title: Charge exchange recombination detection of low-Z and medium-Z impurities in the extreme UV using a digital lock-in technique.
authors.affiliation: General Atomics, P.O. Box 85608, San Diego, California 92186-5608, USA. brooks@fusion.gat.com
authors.forename: N H
authors.initials: NH
authors.lastname: Brooks
authors.forename: K H
authors.initials: KH
authors.lastname: Burrell
authors.forename: R C
authors.initials: RC
authors.lastname: Isler
authors.forename: O
authors.initials: O
authors.lastname: Meyer
authors.forename: N A
authors.initials: NA
authors.lastname: Pablant