized wave generation is discussed.
authors.affiliation: The Key Laboratory of Weak Light Nonlinear Photonics, Ministry of Education, Teda Applied Physics School, Nankai University, Tianjin 300457, China.
authors.forename: Xiao-Qing
authors.initials: XQ
authors.lastname: Yan
authors.forename: Zhi-Bo
authors.initials: ZB
authors.lastname: Liu
authors.forename: Xiao-Liang
authors.initials: XL
authors.lastname: Zhang
authors.forename: Wei-Ping
authors.initials: WP
authors.lastname: Zang
authors.forename: Jian-Guo
authors.initials: JG
authors.lastname: Tian
mesh_terms: D003198:Computer Simulation; D008027:Light; D008962:Models, Theoretical; D017711:Nonlinear Dynamics; D012031:Refractometry / Q000379:methods*; D012542:Scattering, Radiation