title: ToF-SIMS imaging of the nanoscale phase separation in polymeric light emitting diodes: effect of nanostructure on device efficiency.
authors.affiliation: Research Center for Applied Sciences, Academia Sinica, Taipei, Taiwan.
authors.forename: Bang-Ying
authors.initials: BY
authors.lastname: Yu
authors.forename: Che-Hung
authors.initials: CH
authors.lastname: Kuo
authors.forename: Wei-Ben
authors.initials: WB
authors.lastname: Wang
authors.forename: Guo-Ji
authors.initials: GJ
authors.lastname: Yen
authors.forename: Shin-ichi
authors.initials: S
authors.lastname: Iida
authors.forename: Sun-Zen
authors.initials: SZ
authors.lastname: Chen
authors.forename: Wei-Chun
authors.initials: WC
authors.lastname: Lin
authors.forename: Szu-Hsian
authors.initials: SH
authors.lastname: Lee
authors.forename: Wei-Lun
authors.initials: WL
authors.lastname: Kao
authors.forename: Chia-Yi
authors.initials: CY
authors.lastname: Liu
authors.forename: Hsun-Yun
authors.initials: HY
authors.lastname: Chang
authors.forename: Yun-Wen
authors.initials: YW
authors.lastname: You
authors.forename: Chi-Jen
authors.initials: CJ
authors.lastname: Chang
authors.forename: Chi-Ping
authors.initials: CP
authors.lastname: Liu
authors.forename: Jwo-Huei
authors.initials: JH
authors.lastname: Jou
authors.forename: Jing-Jong
authors.initials: JJ
authors.lastname: Shyue