Precise detection of two-dimensional displacement based on nonlinear lateral photovoltaic effect.
Although the lateral photovoltaic effect (LPE) can be used to detect very small displacement owing to its linear characteristic of the lateral photovoltage (LPV) response to laser position, the effective measurement is limited only within the one-dimensional (1D) region between two contacts. In this work, we report a way to detect two-dimensional (2D) displacement based on a nonlinear LPE in a metal-semiconductor (MS) structure. In addition, compared with the conventional 1D method, this 2D detection possesses a much higher precision owing to its independence of LPV sensitivity of the structure, indicating it as a candidate for the new type of MS-based 2D photoelectric devices.
Yu
Chong Qi
CQ
Department of Physics, The State Key Laboratory on Fiber Optic Local Area Communication Networksand Advanced Optical Communication Systems, Key Laboratory for Thin Filmand Microfabrication Technology of the Ministry of Education,Shanghai Jiao Tong University,800 Dongchuan Road Shanghai 200240, China.
Wang
Hui
H