Ultrahigh-sensitivity single-photon detection with linear-mode silicon avalanche photodiode.
We developed an ultrahigh-sensitivity single-photon detector using a linear-mode avalanche photodiode (APD) with a cryogenic low-noise readout circuit; the APD is operated at 78K. The noise-equivalent power of the detector is as low as 2.2x10(-20)W/Hz(1/2) at a wavelength of 450nm. The photon-detection efficiency and dark-count rate (DCR) are 0.72 and 0.0008counts/s, respectively. A low DCR is achieved by thermal treatment for reducing the trapped carriers when the thermal treatment temperature is above 100K.
Akiba
Makoto
M
Quantum ICT Group, National Institute of Information and Communications Technology,4-2-1 Nukui-Kitamachi, Koganei, Tokyo 184-8795, Japan. akiba@nict.go.jp
Tsujino
Kenji
K
Sasaki
Masahide
M