title: Artifact removal by intrinsic harmonics of tuning fork probe for scanning near-field optical microscopy.
authors.affiliation: Singapore Institute of Manufacturing Technology, 71 Nanyang Drive, Singapore 638075.
authors.forename: Zhaogang
authors.initials: Z
authors.lastname: Dong
authors.forename: Ying
authors.initials: Y
authors.lastname: Zhang
authors.forename: Shaw Wei
authors.initials: SW
authors.lastname: Kok
authors.forename: Boon Ping
authors.initials: BP
authors.lastname: Ng
authors.forename: Yeng Chai
authors.initials: YC
authors.lastname: Soh