title: New flexible toolbox for nanomechanical measurements with extreme precision and at very high frequencies.
abstract: We show that the principally two-dimensional (2D) scanning tunneling microscope (STM) can be used for imaging of 1D micrometer high free-standing nanowires. We can then determine nanowire megahertz resonance frequencies, image their top-view 2D resonance shapes, and investigate axial stress on the nanoscale. Importantly, we demonstrate the extreme sensitivity of electron tunneling even at very high frequencies by measuring resonances at hundreds of megahertz with a precision far below the angstrom scale.
authors.affiliation: Department of Physics, Lund University, Box 118, 22100 Lund, Sweden.
authors.forename: Alexander
authors.initials: A
authors.lastname: Fian
authors.forename: Monica
authors.initials: M
authors.lastname: Lexholm
authors.forename: Rainer
authors.initials: R
authors.lastname: Timm
authors.forename: Bernhard
authors.initials: B
authors.lastname: Mandl
authors.forename: Ulf
authors.initials: U
authors.lastname: Håkanson
authors.forename: Dan
authors.initials: D
authors.lastname: Hessman
authors.forename: Edvin
authors.initials: E
authors.lastname: Lundgren
authors.forename: Lars
authors.initials: L
authors.lastname: Samuelson
authors.forename: Anders
authors.initials: A
authors.lastname: Mikkelsen