title: Analytical electron tomography mapping of the SiC pore oxidation at the nanoscale.
authors.affiliation: Institut de Physique et Chimie des Matériaux de Strasbourg, CNRS-Université de Strasbourg (UDS) UMR 7504, 23, rue du Loess, BP 43, 67037, Strasbourg cedex 02, France.
authors.forename: Ileana
authors.initials: I
authors.lastname: Florea
authors.forename: Ovidiu
authors.initials: O
authors.lastname: Ersen
authors.forename: Charles
authors.initials: C
authors.lastname: Hirlimann
authors.forename: Lucian
authors.initials: L
authors.lastname: Roiban
authors.forename: Adrien
authors.initials: A
authors.lastname: Deneuve
authors.forename: Matthieu
authors.initials: M
authors.lastname: Houllé
authors.forename: Izabela
authors.initials: I
authors.lastname: Janowska
authors.forename: Patrick
authors.initials: P
authors.lastname: Nguyen
authors.forename: Charlotte
authors.initials: C
authors.lastname: Pham
authors.forename: Cuong
authors.initials: C
authors.lastname: Pham-Huu