title: Vector formulation for interferogram surface fitting.
abstract: Interferometry is an optical testing technique that quantifies the optical path difference (OPD) between a reference wave front and a test wave front based on the interference of light. Fringes are formed when the OPD is an integral multiple of the illuminating wavelength. The resultant two-dimensional pattern is called an interferogram. The function of any interferogram analysis program is to extract this OPD and to produce a representation of the test wave front (or surface). This is accomplished through a three-step process of sampling, ordering, and fitting. We develop a generalized linear-algebra vectornotation model of the interferogram sampling and fitting process.
authors.forename: D J
authors.initials: DJ
authors.lastname: Fischer
authors.forename: J T
authors.initials: JT
authors.lastname: O'Bryan
authors.forename: R
authors.initials: R
authors.lastname: Lopez
authors.forename: H P
authors.initials: HP
authors.lastname: Stahl