title: Refractive-index measurement of gradient-index microlenses by diffraction tomography.
abstract: Diffraction tomography is applied to reconstruction of the gradient-index distribution of planar gradient-index microlenses, fabricated by thermal ion exchange. Measurements of the single-phase projections are performed by phase-shifting interferometry For reconstruction, the Rytov approximation for smooth inhomogeneities is applied. Results are compared with measurement results from other methods and simulation results.
authors.forename: W
authors.initials: W
authors.lastname: Singer
authors.forename: B
authors.initials: B
authors.lastname: Dobler
authors.forename: H
authors.initials: H
authors.lastname: Schreiber
authors.forename: K H
authors.initials: KH
authors.lastname: Brenner
authors.forename: B
authors.initials: B
authors.lastname: Messerschmidt