title: Mechanisms of decoherence in electron microscopy.
abstract: The understanding and where possible the minimisation of decoherence mechanisms in electron microscopy were first studied in plasmon loss, diffraction contrast images but are of even more acute relevance in high resolution TEM phase contrast imaging and electron holography. With the development of phase retrieval techniques they merit further attention particularly when their effect cannot be eliminated by currently available energy filters. The roles of electronic excitation, thermal diffuse scattering, transition radiation and bremsstrahlung are examined here not only in the specimen but also in the electron optical column. Terahertz-range aloof beam electronic excitation appears to account satisfactorily for recent observations of decoherence in electron holography. An apparent low frequency divergence can emerge for the calculated classical bremsstrahlung event probability but can be ignored for photon wavelengths exceeding the required coherence distance or path lengths in the equipment. Most bremsstrahlung event probabilities are negligibly important except possibly in large-angle bending magnets or mandolin systems. A more reliable procedure for subtracting thermal diffuse scattering from diffraction pattern intensities is proposed.
authors.affiliation: Cavendish Laboratory, University of Cambridge, J.J. Thomson Avenue, Cambridge CB30HE, UK. ah30@cam.ac.uk
authors.forename: A
authors.initials: A
authors.lastname: Howie
mesh_terms: D004583:Electrons; D006696:Holography; D008027:Light; D046529:Microscopy, Electron, Transmission / Q000379:methods*; D008962:Models, Theoretical; D017785:Photons; D012542:Scattering, Radiation