title: Continuous measurement of atomic force microscope tip wear by contact resonance force microscopy.
authors.affiliation: Materials Reliability Division, National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA. jason.killgore@nist.gov
authors.forename: Jason P
authors.initials: JP
authors.lastname: Killgore
authors.forename: Roy H
authors.initials: RH
authors.lastname: Geiss
authors.forename: Donna C
authors.initials: DC
authors.lastname: Hurley
mesh_terms: D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods*; D012825:Silicon / Q000737:chemistry
chemical_list: D012825:Silicon