X-ray phase contrast microscopy at 300 nm resolution with laboratory sources.
We report the performance of an X-ray phase contrast microscope for laboratory sources with 300 nm spatial resolution. The microscope is based on a commercial X-ray microfocus source equipped with a planar X-ray waveguide able to produce a sub-micrometer x-ray beam in one dimension. Phase contrast images of representative samples are reported. The achieved contrast and resolution is discussed for different configurations. The proposed approach could represent a simple, inexpensive, solution for sub-micrometer resolution imaging with small laboratory setups.
Pelliccia
Daniele
D
School of Physics, Monash University, Clayton, Victoria 3800, Australia. daniele.pelliccia@sci.monash.edu.au
Sorrentino
Andrea
A
Bukreeva
Inna
I
Cedola
Alessia
A
Scarinci
Fernando
F
Ilie
Mihaela
M
Gerardino
Anna Maria
AM
Fratini
Michela
M
Lagomarsino
Stefano
S