title: Electron micrography and x-ray study of dip-lacquered LiF (220).
abstract: It has been proposed to use the 220 reflection of LiF with a multilayer deposited upon the top for simultaneous spectroscopy near Fe-k and O-k and below the C-k absorption edge (284 eV) in x-ray astronomy. We demonstrate that a substantial reduction of surface roughness is obtained by dip lacquering state-of-the-art polished LiF(220) surfaces. Using a microdensitometer analysis of electron micrographs of surface replicas and x-ray reflection, we have measured approximately 10-A rms roughness of Au-coated dip-lacquered LiF(220) crystals, as opposed to approximately 60 A measured on the bare LiF(220) crystal surface.
authors: J
authors: J
authors: Palmari
authors: M
authors: M
authors: Rasigni
authors: G
authors: G
authors: Rasigni
authors: F E
authors: FE
authors: Christensen
authors: A
authors: A
authors: Hornstrup
authors: H W
authors: HW
authors: Schnopper