title: Results of immediate loading for implant restoration in partially edentulous patients: a 6-month preliminary prospective study using SinusQuick™ EB implant system.
abstract: BACKGROUND
  Many dental clinicians are concerned about immediate loading of inserted implants. However, there have been few clinical studies surveying the success rates of immediate loading, based on Korean implant systems.
  
  
  OBJECTIVE
  The aim of this study was to evaluate the outcome of immediate functional loading of the implant (SinusQuick™ EB, Neobiotech Co., Seoul, Korea) in partially edentulous maxilla or mandible.
  
  
  METHODS
  Total 15 implants were placed. Within 2 weeks after implant insertion, provisional implant-supported fixed partial dentures were delivered to the patients. Quantitatively, marginal bone loss was measured at the time of immediate loading, after 3-months of continued loading and at the last follow-up. The mean follow-up period was 4.8 months.
  
  
  RESULTS
  Mean marginal bone loss from implant surgery to early loading, 3-months follow-up and last follow-up was 0.03 ± 0.07 mm, 0.16 ± 0.17 mm and 0.29 ± 0.19 mm. No implant failed up to 6 months after insertion, resulting in a 100% survival rate.
  
  
  CONCLUSIONS
  Immediate loading exhibited high success rate in partial edentulism for up to 6 months. Well-controlled long term clinical studies with large sample size are necessary to confirm this finding.
authors.affiliation: Resident, Department of Oral and Maxillofacial Surgery, Seoul National University Bundang Hospital, Seongnam, Korea.
authors.forename: Jong-Hwa
authors.initials: JH
authors.lastname: Kim
authors.forename: Young-Kyun
authors.initials: YK
authors.lastname: Kim
authors.forename: Yang-Jin
authors.initials: YJ
authors.lastname: Yi
authors.forename: Pil-Young
authors.initials: PY
authors.lastname: Yun
authors.forename: Hyo-Jung
authors.initials: HJ
authors.lastname: Lee
authors.forename: Myung-Jin
authors.initials: MJ
authors.lastname: Kim
authors.forename: In-Sung
authors.initials: IS
authors.lastname: Yeo