title: Combination of scene-based and stochastic measurement for wide-field aberration correction in microscopic imaging.
abstract: We report on a novel aberration correction technique that uses the sequential combination of two different aberration measurement methods to correct for setup-induced and specimen-induced aberrations. The advantages of both methods are combined and, thus, the measurement time is strongly reduced without loss of accuracy. The technique is implemented using a spatial-light-modulator-based wide-field microscope without the need for additional components (e.g., a Shack-Hartmann sensor). The aberrations are measured without a reference object by directly using the specimen to be imaged. We demonstrate experimental results for technical as well as biological specimens.
authors.affiliation: Institut für Technische Optik, University of Stuttgart, Pfaffenwaldring 9, 70569 Stuttgart, Germany. warber@ito.uni-stuttgart.de
authors.forename: Michael
authors.initials: M
authors.lastname: Warber
authors.forename: Selim
authors.initials: S
authors.lastname: Maier
authors.forename: Tobias
authors.initials: T
authors.lastname: Haist
authors.forename: Wolfgang
authors.initials: W
authors.lastname: Osten