Non-lambertian reflectance modeling and shape recovery of faces using tensor splines.
Modeling illumination effects and pose variations of a face is of fundamental importance in the field of facial image analysis. Most of the conventional techniques that simultaneously address both of these problems work with the Lambertian assumption and thus fall short of accurately capturing the complex intensity variation that the facial images exhibit or recovering their 3D shape in the presence of specularities and cast shadows. In this paper, we present a novel Tensor-Spline-based framework for facial image analysis. We show that, using this framework, the facial apparent BRDF field can be accurately estimated while seamlessly accounting for cast shadows and specularities. Further, using local neighborhood information, the same framework can be exploited to recover the 3D shape of the face (to handle pose variation). We quantitatively validate the accuracy of the Tensor Spline model using a more general model based on the mixture of single-lobed spherical functions. We demonstrate the effectiveness of our technique by presenting extensive experimental results for face relighting, 3D shape recovery, and face recognition using the Extended Yale B and CMU PIE benchmark data sets.
Department of Computer and Information Science and Engineering, University of Florida, Gainesville, 32611, USA. rkkumar@cise.ufl.edu
Ritwik
R
Kumar
Angelos
A
Barmpoutis
Arunava
A
Banerjee
Baba C
BC
Vemuri
D000465:Algorithms; D001185:Artificial Intelligence; D003198:Computer Simulation; D005145:Face / Q000033:anatomy & histology*; D005149:Facial Expression; D006801:Humans; D007089:Image Enhancement / Q000379:methods; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D021621:Imaging, Three-Dimensional / Q000379:methods; D016247:Information Storage and Retrieval / Q000379:methods*; D008029:Lighting / Q000295:instrumentation / Q000379:methods; D010363:Pattern Recognition, Automated / Q000379:methods*; D010781:Photography / Q000379:methods; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D013382:Subtraction Technique / Q000295:instrumentation