title: Low-power resonant laser ablation of copper.
abstract: We emphasize two points: (l) the properties and mechanisms of very low-fluence ablation of copper surfaces and (2) the sensitivity and selectivity of resonant laser ablation (RLA). We present results for ablation of bulk copper and copper thin films; spot-size effects; the effects of surface-sample preparation and beam polarization; and an accurate measurement of material removal rates, typically ≤ 10(-3) Å at 35 mJ/cm(2). Velocity distributions were Maxwellian, with peak velocities ≈ 1-2 × 10(5) cm/s. In addition, we discuss the production of diffractionlike surface features, and the probable participation of nonthermal desorption mechanisms. RLA is shown to be a sensitive and useful diagnostic for studies of low-fluence laser-material interactions.
authors.forename: C G
authors.initials: CG
authors.lastname: Gill
authors.forename: T M
authors.initials: TM
authors.lastname: Allen
authors.forename: J E
authors.initials: JE
authors.lastname: Anderson
authors.forename: T N
authors.initials: TN
authors.lastname: Taylor
authors.forename: P B
authors.initials: PB
authors.lastname: Kelly
authors.forename: N S
authors.initials: NS
authors.lastname: Nogar