title: Cell parameter measurement of a twisted nematic liquid crystal device using interferometric polarimeter under normal incidence.
abstract: Five cell parameters of a twisted nematic liquid crystal device (TNLCD), namely, cell gap, pretilt angle, twisted angle, rubbing angle, and phase retardation are precisely measured by the developed amplitude-sensitive heterodyne polarimeter (ASHP) simultaneously integrated with Yeh and Gu's transfer matrix and Lien's transfer matrix. This proposed method can characterize the five cell parameters under the arrangement of a single wavelength at normal incidence. In contrast to the conventional methods on cell parameter detection either by adopting a multiple wavelength laser beam at normal incidence or by using a single wavelength laser beam under oblique incident to TNLCD, this method presents the advantage of not only having a simple setup but also the possibility to measure simultaneously five cell parameters on the characterization of TNLCD at high speed.
authors.affiliation: Graduate Institute of Electro-Optical Engineering, Chang Gung University, Taoyuan 333, Taiwan.
authors.forename: Meng-Han
authors.initials: MH
authors.lastname: Liu
authors.forename: Wen-Chuan
authors.initials: WC
authors.lastname: Kuo
authors.forename: Hsiang-Chun
authors.initials: HC
authors.lastname: Wei
authors.forename: Chien-Chung
authors.initials: CC
authors.lastname: Tsai
authors.forename: Chih-Jen
authors.initials: CJ
authors.lastname: Yu
authors.forename: Bau-Jy
authors.initials: BJ
authors.lastname: Liang
authors.forename: Chien
authors.initials: C
authors.lastname: Chou