Nondestructive two-dimensional refractive-index profiling of integrated-optical waveguides by an interferometric method.
We describe an interferometric method that uses an interference microscope that permits the determination of the complete two-dimensional refractive-index profile of integrated optical waveguides, provided that the form of the one-dimensional depth profile is known. Results are reported for potassium-sodium ion-exchanged channel waveguides and are shown to be in good agreement with theory.
Betts
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Lui
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Whitbread
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