title: Growth and morphology of sputtered aluminum thin films on P3HT surfaces.
abstract: Growth and morphology of an aluminum (Al) contact on a poly(3-hexylthiophene) (P3HT) thin film are investigated with X-ray methods and related to the interactions at the Al:P3HT interface. Grazing incidence small-angle scattering (GISAXS) is applied in situ during Al sputter deposition to monitor the growth of the layer. A growth mode is found, in which the polymer surface is wetted and rapidly covered with a continuous layer. This growth type results in a homogeneous film without voids and is explained by the strong chemical interaction between Al and P3HT, which suppresses the formation of three-dimensional cluster structures. A corresponding three stage growth model (surface bonding, agglomeration, and layer growth) is derived. X-ray reflectivity shows the penetration of Al atoms into the P3HT film during deposition and the presence of a 2 nm thick intermixing layer at the Al:P3HT interface.
authors.affiliation: Technische Universität München, Lehrstuhl für Funktionelle Materialien, Physik-Department E13, James-Franck-Strasse 1, 85747 Garching, Germany.
authors.forename: Gunar
authors.initials: G
authors.lastname: Kaune
authors.forename: Ezzeldin
authors.initials: E
authors.lastname: Metwalli
authors.forename: Robert
authors.initials: R
authors.lastname: Meier
authors.forename: Volker
authors.initials: V
authors.lastname: Körstgens
authors.forename: Kai
authors.initials: K
authors.lastname: Schlage
authors.forename: Sebastien
authors.initials: S
authors.lastname: Couet
authors.forename: Ralf
authors.initials: R
authors.lastname: Röhlsberger
authors.forename: Stephan V
authors.initials: SV
authors.lastname: Roth
authors.forename: Peter
authors.initials: P
authors.lastname: Müller-Buschbaum