title: Emergent chemical mapping at atomic-column resolution by energy-dispersive x-ray spectroscopy in an aberration-corrected electron microscope.
abstract: Chemical mapping at atomic-column resolution by energy-dispersive x-ray spectroscopy in a spherical aberration-corrected scanning transmission electron microscope (STEM) has been demonstrated for the 1.47-A dumbbell structure in InGaAs. The structural imaging and the chemical information in the two-dimensional map are directly correlated. Comparisons with the other existing mapping techniques of STEM in conjunction with electron energy-loss spectroscopy were discussed from aspects of ionization interactions.
authors.affiliation: Center for Condensed Matter Sciences, National Taiwan University, Taipei 106, Taiwan.
authors.forename: M-W
authors.initials: MW
authors.lastname: Chu
authors.forename: S C
authors.initials: SC
authors.lastname: Liou
authors.forename: C-P
authors.initials: CP
authors.lastname: Chang
authors.forename: F-S
authors.initials: FS
authors.lastname: Choa
authors.forename: C H
authors.initials: CH
authors.lastname: Chen