title: Multiple reflections in single crystals as a tool for x-ray spectroscopy.
abstract: The process of multiple x-ray reflections in single crystals is presented as a tool for x-ray spectroscopy. Among the possible applications it is shown that monochromatic spatial resolution of the x-ray source may be obtained through this process. With this method the distribution of variously ionized ions in laser-produced plasmas may be determined. Absolute wavelength values of x-ray transitions can be obtained. The x-ray emission qualities of x-ray tubes can be determined.
authors.affiliation: The Laboratory of X-Ray and VUV Spectroscopy, Racah Institute of Physics, The Hebrew University, Jerusalem, Israel.
authors.forename: B S
authors.initials: BS
authors.lastname: Fraenkel