title: Optical parameters of oxide films typically used in optical coating production.
abstract: Wavelength dependencies of refractive indices of thin film materials differ for various deposition conditions, and it is practically impossible to attribute a single refractive index wavelength dependence to any typical thin film material. Besides objective reasons, differences in the optical parameters of thin films may also be connected with nonadequate choices of models and algorithms used for the processing of measurement data. The main goal of this paper is to present reliable wavelength dependencies of refractive indices of the most widely used slightly absorbing oxide thin film materials. These dependencies can be used by other researchers for comparison and verification of their own characterization results.
authors: Research Computing Center, Moscow State University, Moscow, Russia. tikh@srcc.msu.ru
authors: Alexander V
authors: AV
authors: Tikhonravov
authors: Michael K
authors: MK
authors: Trubetskov
authors: Tatiana V
authors: TV
authors: Amotchkina
authors: Gary
authors: G
authors: DeBell
authors: Vladimir
authors: V
authors: Pervak
authors: Anna Krasilnikova
authors: AK
authors: Sytchkova
authors: Maria Luisa
authors: ML
authors: Grilli
authors: Detlev
authors: D
authors: Ristau