title: Crosstalk quantification, analysis, and trends in CMOS image sensors.
abstract: Pixel crosstalk (CTK) consists of three components, optical CTK (OCTK), electrical CTK (ECTK), and spectral CTK (SCTK). The CTK has been classified into two groups: pixel-architecture dependent and pixel-architecture independent. The pixel-architecture-dependent CTK (PADC) consists of the sum of two CTK components, i.e., the OCTK and the ECTK. This work presents a short summary of a large variety of methods for PADC reduction. Following that, this work suggests a clear quantifiable definition of PADC. Three complementary metal-oxide-semiconductor (CMOS) image sensors based on different technologies were empirically measured, using a unique scanning technology, the S-cube. The PADC is analyzed, and technology trends are shown.
authors: The VLSI Systems Center/Ben Gurion University, P.O. Box 653 Beer-Sheva, Israel. blockstein@gmail.com
authors: Lior
authors: L
authors: Blockstein
authors: Orly
authors: O
authors: Yadid-Pecht