Structural and magnetic properties of TiZrNi thin films prepared by magnetron sputtering and thermal annealing.
Distinctive thin layers of TiZr and Ni were deposited by using a magnetron sputtering method and a thermal annealing was applied to discover metallic films of quasicrystals. After a heat treatment in vacuum, 70 nm thick deposited layers were well mixed with nominal compositions of 49.7, 29.3 and 21.0 for Ti, Zr and Ni, respectively, which is very close with the one forming a quasicrystalline phase. The magnetization values were significantly decreased from 0.286 to 0.142 emu/mm3 at 2000 Oe, after annealing, while a shape of magnetic hysteresis was maintained. It is believed that a different magnetic behavior after thermal annealing is due to the homogeneous mixing of atomic elements and possible existence of a metastable phase.
Department of Physics, Hanyang University, Seoul 133-791, Korea.
Hyemin
H
Shin
Soo-bin
SB
Choi
Ik-jae
IJ
Lee
Chung-jong
CJ
Yu
Jae-yong
JY
Kim