title: An x-ray photoelectron spectra and atomic force microscopy characterization of silica substrates engineered with a covalently assembled siloxane monolayer.
abstract: Silica substrates were functionalized with a covalent 4-ClCH(2)C(6)H(4)SiCl(3) monolayer. Additional covalent bonding of appropriate functional molecules to the silylated substrates was further achieved. The surface chemical characterization was carried out by angle resolved x-ray photoelectron measurements. Moreover, surface morphological characterizations were performed by atomic force microscopy measurements. Present results provide step by step information on the covalently linked monolayer during the synthetic procedure.
authors.affiliation: Dipartimento di Scienze Chimiche, Università di Catania and INSTM UdR of Catania, Viale Andrea Doria 6, 95125 Catania, Italy.
authors.forename: Antonino
authors.initials: A
authors.lastname: Gulino
authors.forename: Guglielmo G
authors.initials: GG
authors.lastname: Condorelli
authors.forename: Placido
authors.initials: P
authors.lastname: Mineo
authors.forename: Ignazio
authors.initials: I
authors.lastname: Fragalà