title: Spectroscopic characterization of charged defects in polycrystalline pentacene by time- and wavelength-resolved electric force microscopy.
abstract: Spatial maps of topography and trapped charge are acquired for polycrystalline pentacene thin-film transistors using electric and atomic force microscopy. In regions of trapped charge, the rate of trap clearing is studied as a function of the wavelength of incident radiation.
authors.affiliation: Department of Chemistry and Chemical Biology, Cornell University, Ithaca, NY 14853-1301, USA.
authors.forename: Justin L
authors.initials: JL
authors.lastname: Luria
authors.forename: Kathleen A
authors.initials: KA
authors.lastname: Schwarz
authors.forename: Michael J
authors.initials: MJ
authors.lastname: Jaquith
authors.forename: Richard G
authors.initials: RG
authors.lastname: Hennig
authors.forename: John A
authors.initials: JA
authors.lastname: Marohn
mesh_terms: D000042:Absorption; D004583:Electrons; D008853:Microscopy; D009279:Naphthacenes / Q000737:chemistry*; D011789:Quantum Theory; D013057:Spectrum Analysis; D013997:Time Factors; D014173:Transistors, Electronic
chemical_list: D009279:Naphthacenes; C523499:pentacene