Thickness dependence of dielectric nonlinearity of lead zirconate titanate films.
The first-order reversal curves (FORC) distribution of PbZr(0.52)Ti(0.48)O3 thin films was characterized as a function of film thickness. It was found that the thickness dependence of the small-field dielectric constant is due primarily to differences in the domain wall contributions to the properties. The irreversible FORC distribution decreased and the switching fields increased as the thickness decreased; this is compatible with reported Rayleigh analyses. The polarization-electric field data and the ac field dependence of the dielectric constant were modeled using the FORC distributions, and were found to give a good fit to the experimental results. Some discrepancies remain in the high-field dielectric constant, probably caused by its definition.
Fujii
Ichiro
I
Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, USA. izf100@psu.edu
Hong
Eunki
E
Trolier-McKinstry
Susan
S