title: Note: Electrical resolution during conductive atomic force microscopy measurements under different environmental conditions and contact forces.
authors.affiliation: Dept. Enginyeria Electrònica, Universitat Autònoma de Barcelona, Edifici Q, 08193 Bellaterra, Spain. mario.lanza@uab.cat
authors.forename: M
authors.initials: M
authors.lastname: Lanza
authors.forename: M
authors.initials: M
authors.lastname: Porti
authors.forename: M
authors.initials: M
authors.lastname: Nafría
authors.forename: X
authors.initials: X
authors.lastname: Aymerich
authors.forename: E
authors.initials: E
authors.lastname: Whittaker
authors.forename: B
authors.initials: B
authors.lastname: Hamilton