title: Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy.
abstract: We report an in situ method of preparing tips for scanning probe microscopy (SPM). Oriented single-crystal nickel oxide (NiO) rods were diced, using a wafer saw, to prepare artificial breaking points. Two geometries, a single rod and a two-sided cut rod were fabricated. The cleavable tips were mounted to a force sensor based on a quartz tuning fork and cleaved using the coarse approach of the SPM. Atomically resolved force microscopy images of NiO (001) were taken with these NiO tips.
authors.affiliation: Institute of Experimental and Applied Physics, University of Regensburg, Regensburg, Germany. thorsten.wutscher@physik.uni-regensburg.de
authors.forename: T
authors.initials: T
authors.lastname: Wutscher
authors.forename: F J
authors.initials: FJ
authors.lastname: Giessibl