title: Thin film structure of triisopropylsilylethynyl-functionalized pentacene and tetraceno[2,3-b]thiophene from grazing incidence X-ray diffraction.
authors.affiliation: Stanford Synchrotron Radiation Lightsource, Menlo Park, CA, USA. mannsfel@slac.stanford.edu
authors.forename: Stefan C B
authors.initials: SC
authors.lastname: Mannsfeld
authors.forename: Ming Lee
authors.initials: ML
authors.lastname: Tang
authors.forename: Zhenan
authors.initials: Z
authors.lastname: Bao
mesh_terms: D015394:Molecular Structure; D009279:Naphthacenes / Q000737:chemistry*; D017646:Organosilicon Compounds / Q000737:chemistry*; D013876:Thiophenes / Q000737:chemistry*; D014961:X-Ray Diffraction
chemical_list: D009279:Naphthacenes; D017646:Organosilicon Compounds; D013876:Thiophenes; C522282:bis(triisopropylsilylethynyl)pentacene; C528332:tetraceno(2,3-b)thiophene