title: A simple optical spectral calibration technique for pulsed THz sources.
abstract: We have quantified the sensitivity of a simple method to measure the frequency spectrum of pulsed terahertz (THz) radiation. The THz pulses are upconverted to the optical regime by sideband generation in a zinc telluride (ZnTe) crystal using a continuous wave (cw) narrow-bandwidth near-infrared laser. A single-shot spectral measurement of sideband pulses with a high resolution spectrometer directly provides the spectral information of the THz pulses without the need of adjustable elements in the detection setup. This method has been applied at the free electron laser FELIX, where, for a wavelength of 150 μm (2 THz), pulse trains of 5 μs duration with an integrated energy of 800 nJ, as well as single pulses with an energy as low as 13 nJ could be characterized on a single-shot basis.
authors.affiliation: Radboud University Nijmegen, Institute for Molecules and Materials, Heyendaalseweg 135, 6525 AJ, Nijmegen, The Netherlands.
authors.forename: Frans J P
authors.initials: FJ
authors.lastname: Wijnen
authors.forename: Giel
authors.initials: G
authors.lastname: Berden
authors.forename: Rienk T
authors.initials: RT
authors.lastname: Jongma
mesh_terms: D002138:Calibration; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008029:Lighting / Q000295:instrumentation*; D013057:Spectrum Analysis / Q000295:instrumentation*; D013691:Tellurium / Q000528:radiation effects*; D055053:Terahertz Radiation; D015032:Zinc / Q000528:radiation effects*
chemical_list: D015032:Zinc; D013691:Tellurium