Note: Electrical resolution during conductive atomic force microscopy measurements under different environmental conditions and contact forces.
Lanza
M
M
Dept. Enginyeria Electrònica, Universitat Autònoma de Barcelona, Edifici Q, 08193 Bellaterra, Spain. mario.lanza@uab.cat
Porti
M
M
Nafría
M
M
Aymerich
X
X
Whittaker
E
E
Hamilton
B
B