Intrinsic detection of scattering phase with near-field scanning optical microscope.
We show that the interferometric interaction between the tip and the sample is inherently measured by a near-field scanning optical microscope (NSOM) operating in reflection mode. This is demonstrated by measuring the phase of the sample reflectivity on a standard multilayer system with variable thickness. The demonstrated intrinsic sensitivity to the phase has implications in the interpretation of images collected by using reflection mode NSOM.
Kohlgraf-Owens
Dana C
DC
CREOL, The College of Optics and Photonics, University of Central Florida, 4000 Central Florida Boulevard, Orlando, Florida 32816, USA.
Haefner
David
D
Sukhov
Sergey
S
Dogariu
Aristide
A