title: Two-wavelength electronic speckle-pattern interferometry for the analysis of discontinuous deformation fields.
abstract: Ambiguity in the conversion of phase measurements to deformation values restricts the applicability of electronic speckle-pattern interferometry. The use of two wavelengths greatly relaxes this restriction.
authors: G
authors: G
authors: Gülker
authors: O
authors: O
authors: Haack
authors: K D
authors: KD
authors: Hinsch
authors: C
authors: C
authors: Hölscher
authors: J
authors: J
authors: Kuls
authors: W
authors: W
authors: Platen