title: Probing strain-induced electronic structure change in graphene by Raman spectroscopy.
abstract: Two-phonon Raman scattering in graphitic materials provides a distinctive approach to probing the material's electronic structure through the spectroscopy of phonons. Here we report studies of Raman scattering of the two-dimensional mode of single-layer graphene under uniaxial stress and which implicates two types of modification of the low-energy electronic structure of graphene: a deformation of the Dirac cone and its displacement away from the K point.
authors.affiliation: Department of Mechanical Engineering, Columbia University, New York, New York 10027, USA.
authors.forename: Mingyuan
authors.initials: M
authors.lastname: Huang
authors.forename: Hugen
authors.initials: H
authors.lastname: Yan
authors.forename: Tony F
authors.initials: TF
authors.lastname: Heinz
authors.forename: James
authors.initials: J
authors.lastname: Hone