Rigorous modal analysis of silicon strip nanoscale waveguides.
A full-vectorial H-field Finite Element Method has been used for the rigorous modal analysis of silicon strip waveguides. The spatial variation of the full-vectorial H and E-fields are also discussed in details and further, the Poynting vector is also presented. The modal area, hybridness, single mode operation and birefringence are also described for such silicon strip waveguides.
Leung
D M H
DM
School of Engineering and Mathematical Sciences, City University London, Northampton Sq, London, EC1V 0HB England UK. D.M.H.Leung@city.ac.uk
Kejalakshmy
N
N
Rahman
B M A
BM
Grattan
K T V
KT