A novel method for measuring the vertical birefringence of optical disk substrates.
We describe a simple method of measuring vertical birefringence over the entire surface of an optical disk substrate.Our design consists of a linearly polarized He-Ne laser (1-2 mW) and a CCD camera interfaced to a computer. The measurement is non-intrusive, easy to set up, and needs only a few seconds to collect the data and plot a map of vertical birefringence over the surface area of the disk. The system described here is potentially useful as a qualitycontrol tool in substrate manufacturing environments.
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Mansuripur
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YC
Hsieh