title: Effect of free carriers on pump-to-signal noise transfer in silicon Raman amplifiers.
abstract: We study noise transfer from pump to signal in silicon Raman amplifiers, with particular emphasis on the regimes of strong cumulative free-carrier absorption and heavy pump depletion. We calculate the relative intensity noise (RIN) transfers in copumped and counterpumped amplifiers and provide intuitive explanations for RIN peculiarities. We show that noise transfer at low frequencies may be suppressed by carefully choosing the pump intensity, effective free-carrier lifetime, or amplifier length, but only at the expense of a rise in noise at high frequencies.
authors.affiliation: Advanced Computing and Simulation Laboratory, Monash University, Clayton, Victoria 3800, Australia. ivan.rukhlenko@monash.edu
authors.forename: Ivan D
authors.initials: ID
authors.lastname: Rukhlenko
authors.forename: Indika
authors.initials: I
authors.lastname: Udagedara
authors.forename: Malin
authors.initials: M
authors.lastname: Premaratne
authors.forename: Govind P
authors.initials: GP
authors.lastname: Agrawal