title: Deep-level Transient Spectroscopy of GaAs/AlGaAs Multi-Quantum Wells Grown on (100) and (311)B GaAs Substrates.
abstract: Si-doped GaAs/AlGaAs multi-quantum wells structures grown by molecular beam epitaxy on (100) and (311)B GaAs substrates have been studied by using conventional deep-level transient spectroscopy (DLTS) and high-resolution Laplace DLTS techniques. One dominant electron-emitting level is observed in the quantum wells structure grown on (100) plane whose activation energy varies from 0.47 to 1.3 eV as junction electric field varies from zero field (edge of the depletion region) to 4.7 × 10(6) V/m. Two defect states with activation energies of 0.24 and 0.80 eV are detected in the structures grown on (311)B plane. The E(c)-0.24 eV trap shows that its capture cross-section is strongly temperature dependent, whilst the other two traps show no such dependence. The value of the capture barrier energy of the trap at E(c)-0.24 eV is 0.39 eV.
authors.affiliation: School of Physics and Astronomy, Nottingham Nanotechnology & Nanoscience Centre, University of Nottingham, Nottingham, NG7 2RD UK.
authors.forename: M
authors.initials: M
authors.lastname: Shafi
authors.forename: R H
authors.initials: RH
authors.lastname: Mari
authors.forename: A
authors.initials: A
authors.lastname: Khatab
authors.forename: D
authors.initials: D
authors.lastname: Taylor
authors.forename: M
authors.initials: M
authors.lastname: Henini