title: Investigation of Tibetian Plateau varnish: new findings at the nanoscale using focused ion beam and transmission electron microscopy techniques.
abstract: Dual-beam focused ion beam microscopy (FIB/SEM) preparation of rock varnish for high-resolution transmission electron microscopy (HR-TEM) has enabled us to characterize unreported nanostructures. Fossils, unreported textures, and compositional variability were observed at the nanoscale. These techniques could provide a method for studying ancient terrestrial and extra-terrestrial environments to better understand geological processes at the nanoscale.
authors.affiliation: CAMCOR, University of Oregon, Eugene, Oregon 97403-1241, USA. klangwor@uoregon.edu
authors.forename: Kurt A
authors.initials: KA
authors.lastname: Langworthy
authors.forename: David H
authors.initials: DH
authors.lastname: Krinsley
authors.forename: Ronald I
authors.initials: RI
authors.lastname: Dorn