title: Antireflective property of thin film a-Si solar cell structures with graded refractive index structure.
abstract: We report the antireflective property of thin film amorphous silicon (a-Si) solar cell structures based on graded refractive index structure together with theoretical analysis. Optimizations of the index profile are performed using the rigorous coupled-wave analysis method. The graded refractive index structure fabricated by oblique angle deposition suppresses optical reflection over a wide range of wavelength and incident angle, compared to the conventional structure. The average reflectance of thin film a-Si solar cell structure with the graded refractive index structure is suppressed by 54% at normal incidence due to the effective refractive index matching between ITO and a-Si, indicating a reasonable agreement with calculated results.
authors: School of Information and Communications, Gwangju Institute of Science and Technology, 1 Oryong-dong, Buk-gu, Gwangju, 500-712, South Korea.
authors: Sung Jun
authors: SJ
authors: Jang
authors: Young Min
authors: YM
authors: Song
authors: Chan Il
authors: CI
authors: Yeo
authors: Chang Young
authors: CY
authors: Park
authors: Jae Su
authors: JS
authors: Yu
authors: Yong Tak
authors: YT
authors: Lee