title: Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique.
abstract: We report time domain measurements of the group-velocity-dispersion-induced and nonlinearity-induced chirping of femtosecond pulses in subwavelength silicon-on-insulator waveguides. We observe that at a critical input power level, these two effects compensate each other leading to soliton formation. Formation of the fundamental optical soliton is observed at a peak power of a few Watts inside the waveguide. Interferometric cross-correlation traces reveal compression of the soliton pulses, while spectral measurements show pronounced dispersive waves emitted by solitons into the wavelength range of normal group velocity dispersion.
authors.affiliation: Centre for Photonics and Photonic Materials, Department of Physics, University of Bath, Bath BA2 7AY, United Kingdom. w.ding@bath.ac.uk
authors.forename: W
authors.initials: W
authors.lastname: Ding
authors.forename: A V
authors.initials: AV
authors.lastname: Gorbach
authors.forename: W J
authors.initials: WJ
authors.lastname: Wadswarth
authors.forename: J C
authors.initials: JC
authors.lastname: Knight
authors.forename: D V
authors.initials: DV
authors.lastname: Skryabin
authors.forename: M J
authors.initials: MJ
authors.lastname: Strain
authors.forename: M
authors.initials: M
authors.lastname: Sorel
authors.forename: R M
authors.initials: RM
authors.lastname: De La Rue
mesh_terms: D003198:Computer Simulation; D017076:Computer-Aided Design; D003627:Data Interpretation, Statistical; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008027:Light; D015233:Models, Statistical; D012031:Refractometry / Q000295:instrumentation*; D012542:Scattering, Radiation; D012825:Silicon / Q000737:chemistry*; D013223:Statistics as Topic
chemical_list: D012825:Silicon