title: Semiconductor laser confocal microscopy.
abstract: A compact scanning microscope that uses a semiconductor laser both to illuminate a specimen and to detect the signal reflected from it is described. It is demonstrated that the spatial filtering performed by the laser detector ensures confocal operation. Two detection regimes, one employing a laser power monitor and the other using the diode junction voltage as a signal, are compared.
authors.forename: R
authors.initials: R
authors.lastname: Juskaitis
authors.forename: N P
authors.initials: NP
authors.lastname: Rea
authors.forename: T
authors.initials: T
authors.lastname: Wilson