title: A simple hard x-ray "nanoslit" for measuring wavefront intensity.
abstract: A new method is proposed for nanoscale hard x-ray measurements. This method uses a reflection on a heavy-metal wire that functions as a single slit with a nanoscale aperture for a parallel x-ray beam. This "nanoslit" can be used to perform high-spatial-resolution measurements of the intensity distribution of a wavefront that diverges from an aperture. In experiments, Fresnel fringes generated by a rectangular aperture were measured using a 300-microm-diameter platinum wire as the nanoslit. In these experiments, the finest fringes with a period of 26 nm could be successfully resolved.
authors.affiliation: Graduate School of Material Science, University of Hyogo, Kouto 3-2-1, Hyogo 678-1297, Japan.
authors.forename: Hidekazu
authors.initials: H
authors.lastname: Takano
authors.forename: Takuto
authors.initials: T
authors.lastname: Hashimoto
authors.forename: Takuya
authors.initials: T
authors.lastname: Tsuji
authors.forename: Takahisa
authors.initials: T
authors.lastname: Koyama
authors.forename: Yoshiyuki
authors.initials: Y
authors.lastname: Tsusaka
authors.forename: Yasushi
authors.initials: Y
authors.lastname: Kagoshima