title: Random phase mask in a filamentation regime: application to the localization of point sources.
abstract: We present a optical system with an extended point-spread function (PSF) for the localization of point sources in the visible and IR spectral ranges with a subpixel precision. This compact system involves a random phase mask (RPM) as its unique component. It exhibits original properties, because this RPM is used in a particular regime, called the "filamentation regime," before the speckle region. The localization is performed by calculating the phase correlation between the PSF and the image obtained under off-axis illumination. Numerical simulations are presented to assess the basic optical properties of this RPM in the filamentation regime.
authors.affiliation: ONERA, The French Aerospace Lab, Chemin de la Hunière, Palaiseau, France. florence.de_la_barriere@onera.fr
authors.forename: Florence
authors.initials: F
authors.lastname: de la Barrière
authors.forename: Guillaume
authors.initials: G
authors.lastname: Druart
authors.forename: Nicolas
authors.initials: N
authors.lastname: Guérineau
authors.forename: Yann
authors.initials: Y
authors.lastname: Ferrec
authors.forename: Jean
authors.initials: J
authors.lastname: Taboury
authors.forename: Jérôme
authors.initials: J
authors.lastname: Primot