An ultraclean tip-wear reduction scheme for ultrahigh density scanning probe-based data storage.
Tayebi
Noureddine
N
Intel Corporation, 2200 Mission College Boulevard, Santa Clara, California 95054, United States.
Zhang
Yuegang
Y
Chen
Robert J
RJ
Tran
Quan
Q
Chen
Rong
R
Nishi
Yoshio
Y
Ma
Qing
Q
Rao
Valluri
V