Probing strain-induced electronic structure change in graphene by Raman spectroscopy.
Two-phonon Raman scattering in graphitic materials provides a distinctive approach to probing the material's electronic structure through the spectroscopy of phonons. Here we report studies of Raman scattering of the two-dimensional mode of single-layer graphene under uniaxial stress and which implicates two types of modification of the low-energy electronic structure of graphene: a deformation of the Dirac cone and its displacement away from the K point.
Huang
Mingyuan
M
Department of Mechanical Engineering, Columbia University, New York, New York 10027, USA.
Yan
Hugen
H
Heinz
Tony F
TF
Hone
James
J