title: Real space mapping of Li-ion transport in amorphous Si anodes with nanometer resolution.
abstract: The electrical bias driven Li-ion motion in silicon anode materials in thin film battery heterostructures is investigated using electrochemical strain microscopy (ESM), which is a newly developed scanning probe microscopy based characterization method. ESM utilizes the intrinsic link between bias-controlled Li-ion concentration and molar volume of electrode materials, providing the capability for studies on the sub-20 nm scale, and allows the relationship between Li-ion flow and microstructure to be established. The evolution of Li-ion transport during the battery charging is directly observed.
authors.affiliation: Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA. balken@ornl.gov
authors.forename: Nina
authors.initials: N
authors.lastname: Balke
authors.forename: Stephen
authors.initials: S
authors.lastname: Jesse
authors.forename: Yoongu
authors.initials: Y
authors.lastname: Kim
authors.forename: Leslie
authors.initials: L
authors.lastname: Adamczyk
authors.forename: Alexander
authors.initials: A
authors.lastname: Tselev
authors.forename: Ilia N
authors.initials: IN
authors.lastname: Ivanov
authors.forename: Nancy J
authors.initials: NJ
authors.lastname: Dudney
authors.forename: Sergei V
authors.initials: SV
authors.lastname: Kalinin