title: The Rh oxide ultrathin film on Rh(100): an x-ray photoelectron diffraction study.
abstract: The surface and interface structure of the RhO(2) ultrathin film grown on Rh(100) is investigated by means of x-ray photoelectron diffraction. Experimental and simulated one- and two-dimensional angular distribution intensities of the O1s and Rh3d(5/2) chemically shifted core levels are quantitatively analyzed. The previously proposed O-Rh-O trilayer model is independently confirmed. A rippled buckling of the metal surface is observed at the oxide-metal interface, with a mean interfacial Rh-O distance which is 0.2 Å larger with respect to previous findings. The link between the local atomic rearrangement and the overall geometric and electronic properties of the oxide is discussed on the basis of a thorough comparison with the corresponding RhO(2) rutile structure.
authors.affiliation: Physics Department and Center of Excellence for Nanostructured Materials, University of Trieste, via A. Valerio 2, 34127-Trieste, Italy.
authors.forename: Rong Rong
authors.initials: RR
authors.lastname: Zhan
authors.forename: Erik
authors.initials: E
authors.lastname: Vesselli
authors.forename: Alessandro
authors.initials: A
authors.lastname: Baraldi
authors.forename: Silvano
authors.initials: S
authors.lastname: Lizzit
authors.forename: Giovanni
authors.initials: G
authors.lastname: Comelli
mesh_terms: D008567:Membranes, Artificial; D008958:Models, Molecular; D010087:Oxides / Q000737:chemistry*; D012238:Rhodium / Q000737:chemistry*; D013053:Spectrophotometry; D014961:X-Ray Diffraction; D014965:X-Rays
chemical_list: D008567:Membranes, Artificial; D010087:Oxides; D012238:Rhodium