title: Method for characterizing nanoscale wear of atomic force microscope tips.
abstract: Atomic force microscopy (AFM) is a powerful tool for studying tribology (adhesion, friction, and lubrication) at the nanoscale and is emerging as a critical tool for nanomanufacturing. However, nanoscale wear is a key limitation of conventional AFM probes that are made of silicon and silicon nitride (SiNx). Here we present a method for systematically quantifying tip wear, which consists of sequential contact-mode AFM scans on ultrananocrystalline diamond surfaces with intermittent measurements of the tip properties using blind reconstruction, adhesion force measurements, and transmission electron microscopy (TEM). We demonstrate direct measurement of volume loss over the wear test and agreement between blind reconstruction and TEM imaging. The geometries of various types of tips were monitored over a scanning distance of approximately 100 mm. The results show multiple failure mechanisms for different materials, including nanoscale fracture of a monolithic Si tip upon initial engagement with the surface, film failure of a SiNx-coated Si tip, and gradual, progressive wear of monolithic SiNx tips consistent with atom-by-atom attrition. Overall, the method provides a quantitative and systematic process for examining tip degradation and nanoscale wear, and the experimental results illustrate the multiple mechanisms that may lead to tip failure.
authors.affiliation: Materials Science Program, Department of Mechanical Engineering, University of Wisconsin, Madison, Wisconsin 53706, USA.
authors.forename: Jingjing
authors.initials: J
authors.lastname: Liu
authors.forename: Jacob K
authors.initials: JK
authors.lastname: Notbohm
authors.forename: Robert W
authors.initials: RW
authors.lastname: Carpick
authors.forename: Kevin T
authors.initials: KT
authors.lastname: Turner