title: Focusing light through random photonic media by binary amplitude modulation.
abstract: We study the focusing of light through random photonic materials using wavefront shaping. We explore a novel approach namely binary amplitude modulation. To this end, the light incident to a random photonic medium is spatially divided into a number of segments. We identify the segments that give rise to fields that are out of phase with the total field at the intended focus and assign these a zero amplitude, whereas the remaining segments maintain their original amplitude. Using 812 independently controlled segments of light, we find the intensity at the target to be 75±6 times enhanced over the average intensity behind the sample. We experimentally demonstrate focusing of light through random photonic media using both an amplitude only mode liquid crystal spatial light modulator and a MEMS-based spatial light modulator. Our use of Micro Electro-Mechanical System (MEMS)-based digital micromirror devices for the control of the incident light field opens an avenue to high speed implementations of wavefront shaping.
authors.affiliation: Complex Photonic Systems, Faculty of Science and Technology and MESA+ Institute for Nanotechnology, University of Twente, P.O.Box 217, 7500 AE Enschede, The Netherlands. d.akbulut@tnw.utwente.nl
authors.forename: D
authors.initials: D
authors.lastname: Akbulut
authors.forename: T J
authors.initials: TJ
authors.lastname: Huisman
authors.forename: E G
authors.initials: EG
authors.lastname: van Putten
authors.forename: W L
authors.initials: WL
authors.lastname: Vos
authors.forename: A P
authors.initials: AP
authors.lastname: Mosk
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D007909:Lenses; D008029:Lighting / Q000295:instrumentation*; D055617:Micro-Electrical-Mechanical Systems / Q000295:instrumentation*; D017785:Photons; D012031:Refractometry / Q000295:instrumentation*; D012815:Signal Processing, Computer-Assisted / Q000295:instrumentation*; D013685:Telecommunications / Q000295:instrumentation*