Assessing the purity of metal-organic frameworks using photoluminescence: MOF-5, ZnO quantum dots, and framework decomposition.
Photoluminescence (PL) spectroscopy was used to characterize nanoscale ZnO impurities, amine-donor charge-transfer exciplexes, and framework decomposition in samples of MOF-5 prepared by various methods. The combined results cast doubt on previous reports describing MOF-5 as a semiconductor and demonstrate that PL as a tool for characterizing MOF purity possesses advantages such as simplicity, speed, and sensitivity over currently employed powder XRD MOF characterization methods.
Sandia National Laboratories, Livermore, California 94551-0969, USA.
Patrick L
PL
Feng
John J
JJ
Perry
Stefan
S
Nikodemski
Benjamin W
BW
Jacobs
Scott T
ST
Meek
Mark D
MD
Allendorf