Blind image deconvolution using machine learning for three-dimensional microscopy.
In this work, we propose a novel method for the regularization of blind deconvolution algorithms. The proposed method employs example-based machine learning techniques for modeling the space of point spread functions. During an iterative blind deconvolution process, a prior term attracts the point spread function estimates to the learned point spread function space. We demonstrate the usage of this regularizer within a Bayesian blind deconvolution framework and also integrate into the latter a method for noise reduction, thus creating a complete blind deconvolution method. The application of the proposed algorithm is demonstrated on synthetic and real-world three-dimensional images acquired by a wide-field fluorescence microscope, where the need for blind deconvolution algorithms is indispensable, yielding excellent results.
Electrical Engineering Faculty, Technion - Insitute of Technology, Haifa, Israel. talkenig@tx.technion.ac.il
Tal
T
Kenig
Zvi
Z
Kam
Arie
A
Feuer
D000465:Algorithms; D001185:Artificial Intelligence; D001499:Bayes Theorem; D003198:Computer Simulation; D016208:Databases, Factual; D005583:Fourier Analysis; D007091:Image Processing, Computer-Assisted / Q000379:methods*; D008856:Microscopy, Fluorescence / Q000379:methods*; D025341:Principal Component Analysis