title: Core level photoionization on free sub-10-nm nanoparticles using synchrotron radiation.
abstract: A novel instrument is presented, which permits studies on singly charged free nanoparticles in the diameter range from 1 to 30 nm using synchrotron radiation in the soft x-ray regime. It consists of a high pressure nanoparticle source, a high efficiency nanoparticle beam inlet, and an electron time-of-flight spectrometer suitable for probing surface and bulk properties of free, levitated nanoparticles. We show results from x-ray photoelectron spectroscopy study near the Si L(3,2)-edge on 8.2 nm SiO(2) particles prepared in a nanoparticle beam. The possible use of this apparatus regarding chemical reactions on the surface of nanometer-sized particles is highlighted. This approach has the potential to be exploited for process studies on heterogeneous atmospheric chemistry.
authors.affiliation: Institute for Environmental Physics, University of Heidelberg, Im Neuenheimer Feld 229, 69120 Heidelberg, Germany. meinen@kit.edu
authors.forename: Jan
authors.initials: J
authors.lastname: Meinen
authors.forename: Svetlana
authors.initials: S
authors.lastname: Khasminskaya
authors.forename: Markus
authors.initials: M
authors.lastname: Eritt
authors.forename: Thomas
authors.initials: T
authors.lastname: Leisner
authors.forename: Egill
authors.initials: E
authors.lastname: Antonsson
authors.forename: Burkhard
authors.initials: B
authors.lastname: Langer
authors.forename: Eckart
authors.initials: E
authors.lastname: Rühl