Optical properties of poly(ferrocenylsilane) multilayer thin films.
Spectroscopic ellipsometry has been used to investigate the optical properties of poly(ferrocenylsilane) polyion multilayer thin films in the visible and near-infrared range of the spectrum. The thin films were deposited using the layer-by-layer assembly process. Films with thicknesses of up to 55 nm were fabricated stepwise from polyelectrolyte solutions with a controlled ionic strength. These films allow an accurate characterization of the optical properties of poly(ferrocenylsilane) polyion layers. We show that the complex refractive index can be described by a simple Cauchy model. Refractive index values vary over the spectral range from 1.53 (near-infrared) to 1.8 (ultraviolet).
Kooij
E Stefan
ES
Solid State Physics, MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, 7500AE Enschede, The Netherlands. e.s.kooij@tnw.utwente.nl
Ma
Yujie
Y
Hempenius
Mark A
MA
Vancso
G Julius
GJ
Poelsema
Bene
B
D005296:Ferrous Compounds / Q000737:chemistry*; D008567:Membranes, Artificial; D015394:Molecular Structure; D055095:Optics and Photonics; D012821:Silanes / Q000737:chemistry*
D005296:Ferrous Compounds; D008567:Membranes, Artificial; D012821:Silanes; C554070:poly(ferrocenylsilane)