Proton-based total-dose irradiation effects on Cu/HfO2:Cu/Pt ReRAM devices.
Butcher
Brian
B
College of Nanoscale Science and Engineering (CNSE), State University at Albany, Albany, NY 12203, USA.
He
Xiaoli
X
Huang
Mengbing
M
Wang
Yan
Y
Liu
Qi
Q
Lv
Hangbing
H
Liu
Ming
M
Wang
Wei
W