title: Conductive atomic force microscope nanopatterning of epitaxial graphene on SiC(0001) in ambient conditions.
authors.affiliation: Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, USA.
authors.forename: Justice M P
authors.initials: JM
authors.lastname: Alaboson
authors.forename: Qing Hua
authors.initials: QH
authors.lastname: Wang
authors.forename: Joshua A
authors.initials: JA
authors.lastname: Kellar
authors.forename: Joohee
authors.initials: J
authors.lastname: Park
authors.forename: Jeffrey W
authors.initials: JW
authors.lastname: Elam
authors.forename: Michael J
authors.initials: MJ
authors.lastname: Pellin
authors.forename: Mark C
authors.initials: MC
authors.lastname: Hersam
mesh_terms: D017554:Carbon Compounds, Inorganic / Q000737:chemistry*; D006108:Graphite / Q000737:chemistry*; D007700:Kinetics; D018625:Microscopy, Atomic Force / Q000379:methods*; D049329:Nanostructures / Q000737:chemistry*; D036103:Nanotechnology / Q000379:methods*; D017655:Silicon Compounds / Q000737:chemistry*
chemical_list: D017554:Carbon Compounds, Inorganic; D017655:Silicon Compounds; D006108:Graphite; C022088:silicon carbide