title: Subwavelength grating crossings for silicon wire waveguides.
abstract: We report on the design, simulation and experimental demonstration of a new type of waveguide crossing based on subwavelength gratings in silicon waveguides. We used 3D finite-difference time-domain simulations to minimize loss, crosstalk and polarization dependence. Measurement of fabricated devices show that our waveguide crossings have a loss as low as -0.023 dB/crossing, polarization dependent loss of < 0.02 dB and crosstalk <-40 dB.
authors: Institute for Microstructural Sciences, National Research Council Canada, Ottawa, Canada. przemek.bock@nrc.ca
authors: Przemek J
authors: PJ
authors: Bock
authors: Pavel
authors: P
authors: Cheben
authors: Jens H
authors: JH
authors: Schmid
authors: Jean
authors: J
authors: Lapointe
authors: André
authors: A
authors: Delâge
authors: Dan-Xia
authors: DX
authors: Xu
authors: Siegfried
authors: S
authors: Janz
authors: Adam
authors: A
authors: Densmore
authors: Trevor J
authors: TJ
authors: Hall