title: Dependence of beam broadening on detection angle in scanning transmission electron microtomography.
abstract: It has been shown that scanning transmission electron microtomography (STEMT) is quite effective for observing specimens with thicknesses on the order of micrometers in three dimensions (3D). In STEMT, the specimen is scanned using a focused electron beam, and the electrons from the convergence point are detected at the detector placed at a certain detection angle. Until recently, a wide detection angle corresponding to the mode often called the dark-field (DF) mode was mainly used. Although the detection angle can vary and is one of the crucial experimental factors in STEMT, its effect on 3D reconstruction has never been discussed from either an experimental or a theoretical viewpoint. Moreover, the effectiveness of another mode of electron tomography, transmission electron microtomography (TEMT), is not clear. In the present study, a polymeric specimen, an acrylonitrile butadiene styrene resin, with a thickness of ~1 mum and a fixed volume was observed using three different modes, namely, TEMT, small detection-angle STEMT referred to as bright-field STEMT, and DF-STEMT, in order to examine their advantages and disadvantages by observing multiple scattering of electrons inside the specimen.
authors.affiliation: Electron Optics Division, JEOL Ltd., 3-chome Akishima, Tokyo, Japan.
authors.forename: Sohei
authors.initials: S
authors.lastname: Motoki
authors.forename: Takeshi
authors.initials: T
authors.lastname: Kaneko
authors.forename: Yoshitaka
authors.initials: Y
authors.lastname: Aoyama
authors.forename: Hideo
authors.initials: H
authors.lastname: Nishioka
authors.forename: Yoshihiro
authors.initials: Y
authors.lastname: Okura
authors.forename: Yukihito
authors.initials: Y
authors.lastname: Kondo
authors.forename: Hiroshi
authors.initials: H
authors.lastname: Jinnai