title: [Measurement technology for multi-parameter spectral responsivity of X-ray scintillation crystals].
authors.affiliation: National Key Laboratory for Electronic Measurement Technology, North University of China, Taiyuan 030051, China. li1sir@126.com
authors.forename: Rui-hong
authors.initials: RH
authors.lastname: Li
authors.forename: Yue-ping
authors.initials: YP
authors.lastname: Han
authors.forename: Han-chang
authors.initials: HC
authors.lastname: Zhou
authors.forename: Yan
authors.initials: Y
authors.lastname: Han