title: X-ray phase contrast microscopy at 300 nm resolution with laboratory sources.
abstract: We report the performance of an X-ray phase contrast microscope for laboratory sources with 300 nm spatial resolution. The microscope is based on a commercial X-ray microfocus source equipped with a planar X-ray waveguide able to produce a sub-micrometer x-ray beam in one dimension. Phase contrast images of representative samples are reported. The achieved contrast and resolution is discussed for different configurations. The proposed approach could represent a simple, inexpensive, solution for sub-micrometer resolution imaging with small laboratory setups.
authors: School of Physics, Monash University, Clayton, Victoria 3800, Australia. daniele.pelliccia@sci.monash.edu.au
authors: Daniele
authors: D
authors: Pelliccia
authors: Andrea
authors: A
authors: Sorrentino
authors: Inna
authors: I
authors: Bukreeva
authors: Alessia
authors: A
authors: Cedola
authors: Fernando
authors: F
authors: Scarinci
authors: Mihaela
authors: M
authors: Ilie
authors: Anna Maria
authors: AM
authors: Gerardino
authors: Michela
authors: M
authors: Fratini
authors: Stefano
authors: S
authors: Lagomarsino