title: Quantitative evaluation of boron-induced disorder in multilayers containing silicon nanocrystals in an oxide matrix designed for photovoltaic applications.
authors.affiliation: Institute of Physics, Wroclaw University of Technology, Wybrzeze Wyspianskiego 27, 50-370 Wroclaw, Poland.
authors.forename: G
authors.initials: G
authors.lastname: Zatryb
authors.forename: A
authors.initials: A
authors.lastname: Podhorodecki
authors.forename: X J
authors.initials: XJ
authors.lastname: Hao
authors.forename: J
authors.initials: J
authors.lastname: Misiewicz
authors.forename: Y S
authors.initials: YS
authors.lastname: Shen
authors.forename: M A
authors.initials: MA
authors.lastname: Green