The influence of the heel effect in cone-beam computed tomography: artifacts in standard and novel geometries and their correction.
For decades, the heel effect has been known to cause an angular dependence of the emitted spectrum of an x-ray tube. In radiography, artifacts were observed and attributed to the heel effect. However, no problems due to the heel effect were discerned in multi-slice computed tomography (MSCT) so far. With flat-detector CT (FDCT), involving larger cone angles and different system geometries, the heel effect might cause new artifacts. These artifacts were analyzed in this paper for system geometries different from the ones widely used nowadays. Simulations and measurements were performed. Simulations included symmetric as well as asymmetric detector layouts and different x-ray tube orientations with respect to the detector plane. The measurements were performed on a micro-CT system in an asymmetric detector layout. Furthermore, an analytical correction scheme is proposed to overcome heel effect artifacts. It was shown that the type of artifact greatly depends on the orientation of the x-ray tube and also on the type of detector alignment (i.e. symmetric or different types of asymmetric alignment). Certain combinations exhibited almost no significant artifact while others greatly influenced the quality of the reconstructed images. The proposed correction scheme showed good results that were further improved when also applying a scatter correction. When designing CT systems, care should be taken when placing the tube and the detector. Orientation of the x-ray tube like in most MSCT systems seems advisable in asymmetric detector layouts. However, a different type of tube orientation can be overcome with suitable correction schemes.
Braun
H
H
Institute of Medical Physics, University of Erlangen-Nürnberg, Henkestr. 91, 91052 Erlangen, Germany. harald.braun@imp.uni-erlangen.de
Kyriakou
Y
Y
Kachelriess
M
M
Kalender
W A
WA
D000818:Animals; D016477:Artifacts; D054893:Cone-Beam Computed Tomography / Q000295:instrumentation / Q000379:methods* / Q000592:standards; D004560:Electricity; D007091:Image Processing, Computer-Assisted; D051379:Mice; D019047:Phantoms, Imaging; D014867:Water
D014867:Water