title: Group delay dispersion measurement of a dispersive mirror by spectral interferometry: comparison of different signal processing algorithms.
abstract: We built a dispersive white-light spectral interferometer for precisely measuring the dispersion properties of a multilayer thin-film structure. A novel algorithm with improved robustness to measurement errors is presented by combining a windowed Fourier transformation with wavelet-based differentiation. Compared with previously published algorithms, this method shows substantial resistance to measurement errors. The group delay dispersion properties of bulk materials and a homemade chirped mirror are measured by our apparatus, and the measurement result manifests considerable accuracy and robustness. The technique shows reasonable potential for the characterization of ultrabroadband chirped mirrors.
authors: State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou, China.
authors: Zhenyue
authors: Z
authors: Luo
authors: Shuna
authors: S
authors: Zhang
authors: Wei-dong
authors: WD
authors: Shen
authors: Cen
authors: C
authors: Xia
authors: Qun
authors: Q
authors: Ma
authors: Xu
authors: X
authors: Liu
authors: Yueguang
authors: Y
authors: Zhang