title: Elemental imaging via laser ionization orthogonal time-of-flight mass spectrometry.
abstract: An elemental imaging method using a laser ionization orthogonal time-of-flight mass spectrometer system was developed for the simultaneous detection of all metal and nonmetal elements. The instrument control and data processing were realized by self-developed programs. This system is capable of simultaneous detection of metal and nonmetal elements, with a spatial resolution of 50 μm, the lowest detection limits of 3 × 10(-7) g/g (Li), and a dynamic range of 7 orders of magnitude. Moreover, this technique does not require standards for quantitative analysis and can be a powerful and versatile tool for elemental imaging.
authors.affiliation: Key Laboratory of Analytical Sciences, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen, China.
authors.forename: Rongfu
authors.initials: R
authors.lastname: Huang
authors.forename: Bochao
authors.initials: B
authors.lastname: Zhang
authors.forename: Dongxuan
authors.initials: D
authors.lastname: Zou
authors.forename: Wei
authors.initials: W
authors.lastname: Hang
authors.forename: Jian
authors.initials: J
authors.lastname: He
authors.forename: Benli
authors.initials: B
authors.lastname: Huang
mesh_terms: D004602:Elements; D007477:Ions / Q000737:chemistry; D007834:Lasers; D013058:Mass Spectrometry / Q000295:instrumentation / Q000379:methods*; D013997:Time Factors
chemical_list: D004602:Elements; D007477:Ions