title: Microstructural and microspectral characterization of a vertically aligned liquid crystal display panel.
abstract: The microstructural and microspectral characteristics of a vertically aligned liquid crystal display (VA-LCD) panel were obtained noninvasively for the first time. With 1 μm axial and 2 μm transversal resolutions, the cell gap profile beneath the patterned thin-film transistor of the VA-LCD panel can clearly be resolved. The thicknesses of the multiple thin-film layers and the embedded defects can also be unveiled. As far as spectral response is concerned, the light transmittance at the layer boundaries can be estimated from the measured reflectance, which is crucial information for the design of a highly transmissive panel. The color shift of the VA-LCD panel due to fabrication error was evaluated.
authors.affiliation: Graduate Institute of Photonics and Optoelectronics, National Taiwan University, Taipei, Taiwan.
authors.forename: Chien-Chung
authors.initials: CC
authors.lastname: Tsai
authors.forename: Yen-Sheng
authors.initials: YS
authors.lastname: Lin
authors.forename: Shan-Chuang
authors.initials: SC
authors.lastname: Pei
authors.forename: Chia-Kai
authors.initials: CK
authors.lastname: Chang
authors.forename: Ting-Hao
authors.initials: TH
authors.lastname: Chen
authors.forename: Nai-Chia
authors.initials: NC
authors.lastname: Cheng
authors.forename: Meng-Ko
authors.initials: MK
authors.lastname: Tsai
authors.forename: Chien-Chih
authors.initials: CC
authors.lastname: Lai
authors.forename: Wang-Yang
authors.initials: WY
authors.lastname: Li
authors.forename: Chung-Kuang
authors.initials: CK
authors.lastname: Wei
authors.forename: Sheng-Lung
authors.initials: SL
authors.lastname: Huang