Two-wavelength electronic speckle-pattern interferometry for the analysis of discontinuous deformation fields.
Ambiguity in the conversion of phase measurements to deformation values restricts the applicability of electronic speckle-pattern interferometry. The use of two wavelengths greatly relaxes this restriction.
Gülker
G
G
Haack
O
O
Hinsch
K D
KD
Hölscher
C
C
Kuls
J
J
Platen
W
W