High-resolution, parallel patterning of nanoparticles via an ion-induced focusing mask.
An ion-induced focusing mask under the simultaneous injection of ions and charged aerosols generates invisible electrostatic lenses around each opening, through which charged nanoparticles are convergently guided without depositing on the mask surface. The sizes of the created features become significantly smaller than those of the mask openings due to the focusing capability. It is not only demonstrated that material-independent nanoparticles including proteins can be patterned as an ordered array on any surface regardless of the conductive, nonconductive, or flexible nature of the substrate, but also that the array density can be increased. Highly sensitive gas sensors based on these focused nanoparticle patterns are fabricated via the concept.
You
Sukbeom
S
National CRI Center for Nano Particle Control, Institute of Advanced Machinery and Design, School of Mechanical and Aerospace Engineering, Seoul National University, Seoul 151-742, Korea.
Han
Kyuhee
K
Kim
Hyoungchul
H
Lee
Heechul
H
Woo
Chang Gyu
CG
Jeong
Changui
C
Nam
Woongsik
W
Choi
Mansoo
M
D007477:Ions; D053768:Metal Nanoparticles / Q000737:chemistry*; D046228:Microarray Analysis / Q000295:instrumentation / Q000379:methods*; D055672:Static Electricity; D013499:Surface Properties
D007477:Ions