title: Comprehensive phenotypic analysis of single-gene deletion and overexpression strains of Saccharomyces cerevisiae.
abstract: We quantified the growth behaviour of all available single-gene deletion and overexpression strains of budding yeast. Genome-wide analyses enabled the extraction of the genes and identification of the functional categories for which genetic perturbation caused the change of growth behaviour. Statistical analyses revealed defective growth for 646 deletion and 1302 overexpression strains. We classified these deleted and overexpressed genes into known functional categories, and identified several functional categories having fragility and robustness for cellular growth. We also screened the deletion and overexpression strains that exhibited a significantly higher growth rate than the strain without genetic perturbation, and found that three deletion and two overexpression strains were high-growth strains. The genes and functional categories identified in the analysis might provide useful information on designing industrially useful yeast strains.
authors.affiliation: Department of Bioinformatic Engineering, Graduate School of Information Science and Technology, Osaka University, 1-5 Yamadaoka, Suita, Osaka, Japan.
authors.forename: Katsunori
authors.initials: K
authors.lastname: Yoshikawa
authors.forename: Tadamasa
authors.initials: T
authors.lastname: Tanaka
authors.forename: Yoshihiro
authors.initials: Y
authors.lastname: Ida
authors.forename: Chikara
authors.initials: C
authors.lastname: Furusawa
authors.forename: Takashi
authors.initials: T
authors.lastname: Hirasawa
authors.forename: Hiroshi
authors.initials: H
authors.lastname: Shimizu
mesh_terms: D017353:Gene Deletion; D015723:Gene Library; D016681:Genome, Fungal; D007218:Industrial Microbiology / Q000379:methods*; D009154:Mutation; D010641:Phenotype; D012441:Saccharomyces cerevisiae / Q000235:genetics* / Q000254:growth & development*