title: Combining real and reciprocal space information for aberration free coherent electron diffractive imaging.
abstract: Information from imaging and diffraction planes, or real and reciprocal spaces, of transmission electron microscopes (TEM) can be combined using iterative transformation algorithms to reconstruct the complex wave function, to improve image resolution and to remove residual aberrations in the case of aberration corrected TEM. Here, we describe the experimental and computation techniques needed for combining real and reciprocal space information. We demonstrate these techniques by reconstructing the complex wave function of quantum dots and carbon nanotubes beyond the microscope's resolution limit.
authors.affiliation: Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA. jianzuo@illinois.edu
authors.forename: Jian-Min
authors.initials: JM
authors.lastname: Zuo
authors.forename: Jiong
authors.initials: J
authors.lastname: Zhang
authors.forename: Weijie
authors.initials: W
authors.lastname: Huang
authors.forename: Ke
authors.initials: K
authors.lastname: Ran
authors.forename: Bin
authors.initials: B
authors.lastname: Jiang
mesh_terms: D000465:Algorithms; D004583:Electrons; D007091:Image Processing, Computer-Assisted / Q000379:methods; D046529:Microscopy, Electron, Transmission / Q000379:methods; D008958:Models, Molecular; D037742:Nanotubes, Carbon / Q000737:chemistry; D045663:Quantum Dots; D014961:X-Ray Diffraction / Q000379:methods*
chemical_list: D037742:Nanotubes, Carbon