title: Time-domain measurement of optical transport in silicon micro-ring resonators.
abstract: We perform time-domain measurements of optical transport dynamics in silicon nano-photonic devices. Using pulsed optical excitation the thermal and carrier induced optical nonlinearities of micro-ring resonators are investigated, allowing for identification of their individual contributions. Under pulsed excitation build-up of free carriers and heat in the waveguides leads to a beating oscillation of the cavity resonance frequency. When employing a burst of pulse trains shorter than the carrier life-time, the slower heating effect can be separated from the faster carrier effect. Our scheme provides a convenient way to thermally stabilize optical resonators for high-power time-domain applications and nonlinear optical conversion.
authors: Department of Electrical Engineering, Yale University, New Haven, CT 06511, USA.
authors: Wolfram H P
authors: WH
authors: Pernice
authors: Mo
authors: M
authors: Li
authors: Hong X
authors: HX
authors: Tang
mesh_terms: D003460:Crystallization / Q000295:instrumentation*; D004867:Equipment Design; D008962:Models, Theoretical; D036103:Nanotechnology / Q000295:instrumentation / Q000379:methods*; D017711:Nonlinear Dynamics; D055096:Optical Devices; D055095:Optics and Photonics / Q000295:instrumentation / Q000379:methods*; D012825:Silicon / Q000737:chemistry*; D013997:Time Factors
chemical_list: D012825:Silicon