title: New developments in fabrication of high-energy-resolution analyzers for inelastic X-ray spectroscopy.
abstract: In this work new improvements related to the fabrication of spherical bent analyzers for 1 meV energy-resolution inelastic X-ray scattering spectroscopy are presented. The new method includes the use of a two-dimensional bender to achieve the required radius of curvature for X-ray analyzers. The advantage of this method is the ability to monitor the focus during bending, which leads to higher-efficiency analyzers.
authors.affiliation: Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA. said@aps.anl.gov
authors.forename: Ayman H
authors.initials: AH
authors.lastname: Said
authors.forename: Harald
authors.initials: H
authors.lastname: Sinn
authors.forename: Ralu
authors.initials: R
authors.lastname: Divan