title: Study of organically-modified montmorillonite clay for the removal of copper(II).
abstract: 2-Oxyhydrazino-N-(2-methylen-yl-hydroxyphenyl)pyridinium (OMHP) ion was immobilized onto Na-montmorillonite clay (MMT). The modified clay (OMHP-MMT) was used for the removal of Cu(II). Experiments were carried out as a function of solution pH, stirring time, effect of some common ions and eluent type, concentration and volume. MMT, OMHP-MMT, and OMHP-MMT-loaded Cu(II) were characterized by X-ray diffractometry, electronic and infrared spectra, and elemental and thermogravimetric analyses. OMHP is suggested to be intercalated into MMT parallel to the aluminosilicate layers, with a capacity of 56.4 mEq/100g. OMHP-MMT shows good stability in 0.1-1 mol L(-1) hydrochloric or nitric acids, ammonia hydroxide, concentrated Na(+), K(+), NH(4)(+), Cl(-) or SO(4)(2-). It shows good removal efficiency and selectivity towards Cu(II) at pH 3.0-8.0 and stirring time 10 min with an removal capacity of 119 mEq/100g. Most common ions do not interfere with the removal process except Fe(3+). Extracted Cu(II) could be quantitatively recovered by 10 mL 1% thiourea in 0.1 mol L(-1) HCl with 100-fold preconcentration factor. OMHP-MMT was successfully applied to recover Cu(II) from different samples.
authors.affiliation: Department of Inorganic Chemistry, National Research Centre, Dokki, Giza, Egypt. Electronic address: kh_sherbini@yahoo.com.
authors.forename: Khaled S
authors.initials: KS
authors.lastname: Abou-El-Sherbini
authors.affiliation: Department of Chemistry, Industrial Education College, University of Beni-Suif, Beni-Suif, Egypt. Electronic address: mmhassanien2002@yahoo.com.
authors.forename: Mohamed M
authors.initials: MM
authors.lastname: Hassanien
mesh_terms: D000538:Aluminum Silicates; D001546:Bentonite / Q000737:chemistry*; D000077215:Clay; D003300:Copper / Q000302:isolation & purification*; D006863:Hydrogen-Ion Concentration; D013054:Spectrophotometry, Atomic; D017550:Spectroscopy, Fourier Transform Infrared; D013818:Thermogravimetry; D014961:X-Ray Diffraction
chemical_list: D000538:Aluminum Silicates; D001546:Bentonite; D003300:Copper; D000077215:Clay