title: Atomic layer deposited titanium dioxide and its application in resonant waveguide grating.
abstract: We demonstrate good optical quality TiO(2) thin films grown by atomic layer deposition at 120 degrees C. The optical properties were studied using spectroscopic ellipsometry and prism coupling methods. The refractive index was 2.27, and the slab waveguide propagation loss was less than 1dB/cm at 1.53microm. A high quality resonant waveguide grating was fabricated using a thin TiO(2) layer on top of a SiO(2) grating.
authors.affiliation: Department of Micro and Nanosciences, Aalto University School of Scienceand Technology, Micronova, PO Box 13500, FI-00076 Aalto, Finland. tapani.alasaarela@tkk.fi
authors.forename: T
authors.initials: T
authors.lastname: Alasaarela
authors.forename: T
authors.initials: T
authors.lastname: Saastamoinen
authors.forename: J
authors.initials: J
authors.lastname: Hiltunen
authors.forename: A
authors.initials: A
authors.lastname: Säynätjoki
authors.forename: A
authors.initials: A
authors.lastname: Tervonen
authors.forename: P
authors.initials: P
authors.lastname: Stenberg
authors.forename: M
authors.initials: M
authors.lastname: Kuittinen
authors.forename: S
authors.initials: S
authors.lastname: Honkanen