Dosimetric evaluation of the OneDoseTM MOSFET for measuring kilovoltage imaging dose from image-guided radiotherapy procedures.
OBJECTIVE
The purpose of this study is to investigate the feasibility of using a single-use dosimeter, OneDose MOSFET designed for in vivo patient dosimetry, for measuring the radiation dose from kilovoltage (kV) x rays resulting from image-guided procedures.


METHODS
The OneDose MOSFET dosimeters were precalibrated by the manufacturer using Co-60 beams. Their energy response and characteristics for kV x rays were investigated by using an ionization chamber, in which the air-kerma calibration factors were obtained from an Accredited Dosimetry Calibration Laboratory (ADCL). The dosimetric properties have been tested for typical kV beams used in image-guided radiation therapy (IGRT).


RESULTS
The direct dose reading from the OneDose system needs to be multiplied by a correction factor ranging from 0.30 to 0.35 for kilovoltage x rays ranging from 50 to 125 kVp, respectively. In addition to energy response, the OneDose dosimeter has up to a 20% reduced sensitivity for beams (70-125 kVp) incident from the back of the OneDose detector.


CONCLUSIONS
The uncertainty in measuring dose resulting from a kilovoltage beam used in IGRT is approximately 20%; this uncertainty is mainly due to the sensitivity dependence of the incident beam direction relative to the OneDose detector. The ease of use may allow the dosimeter to be suitable for estimating the dose resulting from image-guided procedures.
Department of Radiation Oncology, Vanderbilt-Ingram Cancer Center, Vanderbilt University School of Medicine, B-902, TVC 1301 Medical Center Drive, Nashville, Tennessee 37232-5671, USA. george.ding@vanderbilt.edu
George X
GX
Ding
Charles W
CW
Coffey
D054893:Cone-Beam Computed Tomography; D006801:Humans; D008670:Metals / Q000737:chemistry*; D010087:Oxides / Q000737:chemistry*; D019047:Phantoms, Imaging; D011874:Radiometry / Q000295:instrumentation / Q000379:methods*; D011878:Radiotherapy / Q000379:methods*; D015203:Reproducibility of Results; D012825:Silicon / Q000737:chemistry*; D014173:Transistors, Electronic
D008670:Metals; D010087:Oxides; D012825:Silicon