title: A resistive memory in semiconducting BiFeO₃ thin-film capacitors.
authors.affiliation: State Key Laboratory of ASIC & System, Department of Microelectronics, Fudan University, Shanghai, China.
authors.forename: An Quan
authors.initials: AQ
authors.lastname: Jiang
authors.forename: Can
authors.initials: C
authors.lastname: Wang
authors.forename: Kui Juan
authors.initials: KJ
authors.lastname: Jin
authors.forename: Xiao Bing
authors.initials: XB
authors.lastname: Liu
authors.forename: James F
authors.initials: JF
authors.lastname: Scott
authors.forename: Cheol Seong
authors.initials: CS
authors.lastname: Hwang
authors.forename: Ting Ao
authors.initials: TA
authors.lastname: Tang
authors.forename: Hui Bin
authors.initials: HB
authors.lastname: Lu
authors.forename: Guo Zhen
authors.initials: GZ
authors.lastname: Yang
mesh_terms: D001729:Bismuth / Q000737:chemistry; D005290:Ferric Compounds / Q000737:chemistry*; D012666:Semiconductors
chemical_list: D005290:Ferric Compounds; C000499:ferric oxide; D001729:Bismuth