title: Thickness dependence of dielectric nonlinearity of lead zirconate titanate films.
abstract: The first-order reversal curves (FORC) distribution of PbZr(0.52)Ti(0.48)O3 thin films was characterized as a function of film thickness. It was found that the thickness dependence of the small-field dielectric constant is due primarily to differences in the domain wall contributions to the properties. The irreversible FORC distribution decreased and the switching fields increased as the thickness decreased; this is compatible with reported Rayleigh analyses. The polarization-electric field data and the ac field dependence of the dielectric constant were modeled using the FORC distributions, and were found to give a good fit to the experimental results. Some discrepancies remain in the high-field dielectric constant, probably caused by its definition.
authors.affiliation: Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, USA. izf100@psu.edu
authors.forename: Ichiro
authors.initials: I
authors.lastname: Fujii
authors.forename: Eunki
authors.initials: E
authors.lastname: Hong
authors.forename: Susan
authors.initials: S
authors.lastname: Trolier-McKinstry