title: Optical properties of poly(ferrocenylsilane) multilayer thin films.
abstract: Spectroscopic ellipsometry has been used to investigate the optical properties of poly(ferrocenylsilane) polyion multilayer thin films in the visible and near-infrared range of the spectrum. The thin films were deposited using the layer-by-layer assembly process. Films with thicknesses of up to 55 nm were fabricated stepwise from polyelectrolyte solutions with a controlled ionic strength. These films allow an accurate characterization of the optical properties of poly(ferrocenylsilane) polyion layers. We show that the complex refractive index can be described by a simple Cauchy model. Refractive index values vary over the spectral range from 1.53 (near-infrared) to 1.8 (ultraviolet).
authors.affiliation: Solid State Physics, MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, 7500AE Enschede, The Netherlands. e.s.kooij@tnw.utwente.nl
authors.forename: E Stefan
authors.initials: ES
authors.lastname: Kooij
authors.forename: Yujie
authors.initials: Y
authors.lastname: Ma
authors.forename: Mark A
authors.initials: MA
authors.lastname: Hempenius
authors.forename: G Julius
authors.initials: GJ
authors.lastname: Vancso
authors.forename: Bene
authors.initials: B
authors.lastname: Poelsema
mesh_terms: D005296:Ferrous Compounds / Q000737:chemistry*; D008567:Membranes, Artificial; D015394:Molecular Structure; D055095:Optics and Photonics; D012821:Silanes / Q000737:chemistry*
chemical_list: D005296:Ferrous Compounds; D008567:Membranes, Artificial; D012821:Silanes; C554070:poly(ferrocenylsilane)