title: Quantitative analysis of parallel nanowire array assembly by dielectrophoresis.
abstract: We describe an assembly technique useful for generating ordered arrays of nanowires (NWs) between electrodes via dielectrophoresis (DEP) and an analysis technique useful for extracting quantitative information about the local electric fields and dielectrophoretic forces from video microscopy data. By tuning the magnitude of the applied electric fields such that the attractive forces on the NWs are of the same order of magnitude as the Brownian forces, and by taking advantage of the inter-NW repulsive forces during DEP, NWs can be assembled into parallel arrays with high reproducibility. By employing a particle-tracking code and analysis of NW motion, we demonstrate a method for quantitative mapping of the dielectrophoretic torques and NW-surface interactions as a function of position on the substrate, which allows a more complete understanding of the dynamics of the assembly and the ability to control these parameters for precise assembly.
authors.affiliation: Johns Hopkins University Applied Physics Laboratory, Milton Eisenhower Research Center, Laurel, MD 20723, USA. Stergios.papadakis@jhuapl.edu
authors.forename: Stergios J
authors.initials: SJ
authors.lastname: Papadakis
authors.forename: Joan A
authors.initials: JA
authors.lastname: Hoffmann
authors.forename: David
authors.initials: D
authors.lastname: Deglau
authors.forename: Andrew
authors.initials: A
authors.lastname: Chen
authors.forename: Pawan
authors.initials: P
authors.lastname: Tyagi
authors.forename: David H
authors.initials: DH
authors.lastname: Gracias
mesh_terms: D003460:Crystallization / Q000379:methods*; D004586:Electrophoresis / Q000379:methods*; D008422:Materials Testing; D049329:Nanostructures / Q000737:chemistry* / Q000528:radiation effects*; D010316:Particle Size