title: Characterization of multilayered glitter particles using synchrotron FT-IR microscopy.
abstract: Multilayered glitter particles were cut with a microtome into thin cross-sections and examined using an FT-IR microscope with a synchrotron infrared source. The high brightness of the synchrotron source enabled high-quality infrared spectra to be quickly obtained from individual layers in the glitter particle cross-section, providing additional chemical information that could increase the glitter particle's value as associative evidence in criminal cases.
authors.affiliation: Ecole Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Caen, France.
authors.forename: Laetitia
authors.initials: L
authors.lastname: Vernoud
authors.forename: Hans A
authors.initials: HA
authors.lastname: Bechtel
authors.forename: Michael C
authors.initials: MC
authors.lastname: Martin
authors.forename: John A
authors.initials: JA
authors.lastname: Reffner
authors.forename: Robert D
authors.initials: RD
authors.lastname: Blackledge