title: A multi-layer electro-optic field probe.
abstract: We present a novel design method and sensing scheme for an electro-optic field probe using multi-stratified layers of electro-optic wafers. A serial stack of cascaded layers is found to be capable of enhancing the performance of interferometric electro-optic light modulation that utilizes the slopes of interference fringe patterns and field-induced electro-optic phase retardations within wafers. The absolute sensitivity of the probe is also characterized with a micro-TEM cell that generates electric fields distributions with accurate, calculable strength for use in probe calibration. The sensitivity of a multi-layered probe-per unit electro-optic wafer volume--was enhanced by 6 dB compared to that of a single-layer one.
authors.affiliation: Division of Physical Metrology, Korea Research Institute of Standards and Science, 1 Doryong-dong, Yuseong-gu, Daejeon 305-340, Korea. dongjoonlee@kriss.re.kr
authors.forename: Dong-Joon
authors.initials: DJ
authors.lastname: Lee
authors.forename: Jae-Yong
authors.initials: JY
authors.lastname: Kwon
authors.forename: Han-Young
authors.initials: HY
authors.lastname: Ryu
authors.forename: John F
authors.initials: JF
authors.lastname: Whitaker