title: Chromatic second harmonic imaging.
abstract: We report a non-axial-scanning second harmonic imaging technique, in which the chromatic aberration of a Fresnel lens is exploited to focus different wavelengths of a fundamental beam into different axial positions to effectively realize axial scanning. Since the second harmonic signals at different axial positions are generated by different fundamental wavelengths and hence accordingly have different center wavelengths, they can be resolved and detected in parallel by using a spectrometer without axial mechanical scanning. We have demonstrated a system capable of achieving about 8 μm effective axial scanning range. Proof-of-concept imaging results are also presented.
authors.affiliation: Department of Electrical Engineering, Pennsylvania State University, University Park, Pennsylvania 16802, USA.
authors.forename: Chuan
authors.initials: C
authors.lastname: Yang
authors.forename: Kebin
authors.initials: K
authors.lastname: Shi
authors.forename: Haifeng
authors.initials: H
authors.lastname: Li
authors.forename: Qian
authors.initials: Q
authors.lastname: Xu
authors.forename: Venkatraman
authors.initials: V
authors.lastname: Gopalan
authors.forename: Zhiwen
authors.initials: Z
authors.lastname: Liu