Noise properties in a two-arm microscope imaging system with classical thermal light.
We present an analysis of the noise properties in a two-arm microscope imaging system. The aperture of the reference lens affects the imaging quality significantly. Using large apertures will enhance the resolution but also increase the noise. The effects from the distance the object is moved away from the original plane are also discussed, and we can obtain both good resolution and small noise by changing the distance.
Bai
Yanfeng
Y
Department of Physics, Southeast University, Nanjing 210096, China. yfbaier@gmail.com
Yang
Wenxing
W
Yu
Xiaoqiang
X