title: [A technical approach to endothelial dysfunction by atomic force microscope].
abstract: Endothelial cells (ECs) with a variety of functions are vulnerable to attack by various risk factors. These risk factors of vascular pathology lead to endothelial dysfunction (ED). However, the present methods of evaluating ED have their limitations. Atomic force microscope (AFM), which can offer the information on the surface images and the mechanical properties of the single cell at nanometer scale, will become a new technical approach to ED evaluation. This review focuses on the recent progress in the application of AFM to assess ED.
authors.affiliation: Department of Endocrinology, First Affiliated Hospital, Jinan University, Guangzhou 510632, China.
authors.forename: Xianxian
authors.initials: X
authors.lastname: Chen
authors.forename: Lie
authors.initials: L
authors.lastname: Feng
mesh_terms: D042783:Endothelial Cells / Q000166:cytology* / Q000502:physiology*; D006801:Humans; D018625:Microscopy, Atomic Force / Q000379:methods*