High-resolution x-ray observation of unstained samples by a newly developed SGXM.
Analytical methods with nanometre-scale resolution are indispensable in various scientific fields, including biology, chemistry and nanotechnology. One suitable tool, the soft x-ray microscope, provides high spatial resolution of unstained specimens. Recently, we developed an x-ray microscope called a scanning electron generation x-ray microscope (SGXM). This system had attached additional x-ray detection equipment to the scanning electron microscope (SEM). Here, we describe a new sample stage containing an improved x-ray emission film that enables the acquisition of high-resolution x-ray images of unstained samples. The method proposed in this study, which uses the new SGXM, enables us to acquire x-ray images by using an intact, conventional SEM without additional x-ray detection equipment. Moreover, experiments demonstrate that the new SGXM achieves a spatial resolution of 11 nm. Therefore, our system can be easily used for acquiring high-resolution images of a variety of samples across a broad range of scientific fields.
Ogura
Toshihiko
T
Biomedical Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Central 2, Umezono, Tsukuba, Ibaraki 305-8568, Japan. t-ogura@aist.go.jp
D003198:Computer Simulation; D005407:Flagella / Q000737:chemistry; D008855:Microscopy, Electron, Scanning / Q000379:methods*; D009010:Monte Carlo Method; D016354:Rhodobacter capsulatus / Q000737:chemistry / Q000166:cytology; D012965:Sodium Chloride / Q000737:chemistry; D014965:X-Rays
D012965:Sodium Chloride