A simple hard x-ray "nanoslit" for measuring wavefront intensity.
A new method is proposed for nanoscale hard x-ray measurements. This method uses a reflection on a heavy-metal wire that functions as a single slit with a nanoscale aperture for a parallel x-ray beam. This "nanoslit" can be used to perform high-spatial-resolution measurements of the intensity distribution of a wavefront that diverges from an aperture. In experiments, Fresnel fringes generated by a rectangular aperture were measured using a 300-microm-diameter platinum wire as the nanoslit. In these experiments, the finest fringes with a period of 26 nm could be successfully resolved.
Takano
Hidekazu
H
Graduate School of Material Science, University of Hyogo, Kouto 3-2-1, Hyogo 678-1297, Japan.
Hashimoto
Takuto
T
Tsuji
Takuya
T
Koyama
Takahisa
T
Tsusaka
Yoshiyuki
Y
Kagoshima
Yasushi
Y