title: Experimental evidence of cut-wire-induced enhanced transmission of transverse-electric fields through sub-wavelength slits in a thin metallic screen.
abstract: Recent numerical studies have demonstrated the possibility of achieving substantial enhancements in the transmission of transverse-electric-polarized electromagnetic fields through subwavelength slits in a thin metallic screen by placing single or paired metallic cut-wire arrays at a close distance from the screen. In this paper, we report on the first experimental evidence of such extraordinary transmission phenomena, via microwave (X/Ku-band) measurements on printed-circuit-board prototypes. Experimental results agree very well with full-wave numerical predictions, and indicate an intrinsic robustness of the enhanced transmission phenomena with respect to fabrication tolerances and experimental imperfections.
authors.affiliation: CNR-SPIN and Department of Physics, University of Naples Federico II, Naples, Italy. emiliano@na.infn.it
authors.forename: Emiliano
authors.initials: E
authors.lastname: Di Gennaro
authors.forename: Ilaria
authors.initials: I
authors.lastname: Gallina
authors.forename: Antonello
authors.initials: A
authors.lastname: Andreone
authors.forename: Giuseppe
authors.initials: G
authors.lastname: Castaldi
authors.forename: Vincenzo
authors.initials: V
authors.lastname: Galdi
mesh_terms: D003198:Computer Simulation; D017076:Computer-Aided Design; D004574:Electromagnetic Fields; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008670:Metals; D008962:Models, Theoretical; D012031:Refractometry / Q000295:instrumentation*; D012542:Scattering, Radiation
chemical_list: D008670:Metals