New flexible toolbox for nanomechanical measurements with extreme precision and at very high frequencies.
We show that the principally two-dimensional (2D) scanning tunneling microscope (STM) can be used for imaging of 1D micrometer high free-standing nanowires. We can then determine nanowire megahertz resonance frequencies, image their top-view 2D resonance shapes, and investigate axial stress on the nanoscale. Importantly, we demonstrate the extreme sensitivity of electron tunneling even at very high frequencies by measuring resonances at hundreds of megahertz with a precision far below the angstrom scale.
Fian
Alexander
A
Department of Physics, Lund University, Box 118, 22100 Lund, Sweden.
Lexholm
Monica
M
Timm
Rainer
R
Mandl
Bernhard
B
Håkanson
Ulf
U
Hessman
Dan
D
Lundgren
Edvin
E
Samuelson
Lars
L
Mikkelsen
Anders
A