title: On the experimental investigation of the electric and magnetic response of a single nano-structure.
abstract: We demonstrate an experimental method to separately test the optical response of a single sub-wavelength nano-structure to tailored electric and magnetic field distributions in the optical domain. For this purpose a highly focused y-polarized TEM10-mode is used which exhibits spatially separated longitudinal magnetic and transverse electric field patterns. By displacing a single sub-wavelength nano-structure, namely a single split-ring resonator (SRR), in the focal plane, different coupling scenarios can be achieved. It is shown experimentally that the single split-ring resonator tested here responds dominantly as an electric dipole. A much smaller but yet statistically significant magnetic dipole contribution is also measured by investigating the interaction of a single SRR with a magnetic field component perpendicular to the SRR plane (which is equivalent to the curl of the electric field) as well as by analyzing the intensity and polarization distribution of the scattered light with high spatial resolution. The developed experimental setup as well as the measurement techniques presented in this paper are a versatile tool to investigate the optical properties of single sub-wavelength nano-structures.
authors.affiliation: Max Planck Institute for the Science of Light, Guenther-Scharowsky-Str. 1, D-91058 Erlangen, Germany. peter.banzer@mpl.mpg.de
authors.forename: Peter
authors.initials: P
authors.lastname: Banzer
authors.forename: Ulf
authors.initials: U
authors.lastname: Peschel
authors.forename: Susanne
authors.initials: S
authors.lastname: Quabis
authors.forename: Gerd
authors.initials: G
authors.lastname: Leuchs
mesh_terms: D004574:Electromagnetic Fields; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008027:Light; D008280:Magnetics / Q000295:instrumentation*; D008422:Materials Testing / Q000295:instrumentation*; D049329:Nanostructures / Q000737:chemistry* / Q000528:radiation effects*; D012031:Refractometry / Q000295:instrumentation* / Q000379:methods*; D012542:Scattering, Radiation