title: Proton-based total-dose irradiation effects on Cu/HfO2:Cu/Pt ReRAM devices.
authors.affiliation: College of Nanoscale Science and Engineering (CNSE), State University at Albany, Albany, NY 12203, USA.
authors.forename: Brian
authors.initials: B
authors.lastname: Butcher
authors.forename: Xiaoli
authors.initials: X
authors.lastname: He
authors.forename: Mengbing
authors.initials: M
authors.lastname: Huang
authors.forename: Yan
authors.initials: Y
authors.lastname: Wang
authors.forename: Qi
authors.initials: Q
authors.lastname: Liu
authors.forename: Hangbing
authors.initials: H
authors.lastname: Lv
authors.forename: Ming
authors.initials: M
authors.lastname: Liu
authors.forename: Wei
authors.initials: W
authors.lastname: Wang