title: Sensitive and robust second-harmonic interferometer for measuring the dispersion of the electro-optic coefficients in bulk materials.
abstract: Second-harmonic interferometry (SHI) is proposed for measuring the electro-optic (EO) coefficients of massive media. It combines the advantages of interferometric techniques with the mechanical stability of single-beam methods, simultaneously skimming the wavelength dispersion of the EO response. For demonstrating the effectiveness of the SHI technique, the EO coefficients r(33)(T) and r(13)(T) of the EO crystal lithium niobate are measured simultaneously at 1064 and 532 nm.
authors.affiliation: Physics Department, University of Pisa, Largo Bruno Pontecorvo 3, I-56127 Pisa, Italy. tommaso.delrosso@df.unipi.it
authors.forename: T
authors.initials: T
authors.lastname: Del Rosso
authors.forename: D
authors.initials: D
authors.lastname: Grando
authors.forename: P
authors.initials: P
authors.lastname: Marsili
authors.forename: F
authors.initials: F
authors.lastname: Giammanco