title: Nondestructive two-dimensional refractive-index profiling of integrated-optical waveguides by an interferometric method.
abstract: We describe an interferometric method that uses an interference microscope that permits the determination of the complete two-dimensional refractive-index profile of integrated optical waveguides, provided that the form of the one-dimensional depth profile is known. Results are reported for potassium-sodium ion-exchanged channel waveguides and are shown to be in good agreement with theory.
authors: R A
authors: RA
authors: Betts
authors: F
authors: F
authors: Lui
authors: T W
authors: TW
authors: Whitbread