title: Thickness measurement of organic films using Compton scattering of characteristic X-rays.
abstract: An X-ray scattering method is presented for determining the thickness of an organic film placed on a steel substrate. The strong peaks of characteristic X-rays are taken as an advantage to measure the intensity of backscattered photons. It is shown that the intensity of Compton scattering of characteristic X-rays is proportional to film thickness, up to the thickness of 250 μm of acrylic adhesive layers. In addition, the measurement time was 300 ms, providing a simple and convenient method for on-line for thickness monitoring.
authors.affiliation: Nuclear Chemistry Research Division, Korea Atomic Energy Research Institute, Daedeok-daero, Dukjin-dong Yuseong-gu, Daejeon, Republic of Korea. kjy@kaeri.re.kr
authors.forename: Jong-Yun
authors.initials: JY
authors.lastname: Kim
authors.forename: Yong Suk
authors.initials: YS
authors.lastname: Choi
authors.forename: Yong Joon
authors.initials: YJ
authors.lastname: Park
authors.forename: Kyuseok
authors.initials: K
authors.lastname: Song
authors.forename: Sung-Hee
authors.initials: SH
authors.lastname: Jung
authors.forename: Esam M A
authors.initials: EM
authors.lastname: Hussein