title: Interferometric characterization of a sub-wavelength near-infrared negative index metamaterial.
abstract: Negative phase advance through a single layer of near-IR negative index metamaterial (NIM) is identified through interferometric measurements. The NIM unit cell, sub-wavelength in both the lateral and light propagation directions, is comprised of a pair of Au strips separated by two dielectric and one Au film. Numerical simulations show that the negative phase advance through the single-layer sample is consistent with the negative index exhibited by a bulk material comprised of multiple layers of the same structure. We also numerically demonstrate that the negative index band persists in the lossless limit.
authors: Department of Physics, University of Michigan, Ann Arbor, MI 48109-1040, USA.
authors: Xuhuai
authors: X
authors: Zhang
authors: Marcelo
authors: M
authors: Davanço
authors: Kara
authors: K
authors: Maller
authors: Thomas W
authors: TW
authors: Jarvis
authors: Chihhui
authors: C
authors: Wu
authors: Chris
authors: C
authors: Fietz
authors: Dmitriy
authors: D
authors: Korobkin
authors: Xiaoqin
authors: X
authors: Li
authors: Gennady
authors: G
authors: Shvets
authors: Stephen R
authors: SR
authors: Forrest
mesh_terms: D003198:Computer Simulation; D003460:Crystallization / Q000295:instrumentation / Q000379:methods*; D004867:Equipment Design; D005898:Glass; D007259:Infrared Rays; D007368:Interferometry / Q000295:instrumentation / Q000379:methods*; D008420:Manufactured Materials; D008872:Microwaves; D008962:Models, Theoretical; D055095:Optics and Photonics / Q000295:instrumentation / Q000379:methods*