title: Automatic interference method for measuring transparent film thickness.
abstract: A new method for analytically obtaining the form of an interferogram is proposed. The method permits simple implementation for a computerized treatment. We can use it to determine easily the thickness of a thin film.
authors.forename: A
authors.initials: A
authors.lastname: González-Cano
authors.forename: E
authors.initials: E
authors.lastname: Bernabáu