title: Coherent terahertz emission of intrinsic Josephson junction stacks in the hot spot regime [corrected].
abstract: We report on THz emission measurements and low temperature scanning laser imaging of Bi2Sr2CaCu2O8 intrinsic Josephson junction stacks. Coherent emission is observed at large dc input power, where a hot spot and a standing wave, formed in the "cold" part of the stack, coexist. By changing bias current and bath temperature, the emission frequency can be varied by more than 40%; the variation matches the Josephson-frequency variation with voltage. The linewidth of radiation is much smaller than expected from a purely cavity-induced synchronization. Thus, an additional mechanism seems to play a role. Some scenarios, related to the presence of the hot spot, are discussed.
authors.affiliation: National Institute for Materials Science, Tsukuba 3050047, Japan.
authors.forename: H B
authors.initials: HB
authors.lastname: Wang
authors.forename: S
authors.initials: S
authors.lastname: Guénon
authors.forename: B
authors.initials: B
authors.lastname: Gross
authors.forename: J
authors.initials: J
authors.lastname: Yuan
authors.forename: Z G
authors.initials: ZG
authors.lastname: Jiang
authors.forename: Y Y
authors.initials: YY
authors.lastname: Zhong
authors.forename: M
authors.initials: M
authors.lastname: Grünzweig
authors.forename: A
authors.initials: A
authors.lastname: Iishi
authors.forename: P H
authors.initials: PH
authors.lastname: Wu
authors.forename: T
authors.initials: T
authors.lastname: Hatano
authors.forename: D
authors.initials: D
authors.lastname: Koelle
authors.forename: R
authors.initials: R
authors.lastname: Kleiner