title: Transcranial magnetic stimulation in the presence of deep brain stimulation implants: Induced electrode currents.
abstract: The safety of transcranial magnetic stimulation (TMS) in patients with an implanted deep brain stimulation (DBS) systems has not been thoroughly investigated. One potential safety hazard is the induction of significant voltages in the subcutaneous leads in the scalp that could result in unintended electrical currents in the DBS electrode contacts. We measured ex-vivo the TMS-induced voltages and currents in DBS electrodes with the implantable pulse generator (IPG) set in various modes of operation. We show that voltages as high as 100 V resulting in currents as high as 83 mA can be induced in the DBS leads by a TMS pulse in all IPG modes. These currents are an order of magnitude higher than the normal DBS pulses, and could result in tissue damage. When the IPG is turned off, electrode currents flow only if the TMS-induced voltage exceeds 5 V.
authors.affiliation: Department of Electrical Engineering, Columbia University / New York State Psychiatric Institute, New York, NY 10032, USA. zd2119@columbia.edu
authors.forename: Zhi-De
authors.initials: ZD
authors.lastname: Deng
authors.forename: Sarah H
authors.initials: SH
authors.lastname: Lisanby
authors.forename: Angel V
authors.initials: AV
authors.lastname: Peterchev
mesh_terms: D001921:Brain / Q000502:physiology; D046690:Deep Brain Stimulation / Q000379:methods*; D004558:Electric Stimulation / Q000379:methods*; D004567:Electrodes, Implanted; D006801:Humans; D050781:Transcranial Magnetic Stimulation / Q000379:methods*