title: Studies of multilayers and thin-foil x-ray mirrors using a soft x-ray diffractometer.
abstract: A versatile x-ray diffractometer is described in detail. Two applications to the study of x-ray optical elements are presented. The first is a Bragg reflection study of state-of-the-art multilayers deposited both on conventional Si-wafer substrates and on superpolished substrates such as fused quartz and electroless nickel. These data are compared to data previously obtained at FeKα. The second study is a reflectivity and scattering study of various thin-foil x-ray reflectors proposed for up-coming x-ray satellite missions. All the data have been obtained at MgKα = 1.2536 keV.
authors.affiliation: Danish Space Research Institute, Gl. Lundtoftevej 7, DK-2800 Lyngby, Denmark.
authors.forename: F E
authors.initials: FE
authors.lastname: Christensen
authors.forename: A
authors.initials: A
authors.lastname: Hornstrup
authors.forename: P
authors.initials: P
authors.lastname: Frederiksen
authors.forename: P
authors.initials: P
authors.lastname: Grundsøe
authors.forename: S
authors.initials: S
authors.lastname: Henrichsen
authors.forename: E
authors.initials: E
authors.lastname: Jacobsen
authors.forename: P
authors.initials: P
authors.lastname: Jonasson
authors.forename: M M
authors.initials: MM
authors.lastname: Madsen
authors.forename: C
authors.initials: C
authors.lastname: Nilsson
authors.forename: H W
authors.initials: HW
authors.lastname: Schnopper
authors.forename: N J
authors.initials: NJ
authors.lastname: Westergaard
authors.forename: P
authors.initials: P
authors.lastname: Orup