title: Landau quantization of topological surface states in Bi2Se3.
abstract: We report the direct observation of Landau quantization in Bi2Se3 thin films by using a low-temperature scanning tunneling microscope. In particular, we discovered the zeroth Landau level, which is predicted to give rise to the half-quantized Hall effect for the topological surface states. The existence of the discrete Landau levels (LLs) and the suppression of LLs by surface impurities strongly support the 2D nature of the topological states. These observations may eventually lead to the realization of quantum Hall effect in topological insulators.
authors.affiliation: Department of Physics, Tsinghua University, Beijing 100084, China.
authors.forename: Peng
authors.initials: P
authors.lastname: Cheng
authors.forename: Canli
authors.initials: C
authors.lastname: Song
authors.forename: Tong
authors.initials: T
authors.lastname: Zhang
authors.forename: Yanyi
authors.initials: Y
authors.lastname: Zhang
authors.forename: Yilin
authors.initials: Y
authors.lastname: Wang
authors.forename: Jin-Feng
authors.initials: JF
authors.lastname: Jia
authors.forename: Jing
authors.initials: J
authors.lastname: Wang
authors.forename: Yayu
authors.initials: Y
authors.lastname: Wang
authors.forename: Bang-Fen
authors.initials: BF
authors.lastname: Zhu
authors.forename: Xi
authors.initials: X
authors.lastname: Chen
authors.forename: Xucun
authors.initials: X
authors.lastname: Ma
authors.forename: Ke
authors.initials: K
authors.lastname: He
authors.forename: Lili
authors.initials: L
authors.lastname: Wang
authors.forename: Xi
authors.initials: X
authors.lastname: Dai
authors.forename: Zhong
authors.initials: Z
authors.lastname: Fang
authors.forename: Xincheng
authors.initials: X
authors.lastname: Xie
authors.forename: Xiao-Liang
authors.initials: XL
authors.lastname: Qi
authors.forename: Chao-Xing
authors.initials: CX
authors.lastname: Liu
authors.forename: Shou-Cheng
authors.initials: SC
authors.lastname: Zhang
authors.forename: Qi-Kun
authors.initials: QK
authors.lastname: Xue