Calibrated NEXAFS spectra of common conjugated polymers.
Near edge x-ray absorption fine structure (NEXAFS) spectroscopy has evolved into a powerful characterization tool for polymeric materials and is increasingly being used to elucidate composition and orientation in thin films of relevance to organic electronic devices. For accurate quantitative compositional analysis, insight into the electronic structure and the ability to assess molecular orientation, reliable reference spectra with known energy resolution and calibrated energy scale are required. We report a set of such NEXAFS spectra from 23 semiconducting polymers and some related materials that are frequently used in organic device research.
North Carolina State University, Raleigh, North Carolina 27695, USA. benjamin.watts@psi.ch
B
B
Watts
S
S
Swaraj
D
D
Nordlund
J
J
Lüning
H
H
Ade
D015394:Molecular Structure; D011108:Polymers / Q000737:chemistry*; D013237:Stereoisomerism; D056928:X-Ray Absorption Spectroscopy
D011108:Polymers