Identification of local silicon cluster nanostructures inside Si(x)Ge(1-x) alloy nanocrystals by Raman spectroscopy.
By experimentally examining and theoretically analyzing the Raman spectra of Si(x)Ge(1-x) nanocrystal-embedded silica films, we show that the 430 cm(-1) Si-Si optical phonon mode can be used as a fingerprint to identify the existence of local silicon cluster nanostructures inside Si(x)Ge(1-x) nanocrystals with high silicon content.
Liu
L Z
LZ
Nanjing National Laboratory of Microstructures and Department of Physics, Nanjing University, Nanjing 210093, PR China.
Wu
X L
XL
Shen
J C
JC
Li
T H
TH
Gao
F
F
Chu
Paul K
PK