title: High-precision metrology of highly charged ions via relativistic resonance fluorescence.
abstract: Resonance fluorescence of laser-driven highly charged ions is investigated with regard to precisely measuring atomic properties. For this purpose an ab initio approach based on the Dirac equation is employed that allows for studying relativistic ions. These systems provide a sensitive means to test correlated relativistic dynamics, quantum electrodynamic phenomena and nuclear effects by applying x-ray lasers. We show how the narrowing of sidebands in the x-ray fluorescence spectrum by interference due to an additional optical driving can be exploited to determine atomic dipole or multipole moments to unprecedented accuracy.
authors.affiliation: Max Planck Institute for Nuclear Physics, Saupfercheckweg 1, 69117 Heidelberg, Germany and ExtreMe Matter Institute EMMI, Planckstrasse 1, 64291 Darmstadt, Germany.
authors.forename: O
authors.initials: O
authors.lastname: Postavaru
authors.forename: Z
authors.initials: Z
authors.lastname: Harman
authors.forename: C H
authors.initials: CH
authors.lastname: Keitel