title: Determination of the refractive index of a-Si(1-x)C(x):H thin films from infrared absorption spectra.
abstract: The index of refraction of a-Si(1-x)C(x):H thin films obtained by dc magnetron sputtering was determined by means of IR absorption measurements. Structural and compositional changes that take place by increasing x make the film a mixture of different species, giving an effective value of the refractive index.
authors.forename: S
authors.initials: S
authors.lastname: Lugomer
authors.forename: A
authors.initials: A
authors.lastname: Maksimović
authors.forename: D
authors.initials: D
authors.lastname: Gracin