title: In situ observation of dislocation behavior in nanometer grains.
abstract: Using a newly developed nanoscale deformation device, atomic scale and time-resolved dislocation dynamics have been captured in situ under a transmission electron microscope during the deformation of a Pt ultrathin film with truly nanometer grains (diameter d< ~ 10 nm). We demonstrate that dislocations are highly active even in such tiny grains. For the larger grains (d ~ 10 nm), full dislocations dominate and their evolution sometimes leads to the formation, destruction, and reformation of Lomer locks. In smaller grains, partial dislocations generating stacking faults are prevalent.
authors.affiliation: Institute of Microstructure and Properties of Advanced Materials, Beijing University of Technology, Beijing, 100124, China.
authors.forename: Lihua
authors.initials: L
authors.lastname: Wang
authors.forename: Xiaodong
authors.initials: X
authors.lastname: Han
authors.forename: Pan
authors.initials: P
authors.lastname: Liu
authors.forename: Yonghai
authors.initials: Y
authors.lastname: Yue
authors.forename: Ze
authors.initials: Z
authors.lastname: Zhang
authors.forename: En
authors.initials: E
authors.lastname: Ma