Surface-roughness measurement using Fourier transformation of doubly scattered speckle pattern.
The statistical properties of the doubly scattered speckle pattern generated from a rough surface, under a fully developed and static speckle pattern illumination, have been investigated by numerical analysis. The real-time Fourier transformation of the doubly scattered speckle pattern by an optical process enables us to measure the surface roughness in quasi real time.
Nakagawa
K
K
Yoshimura
T
T
Minemoto
T
T