Probing exciton localization in single-walled carbon nanotubes using high-resolution near-field microscopy.
We observe localization of excitons in semiconducting single-walled carbon nanotubes at room temperature using high-resolution near-field photoluminescence (PL) microscopy. Localization is the result of spatially confined exciton energy minima with depths of more than 15 meV connected to lateral energy gradients exceeding 2 meV/nm as evidenced by energy-resolved PL imaging. Simulations of exciton diffusion in the presence of energy variations support this interpretation predicting strongly enhanced PL at local energy minima.
Georgi
Carsten
C
Department Chemie and CeNS, Ludwig-Maximilians-Universität München, 81377 München, Germany.
Green
Alexander A
AA
Hersam
Mark C
MC
Hartschuh
Achim
A
D003198:Computer Simulation; D004247:DNA / Q000737:chemistry; D004058:Diffusion; D008027:Light; D008853:Microscopy / Q000379:methods*; D018613:Microscopy, Confocal / Q000379:methods; D008962:Models, Theoretical; D036103:Nanotechnology / Q000379:methods*; D043942:Nanotubes / Q000737:chemistry; D037742:Nanotubes, Carbon / Q000737:chemistry*; D010777:Photochemistry / Q000379:methods; D012666:Semiconductors
D037742:Nanotubes, Carbon; D004247:DNA