title: Measurement of x-ray spectral line wavelengths by using two bragg reflections.
abstract: A novel method of measuring absolute x-ray wavelengths using simultaneous Bragg reflections at two parallel crystal plates of equal atomic spacing is presented. The accuracy of wavelength determination Δλ/λ for this method is discussed and a value of 5 × 10-5is achieved. Absolute wavelengths of L-shell laser-produced spectra of Cu, Ge, As, and Se and M-shell spectra of Gd and Tb have been measured in the wavelength region 7.5-8.5 Å using a quartz (10T0) quasimonolithic crystal blank.
authors.affiliation: PN Lebedev Physical Institute, USSR.
authors.forename: A V
authors.initials: AV
authors.lastname: Rodé
authors.forename: A M
authors.initials: AM
authors.lastname: Maksimchuk
authors.forename: G V
authors.initials: GV
authors.lastname: Sklizkov
authors.forename: A
authors.initials: A
authors.lastname: Ridgeley
authors.forename: C
authors.initials: C
authors.lastname: Danson
authors.forename: N
authors.initials: N
authors.lastname: Rizvi
authors.forename: R
authors.initials: R
authors.lastname: Bann
authors.forename: E
authors.initials: E
authors.lastname: Forster
authors.forename: K
authors.initials: K
authors.lastname: Goetz
authors.forename: I
authors.initials: I
authors.lastname: Uschmann