title: Object-wave reconstruction by carbon film-based Zernike- and Hilbert-phase plate microscopy: a theoretical study not restricted to weak-phase objects.
abstract: Transmission electron microscopy phase-contrast images taken by amorphous carbon film-based phase plates are affected by the scattering of electrons within the carbon film causing a modification of the image-wave function. Moreover, image artefacts are produced by non-centrosymmetric phase plate designs such as the Hilbert-phase plate. Various methods are presented to correct phase-contrast images with respect to the scattering of electrons and image artefacts induced by phase plates. The proposed techniques are not restricted to weak-phase objects and linear image formation. Phase-contrast images corrected by the presented methods correspond to those taken by an ideal centrosymmetric, matter-free phase plate and are suitable for object-wave reconstruction.
authors.affiliation: Laboratorium für Elektronenmikroskopie, Karlsruher Institut für Technologie (KIT), D-76128 Karlsruhe, Germany. manuel.dries@kit.edu
authors.forename: M
authors.initials: M
authors.lastname: Dries
authors.forename: K
authors.initials: K
authors.lastname: Schultheiss
authors.forename: B
authors.initials: B
authors.lastname: Gamm
authors.forename: A
authors.initials: A
authors.lastname: Rosenauer
authors.forename: R R
authors.initials: RR
authors.lastname: Schröder
authors.forename: D
authors.initials: D
authors.lastname: Gerthsen
mesh_terms: D002244:Carbon; D004583:Electrons; D007091:Image Processing, Computer-Assisted / Q000379:methods*; D046529:Microscopy, Electron, Transmission / Q000379:methods*; D008858:Microscopy, Phase-Contrast / Q000379:methods; D008962:Models, Theoretical
chemical_list: D002244:Carbon