title: Parallel two-step phase-shifting point-diffraction interferometry for microscopy based on a pair of cube beamsplitters.
abstract: Parallel two-step phase-shifting point-diffraction interferometry for microscopy based on a pair of cube beamsplitters is proposed. The first 45°-tilted cube beamsplitter splits object wave into two parallel copies: one copy is filtered by a pinhole in its Fourier plane to behave as reference wave, while the other one remains unchanged as object wave. The second cube beamsplitter combines the object and reference waves, and then split them together into two beams. Along with the two beams, two parallel phase-shifting interferograms are obtained in aid of polarization elements. Based on the proposed configuration, slightly-off-axis interferometry for microscopy is performed, which suppresses dc term by subtracting the two phase-shifting holograms from each other. The setup is highly stable due to its common-path configuration, and has been demonstrated to be suitable for measuring moving objects or dynamic processes.
authors.affiliation: State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics,Chinese Academy of Sciences, Xi'an 710119, China.
authors.forename: Peng
authors.initials: P
authors.lastname: Gao
authors.forename: Baoli
authors.initials: B
authors.lastname: Yao
authors.forename: Junwei
authors.initials: J
authors.lastname: Min
authors.forename: Rongli
authors.initials: R
authors.lastname: Guo
authors.forename: Juanjuan
authors.initials: J
authors.lastname: Zheng
authors.forename: Tong
authors.initials: T
authors.lastname: Ye
authors.forename: Irina
authors.initials: I
authors.lastname: Harder
authors.forename: Vanusch
authors.initials: V
authors.lastname: Nercissian
authors.forename: Klaus
authors.initials: K
authors.lastname: Mantel
mesh_terms: D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007089:Image Enhancement / Q000295:instrumentation*; D007368:Interferometry / Q000295:instrumentation*; D008859:Microscopy, Polarization / Q000295:instrumentation*; D012031:Refractometry / Q000295:instrumentation*