title: Identification of local silicon cluster nanostructures inside Si(x)Ge(1-x) alloy nanocrystals by Raman spectroscopy.
abstract: By experimentally examining and theoretically analyzing the Raman spectra of Si(x)Ge(1-x) nanocrystal-embedded silica films, we show that the 430 cm(-1) Si-Si optical phonon mode can be used as a fingerprint to identify the existence of local silicon cluster nanostructures inside Si(x)Ge(1-x) nanocrystals with high silicon content.
authors.affiliation: Nanjing National Laboratory of Microstructures and Department of Physics, Nanjing University, Nanjing 210093, PR China.
authors.forename: L Z
authors.initials: LZ
authors.lastname: Liu
authors.forename: X L
authors.initials: XL
authors.lastname: Wu
authors.forename: J C
authors.initials: JC
authors.lastname: Shen
authors.forename: T H
authors.initials: TH
authors.lastname: Li
authors.forename: F
authors.initials: F
authors.lastname: Gao
authors.forename: Paul K
authors.initials: PK
authors.lastname: Chu