Modified elliptically polarized light Z-scan method for studying third-order nonlinear susceptibility components.
The normal elliptically polarized light Z-scan method is modified by adding a quarter-wave plate and an analyzer before the detector. The normalized transmittance formulas of modified elliptically polarized light Z-scan are obtained for media with negligible nonlinear absorption. Compared with normal linearly and elliptically polarized light Z-scan methods, an increase of sensitivity by a factor of larger than 4 is achieved for the real part of third-order susceptibility component's measurements using this modified elliptically polarized light Z-scan method. The analytical results are verified by studying the real part of independent susceptibility components of CS(2) liquid. Moreover, the potential application for cross-polarized wave generation is discussed.
Yan
Xiao-Qing
XQ
The Key Laboratory of Weak Light Nonlinear Photonics, Ministry of Education, Teda Applied Physics School, Nankai University, Tianjin 300457, China.
Liu
Zhi-Bo
ZB
Zhang
Xiao-Liang
XL
Zang
Wei-Ping
WP
Tian
Jian-Guo
JG
D003198:Computer Simulation; D008027:Light; D008962:Models, Theoretical; D017711:Nonlinear Dynamics; D012031:Refractometry / Q000379:methods*; D012542:Scattering, Radiation