title: Refractive-index profiling of planar gradient-index waveguides by phase-measuring microinterferometry.
abstract: A novel measurement technique based on phase-stepping microinterferometry is proposed for the refractive-index profiling of planar waveguides fabricated by ion exchange in glass. The sample preparation simplicity and easy instrumental implementation, together with high accuracy and improved resolution, are argued.
authors.forename: M
authors.initials: M
authors.lastname: Sochacka
authors.forename: E L
authors.initials: EL
authors.lastname: Lago
authors.forename: Z
authors.initials: Z
authors.lastname: Jaroszewicz