General method of sensitivity control for manufacturing errors.
In this paper, the sensitivity control for manufacturing errors is treated from three aspects. A wavefront-based sensitivity function is proposed, the effect of which is verified with the modulation transfer function (MTF)-based Monte Carlo simulation. Then, the direct optimization of the MTF-based Monte Carlo simulation result is proposed. Finally, the effect of the sensitivity control function to get better lens types is shown.
Yabe
Akira
A
akira.yabe@t-online.de