title: Optical study of Mn-doped Bi4Ti3O,12 thin films by spectroscopic ellipsometry.
abstract: Mn-doped Bi4Ti3O12(B4T3) thin films grown at 400 degrees C on a Pt/Ti/SiO2/Si substrate through pulsed laser deposition (PLD) were analyzed via spectroscopic ellipsometry (SE). The PLD targets were produced through the conventional solid-state sintering method, and the film samples were annealed at 600 degrees C. The SE spectra of B4T3 films were measured using a rotating analyzer type ellipsometer within the 1.12 to 6.52 eV energy range, with the various incidence angles. The optical properties of the B4T3 films with increasing Mn-mol concentration were extracted using a multilayer model for the whole structure and the Tauc-Lorentz (TL) dispersion relation for the B4T3 film layer. The analysis results clearly showed that the significant changes in optical properties of B4T3 films are caused by thermal annealing procedure and the Mn-mol concentrations. X-ray diffraction (XRD) measurement was also performed to confirm the results of SE analysis.
authors: Nano Optical Property Laboratory and Department of Physics, Kyung Hee University, Seoul 130-701, Korea.
authors: Soon Yong
authors: SY
authors: Hwang
authors: Tae Jung
authors: TJ
authors: Kim
authors: Jae Jin
authors: JJ
authors: Yoon
authors: Young Hun
authors: YH
authors: Cha
authors: Young Dong
authors: YD
authors: Kim
authors: Tae-Geun
authors: TG
authors: Seong
authors: Lee-Seung
authors: LS
authors: Kang
authors: Sahn
authors: S
authors: Nahm