title: Study on Resistance Switching Properties of Na0.5Bi0.5TiO3Thin Films Using Impedance Spectroscopy.
abstract: The Na0.5Bi0.5TiO3(NBT) thin films sandwiched between Au electrodes and fluorine-doped tin oxide (FTO) conducting glass were deposited using a sol-gel method. Based on electrochemical workstation measurements, reproducible resistance switching characteristics and negative differential resistances were obtained at room temperature. A local impedance spectroscopy measurement of Au/NBT was performed to reveal the interface-related electrical characteristics. The DC-bias-dependent impedance spectra suggested the occurrence of charge and mass transfer at the interface of the Au/NBT/FTO device. It was proposed that the first and the second ionization of oxygen vacancies are responsible for the conduction in the low- and high-resistance states, respectively. The experimental results showed high potential for nonvolatile memory applications in NBT thin films.
authors.affiliation: Key Laboratory of Photovoltaic Materials of Henan Province, School of Physics and Electronics, He'nan University, 475004, Kaifeng, People's Republic of China. wfzhang@henu.edu.cn.
authors.forename: Ting
authors.initials: T
authors.lastname: Zhang
authors.forename: Xinan
authors.initials: X
authors.lastname: Zhang
authors.forename: Linghong
authors.initials: L
authors.lastname: Ding
authors.forename: Weifeng
authors.initials: W
authors.lastname: Zhang