title: Index of refraction measurement on sapphire at low temperatures and visible wavelengths.
abstract: The ordinary and extraordinary refractive index of two samples of sapphire, which differed in the way each was grown, was measured. The measurements were made over a wavelength range of 477-701 nm and a temperature range of 20-295 K. A three-term Sellmeier dispersion equation was fit to the data to permit refractive-index interpolation within several parts in 10(4). The data of index versus temperature were fit to a model and the results of dn/dT versus temperature are given along with certain physical constants that were extracted from the model.
authors.forename: A C
authors.initials: AC
authors.lastname: Defranzo
authors.forename: B G
authors.initials: BG
authors.lastname: Pazol