title: Single-shot picosecond interferometry with one-nanometer resolution for dynamical surface morphology using a soft X-ray laser.
abstract: Using highly coherent radiation at a wavelength of 13.9 nm from a Ag-plasma soft X-ray laser, we constructed a pump-and-probe interferometer based on a double Lloyd's mirror system. The spatial resolutions are evaluated with a test pattern, showing 1.8-mum lateral resolution, and 1-nm depth sensitivity. This instrument enables a single-shot observation of the surface morphology with a 7-ps time-resolution. We succeeded in observing a nanometer scale surface dilation of Pt films at the early stage of the ablation process initiated by a 70 fs near infrared pump pulse.
authors.affiliation: Institute for Solid State Physics, The University of Tokyo, Kashiwa-shi, Chiba, Japan.
authors.forename: Tohru
authors.initials: T
authors.lastname: Suemoto
authors.forename: Kota
authors.initials: K
authors.lastname: Terakawa
authors.forename: Yoshihiro
authors.initials: Y
authors.lastname: Ochi
authors.forename: Takuro
authors.initials: T
authors.lastname: Tomita
authors.forename: Minoru
authors.initials: M
authors.lastname: Yamamoto
authors.forename: Noboru
authors.initials: N
authors.lastname: Hasegawa
authors.forename: Manato
authors.initials: M
authors.lastname: Deki
authors.forename: Yasuo
authors.initials: Y
authors.lastname: Minami
authors.forename: Tetsuya
authors.initials: T
authors.lastname: Kawachi
mesh_terms: D004867:Equipment Design; D007368:Interferometry / Q000379:methods*; D007834:Lasers; D008855:Microscopy, Electron, Scanning; D008962:Models, Theoretical; D053758:Nanoparticles; D036103:Nanotechnology / Q000295:instrumentation* / Q000379:methods*; D010984:Platinum; D012822:Silicon Dioxide; D014466:Ultraviolet Rays; D014965:X-Rays
chemical_list: D010984:Platinum; D012822:Silicon Dioxide