title: Intrinsic detection of scattering phase with near-field scanning optical microscope.
abstract: We show that the interferometric interaction between the tip and the sample is inherently measured by a near-field scanning optical microscope (NSOM) operating in reflection mode. This is demonstrated by measuring the phase of the sample reflectivity on a standard multilayer system with variable thickness. The demonstrated intrinsic sensitivity to the phase has implications in the interpretation of images collected by using reflection mode NSOM.
authors.affiliation: CREOL, The College of Optics and Photonics, University of Central Florida, 4000 Central Florida Boulevard, Orlando, Florida 32816, USA.
authors.forename: Dana C
authors.initials: DC
authors.lastname: Kohlgraf-Owens
authors.forename: David
authors.initials: D
authors.lastname: Haefner
authors.forename: Sergey
authors.initials: S
authors.lastname: Sukhov
authors.forename: Aristide
authors.initials: A
authors.lastname: Dogariu