Decoupling electrochemical reaction and diffusion processes in ionically-conductive solids on the nanometer scale.
We have developed a scanning probe microscopy approach to explore voltage-controlled ion dynamics in ionically conductive solids and decouple transport and local electrochemical reactivity on the nanometer scale. Electrochemical strain microscopy allows detection of bias-induced ionic motion through the dynamic (0.1-1 MHz) local strain. Spectroscopic modes based on low-frequency (∼1 Hz) voltage sweeps allow local ion dynamics to be probed locally. The bias dependence of the hysteretic strain response accessed through first-order reversal curve (FORC) measurements demonstrates that the process is activated at a certain critical voltage and is linear above this voltage everywhere on the surface. This suggests that FORC spectroscopic ESM data separates local electrochemical reaction and transport processes. The relevant parameters such as critical voltage and effective mobility can be extracted for each location and correlated with the microstructure. The evolution of these behaviors with the charging of the amorphous Si anode in a thin-film Li-ion battery is explored. A broad applicability of this method to other ionically conductive systems is predicted.
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
Nina
N
Balke
Stephen
S
Jesse
Yoongu
Y
Kim
Leslie
L
Adamczyk
Ilia N
IN
Ivanov
Nancy J
NJ
Dudney
Sergei V
SV
Kalinin