title: A dual analyzer for real-time impedance and noise spectroscopy of nanoscale devices.
abstract: This paper introduces a simple portable dual analyzer which allows real-time ac-impedance measurements and noise spectroscopic analysis simultaneously, employing one or two data acquisition systems together with a low noise current-to-voltage preamplifier. The input signal composed of numerous selected frequencies of sinusoidal voltages with a dc bias was applied to a device under the test (DUT): single walled carbon nanotube field effect transistors (SWCNT-FETs). Each frequency component, ranging from 1 to 46.4 kHz, was successfully mapped to a Nyquist plot using the background of the electrical noise power spectrum. It is, thus, clearly demonstrated that this dual analyzer enables the real-time ac-impedance analysis and the frequency response of the carrier transport in the SWCNT-FETs as a DUT.
authors: School of Electrical Engineering, Korea University, Seoul 136-701, South Korea.
authors: Min-Kyu
authors: MK
authors: Joo
authors: Pilsoo
authors: P
authors: Kang
authors: Yongha
authors: Y
authors: Kim
authors: Gyu-Tae
authors: GT
authors: Kim
authors: Sangtae
authors: S
authors: Kim
mesh_terms: D058266:Dielectric Spectroscopy / Q000295:instrumentation*; D036103:Nanotechnology / Q000295:instrumentation*; D013997:Time Factors; D014173:Transistors, Electronic