title: Wavelength considerations in soft-x-ray projection lithography.
abstract: The choice of the operational wavelength for a soft-x-ray projection lithography system affects a wide variety of system parameters such as optical design, sources, resists, and multilayer mirrors. Several system constraints limit the choice for the operational wavelength. In particular, optical imaging requirements place an upper limit and throughput issues place a lower limit on the wavelength selection. We have determined that there are several discrete wavelength regions between 10 and 25 nm that satisfy the system-imposed constraints of high resolution, large depth of focus, and high throughput.
authors.forename: A M
authors.initials: AM
authors.lastname: Hawryluk
authors.forename: N M
authors.initials: NM
authors.lastname: Ceglio