Multi-pinhole SPECT Imaging with Silicon Strip Detectors.
Silicon double-sided strip detectors offer outstanding instrinsic spatial resolution with reasonable detection efficiency for iodine-125 emissions. This spatial resolution allows for multiple-pinhole imaging at low magnification, minimizing the problem of multiplexing. We have conducted imaging studies using a prototype system that utilizes a detector of 300-micrometer thickness and 50-micrometer strip pitch together with a 23-pinhole collimator. These studies include an investigation of the synthetic-collimator imaging approach, which combines multiple-pinhole projections acquired at multiple magnifications to obtain tomographic reconstructions from limited-angle data using the ML-EM algorithm. Sub-millimeter spatial resolution was obtained, demonstrating the basic validity of this approach.
Peterson
Todd E
TE
Institute of Imaging Science and the Department of Radiology and Radiological Sciences, Vanderbilt University, Nashville, TN 37232 USA (telephone: 615-322-2648,  todd.e.peterson@vanderbilt.edu ).
Shokouhi
Sepideh
S
Furenlid
Lars R
LR
Wilson
Donald W
DW