Refractive-index profiling of planar gradient-index waveguides by phase-measuring microinterferometry.
A novel measurement technique based on phase-stepping microinterferometry is proposed for the refractive-index profiling of planar waveguides fabricated by ion exchange in glass. The sample preparation simplicity and easy instrumental implementation, together with high accuracy and improved resolution, are argued.
Sochacka
M
M
Lago
E L
EL
Jaroszewicz
Z
Z