title: Software compensation of eddy current fields in multislice high order dynamic shimming.
abstract: Dynamic B(0) shimming (DS) can produce better field homogeneity than static global shimming by dynamically updating slicewise shim values in a multislice acquisition. The performance of DS however is limited by eddy current fields produced by the switching of 2nd and 3rd order unshielded shims. In this work, we present a novel method of eddy field compensation (EFC) applied to higher order shim induced eddy current fields in multislice DS. This method does not require shim shielding, extra hardware for eddy current compensation or subject specific prescanning. The interactions between shim harmonics are modeled assuming steady state of the medium and long time constant, cross and self term eddy fields in a DS experiment and 'correction factors' characterizing the entire set of shim interactions are derived. The correction factors for a given time between shim switches are shown to be invariable with object scanned, shim switching pattern and actual shim values, allowing for their generalized prospective use. Phantom and human head, 2nd and 3rd order DS experiments performed without any hardware eddy current compensation using the technique show large reductions in field gradients and offsets leading to significant improvements in image quality. This method holds promise as an alternative to expensive hardware based eddy current compensation required in 2nd and 3rd order DS.
authors: Vanderbilt University Institute of Imaging Science, Vanderbilt University, Nashville, TN 37235, USA. saikat.sengupta@vanderbilt.edu
authors: Saikat
authors: S
authors: Sengupta
authors: Malcolm J
authors: MJ
authors: Avison
authors: John C
authors: JC
authors: Gore
authors: E
authors: E
authors: Brian Welch
mesh_terms: D001931:Brain Mapping / Q000379:methods*; D002138:Calibration; D006801:Humans; D007089:Image Enhancement / Q000379:methods*; D007091:Image Processing, Computer-Assisted / Q000379:methods*; D016018:Least-Squares Analysis; D008279:Magnetic Resonance Imaging / Q000295:instrumentation / Q000379:methods*; D019047:Phantoms, Imaging; D012984:Software