title: High-resolution transmission electron microscopy study of electrically-driven reversible phase change in ge2sb2te5 nanowires.
abstract: By combining high-resolution transmission electron microscopy (HRTEM) characterization and electrical measurements on a unique device platform, we study the reversible electrically-driven phase-change characteristics of self-assembled Ge(2)Sb(2)Te(5) nanowires. Detailed HRTEM analyses are used to correlate and understand the effect of full and intermediate structural transformations on the measured electrical properties of the nanowire devices. The study demonstrates that our unique approach has the potential to provide new information regarding the dynamic structural and electrical states of phase-change materials at the nanoscale, which will aid the design of future phase-change memory devices.
authors.affiliation: Department of Materials Science and Engineering, University of Pennsylvania, 3231 Walnut Street, Philadelphia, Pennsylvania 19104, United States.
authors.forename: Yeonwoong
authors.initials: Y
authors.lastname: Jung
authors.forename: Sung-Wook
authors.initials: SW
authors.lastname: Nam
authors.forename: Ritesh
authors.initials: R
authors.lastname: Agarwal