title: Internal reflection ellipsometry in air and water ambient.
abstract: We measured a multilayer sample in air and water ambient below the critical angle of incidence based on internal reflection ellipsometry (IRE). Measurements with varying incident angle and varying wavelength both provided values by the fitting for refractive indices and thicknesses of layers consistent with design or theoretical ones. This verified that IRE is useful in measurement and analysis of thin films on transparent substrates and especially effective to study thin films at transparent substrate-liquid interfaces.
authors.affiliation: Health Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Hayashi-cho, Takamatsu, Kagawa 761-0395, Japan. otsuki-so@aist.go.jp
authors.forename: Soichi
authors.initials: S
authors.lastname: Otsuki
authors.forename: Mitsuru
authors.initials: M
authors.lastname: Ishikawa
mesh_terms: D000388:Air; D055096:Optical Devices; D013499:Surface Properties; D014867:Water
chemical_list: D014867:Water