Core level photoionization on free sub-10-nm nanoparticles using synchrotron radiation.
A novel instrument is presented, which permits studies on singly charged free nanoparticles in the diameter range from 1 to 30 nm using synchrotron radiation in the soft x-ray regime. It consists of a high pressure nanoparticle source, a high efficiency nanoparticle beam inlet, and an electron time-of-flight spectrometer suitable for probing surface and bulk properties of free, levitated nanoparticles. We show results from x-ray photoelectron spectroscopy study near the Si L(3,2)-edge on 8.2 nm SiO(2) particles prepared in a nanoparticle beam. The possible use of this apparatus regarding chemical reactions on the surface of nanometer-sized particles is highlighted. This approach has the potential to be exploited for process studies on heterogeneous atmospheric chemistry.
Meinen
Jan
J
Institute for Environmental Physics, University of Heidelberg, Im Neuenheimer Feld 229, 69120 Heidelberg, Germany. meinen@kit.edu
Khasminskaya
Svetlana
S
Eritt
Markus
M
Leisner
Thomas
T
Antonsson
Egill
E
Langer
Burkhard
B
Rühl
Eckart
E