title: General approach to reliable characterization of thin metal films.
abstract: Optical constants of thin metal films are strongly dependent on deposition conditions, growth mode, and thickness. We propose a universal characterization approach that allows reliable determination of thin metal film optical constants as functions of wavelength and thickness. We apply this approach to determination of refractive index dispersion of silver island films embedded between silica layers.
authors: Research Computing Center, Moscow State University, Leninskie Gory, 119992, Moscow, Russia.
authors: Tatiana V
authors: TV
authors: Amotchkina
authors: Vesna
authors: V
authors: Janicki
authors: Jordi
authors: J
authors: Sancho-Parramon
authors: Alexander V
authors: AV
authors: Tikhonravov
authors: Michael K
authors: MK
authors: Trubetskov
authors: Hrvoje
authors: H
authors: Zorc