title: Revealing buried interfaces to understand the origins of threshold voltage shifts in organic field-effect transistors.
authors.affiliation: Philips Research Laboratories, AE Eindhoven, The Netherlands.
authors.forename: Simon G J
authors.initials: SG
authors.lastname: Mathijssen
authors.forename: Mark-Jan
authors.initials: MJ
authors.lastname: Spijkman
authors.forename: Anne-Marije
authors.initials: AM
authors.lastname: Andringa
authors.forename: Paul A
authors.initials: PA
authors.lastname: van Hal
authors.forename: Iain
authors.initials: I
authors.lastname: McCulloch
authors.forename: Martijn
authors.initials: M
authors.lastname: Kemerink
authors.forename: René A J
authors.initials: RA
authors.lastname: Janssen
authors.forename: Dago M
authors.initials: DM
authors.lastname: de Leeuw
mesh_terms: D020527:Microscopy, Scanning Probe; D056951:Photoelectron Spectroscopy; D014173:Transistors, Electronic