Simultaneous measurement of emittance, transmittance, and reflectance of semitransparent materials at elevated temperature.
A two-substrate method is developed to simultaneously determine emissivity, transmittance, and reflectance of semitransparent materials with a single measurement under the same environment at elevated temperature. The three quantities can be obtained through the emissivities of substrates and the apparent emissivities resulting from the radiance of the sample heated by substrates. The two-substrate method is compared with the conventional method by measuring sapphire samples with various thicknesses, resulting in good agreements for all the samples. The present method will be useful to measure the temperature dependence of optical properties of porous ceramic materials.
Division of Physical Metrology, Korea Research Institute of Standards and Science, 209 Gajeong-ro, Yuseong-gu, Daejeon 305-340, South Korea.
Sangho
S
Jeon
Seung-Nam
SN
Park
Yong Shim
YS
Yoo
Jisoo
J
Hwang
Chul-Woung
CW
Park
Geun Woo
GW
Lee