title: Detection of embedded ultra-subwavelength-thin dielectric features using elongated photonic nanojets.
abstract: Photonic nanojets have been previously shown (both theoretically and experimentally) to be highly sensitive to the presence of an ultra-subwavelength nanoscale particle within the nanojet. In the present work, photonic nanojets elongated by almost an order of magnitude (relative to the latest previously published work) are found to possess another key characteristic: they are sensitive to the presence of ultra-subwavelength nanoscale thin features embedded within a dielectric object. This additional characteristic of photonic nanojets is demonstrated through comparisons between fundamentally different 3-D and corresponding 1-D full Maxwell's equations finite-difference time-domain (FDTD) models.
authors: Department of Electrical and Computer Engineering, University of New Mexico, 1 University of New Mexico, Albuquerque, NM 87131, USA.
authors: César Méndez
authors: CM
authors: Ruiz
authors: Jamesina J
authors: JJ
authors: Simpson
mesh_terms: D004867:Equipment Design; D008962:Models, Theoretical; D053758:Nanoparticles; D036103:Nanotechnology / Q000295:instrumentation*; D043942:Nanotubes; D017785:Photons