High-speed cycloid-scan atomic force microscopy.
A key hurdle in achieving high scan speeds in atomic force microscopes is that the probe is required to be scanned over the sample in a zig-zag raster pattern. The fast axis of the AFM scanner must track a signal that contains frequencies beyond its mechanical bandwidth. Consequently, fast raster scans generate distortions in the resulting image. We propose a smooth cycloid-like scan pattern that allows us to achieve scan speeds much higher than a raster scan. We illustrate how the proposed method can be implemented on a commercial AFM with minimal modifications.
Yong
Y K
YK
School of Electrical Engineering and Computer Science, The University of Newcastle, Callaghan, NSW, Australia. yuenkuan.yong@newcastle.edu.au
Moheimani
S O R
SO
Petersen
I R
IR