title: Phase-conjugate interferometric analysis of thin films.
abstract: We used phase-conjugate interferometry to determine the optical parameters of absorbing thin films: the refractive index, the extinction coefficient, and the thickness. The use of self-pumped phase-conjugate reflectors in place of mirrors causes optical distortions in the substrate to cancel and makes the interferometer self-aligning. The results of measurement of single-layer absorbing thin films are presented.
authors: E R
authors: ER
authors: Parshall
authors: M
authors: M
authors: Cronin-Golomb