title: Dielectric tensor characterization for magneto-optical recording media.
abstract: A new and comprehensive dielectric-tensor characterization method was used for the characterization of magneto-optical recording media. The effect of film thickness and bilayer thickness on the magneto-optic Kerr effect was studied for a series of Co-Pd samples. The composition dependencies of the dielectric tensor for both Co-Pt and Co-Pd superlattice samples were measured, and the enhancement of the magneto-optical Kerr effect for these samples was studied.
authors: A F
authors: AF
authors: Zhou
authors: J K
authors: JK
authors: Erwin
authors: C F
authors: CF
authors: Brucker
authors: M
authors: M
authors: Mansuripur