title: In situ transmission electron microscopy imaging of grain growth in a platinum nanobridge induced by electric current annealing.
abstract: We report an in situ transmission electron microscopy (TEM) imaging of grain growth in a Pt nanobridge induced by a high electric current density. The change in morphology at the nanoscale was recorded in real time together with the electrical characterization of the Pt nanobridge. We find a drop in the differential resistance as the voltage across the bridge is increased; TEM inspection shows that this coincides with thermally induced grain growth, indicating that a reduction of grain boundary scattering is the cause of the resistance decrease.
authors: Kavli Institute of Nanoscience, Delft University of Technology, Delft, The Netherlands. b.gao@fkf.mpg.de
authors: B
authors: B
authors: Gao
authors: M
authors: M
authors: Rudneva
authors: K S
authors: KS
authors: McGarrity
authors: Q
authors: Q
authors: Xu
authors: F
authors: F
authors: Prins
authors: J M
authors: JM
authors: Thijssen
authors: H
authors: H
authors: Zandbergen
authors: H S J
authors: HS
authors: van der Zant