title: Lost in reciprocal space? Determination of the scattering condition in spot profile analysis low-energy electron diffraction.
abstract: The precise knowledge of the diffraction condition, i.e., the angle of incidence and electron energy, is crucial for the study of surface morphology through spot profile analysis low-energy electron diffraction (LEED). We demonstrate four different procedures to determine the diffraction condition: employing the distortion of the LEED pattern under large angles of incidence, the layer-by-layer growth oscillations during homoepitaxial growth, a G(S) analysis of a rough surface, and the intersection of facet rods with 3D Bragg conditions.
authors: Department of Physics, Universität Duisburg-Essen, Lotharstr. 1, D-47057 Duisburg, Germany. claudius.klein@uni-due.de
authors: C
authors: C
authors: Klein
authors: T
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authors: Nabbefeld
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authors: Hattab
authors: D
authors: D
authors: Meyer
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authors: Jnawali
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authors: Kammler
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authors: Meyer zu Heringdorf
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authors: Golla-Franz
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authors: Müller
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authors: Schmidt
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authors: Henzler
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authors: Horn-von Hoegen