title: Observation of the Talbot effect using broadband hard x-ray beam.
abstract: We demonstrated the Talbot effect using a broadband hard x-ray beam (Δλ/λ ~1). The exit wave-field of the x-ray beam passing through a grating with a sub micro-meter scale period was successfully replicated and recorded at effective Talbot distance, Z(T). The period was reduced to half at Z(T)/4 and 3/4Z(T), and the phase reversal was observed at Z(T)/2. The propagating wave-field recorded on photoresists was consistent with a simulated result.
authors.affiliation: School of Materials Science and Engineering, Gwangju Institute of Science and Technology, Gwangju, 500-712, Korea.
authors.forename: Jae Myung
authors.initials: JM
authors.lastname: Kim
authors.forename: In Hwa
authors.initials: IH
authors.lastname: Cho
authors.forename: Su Yong
authors.initials: SY
authors.lastname: Lee
authors.forename: Hyon Chol
authors.initials: HC
authors.lastname: Kang
authors.forename: Ray
authors.initials: R
authors.lastname: Conley
authors.forename: Chian
authors.initials: C
authors.lastname: Liu
authors.forename: Albert T
authors.initials: AT
authors.lastname: Macrander
authors.forename: Do Young
authors.initials: do Y
authors.lastname: Noh