title: Hole injection/transport materials derived from Heck and sol-gel chemistry for application in solution-processed organic electronic devices.
abstract: An organosilicate polymer, based on N,N'-diphenyl-N,N'-bis(4-((E)-2-(triethoxysilyl)vinyl)phenyl)biphenyl-4,4'-diamine (TEVS-TPD) with extended conjugation between the Si atom and the aromatic amine, was prepared under mild conditions via sequential Heck and sol-gel chemistry and used as an alternative to poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PSS), the most widely used planarizing hole injection/transport layer in solution-processed organic electronic devices. Spin-coating TEVS-TPD polymer solutions yield defect-free, uniform, thin films with excellent adhesion to the ITO electrode. Upon thermal cross-linking at 180 °C, the cross-linked polymer exhibits excellent solvent resistance and electrochemical stability. Solution-processed organic light emitting diode (OLED) devices using iridium-based triplet emitting layers and cross-linked TEVS-TPD films as a hole injection/transport layer show significantly improved performance including lower leakage current, lower turn-on voltage, higher luminance, and stability at high current density, as compared to the control device prepared with PEDOT:PSS.
authors.affiliation: Department of Chemistry, Seoul National University, Seoul 151-747, Korea.
authors.forename: Younhee
authors.initials: Y
authors.lastname: Lim
authors.forename: Young-Seo
authors.initials: YS
authors.lastname: Park
authors.forename: Yerang
authors.initials: Y
authors.lastname: Kang
authors.forename: Do Young
authors.initials: DY
authors.lastname: Jang
authors.forename: Joo Hyun
authors.initials: JH
authors.lastname: Kim
authors.forename: Jang-Joo
authors.initials: JJ
authors.lastname: Kim
authors.forename: Alan
authors.initials: A
authors.lastname: Sellinger
authors.forename: Do Y
authors.initials: DY
authors.lastname: Yoon