title: Mapping of local electrical properties in epitaxial graphene using electrostatic force microscopy.
abstract: Local electrical characterization of epitaxial graphene grown on 4H-SiC(0001) using electrostatic force microscopy (EFM) in ambient conditions and at elevated temperatures is presented. EFM provides a straightforward identification of graphene with different numbers of layers on the substrate where topographical determination is hindered by adsorbates. Novel EFM spectroscopy has been developed measuring the EFM phase as a function of the electrical DC bias, establishing a rigorous way to distinguish graphene domains and facilitating optimization of EFM imaging.
authors.affiliation: National Physical Laboratory, Teddington, TW11 0LW, United Kingdom.
authors.forename: Tim
authors.initials: T
authors.lastname: Burnett
authors.forename: Rositza
authors.initials: R
authors.lastname: Yakimova
authors.forename: Olga
authors.initials: O
authors.lastname: Kazakova
mesh_terms: D017554:Carbon Compounds, Inorganic / Q000737:chemistry; D004583:Electrons; D006108:Graphite / Q000737:chemistry*; D018625:Microscopy, Atomic Force; D010316:Particle Size; D017655:Silicon Compounds / Q000737:chemistry; D013499:Surface Properties
chemical_list: D017554:Carbon Compounds, Inorganic; D017655:Silicon Compounds; D006108:Graphite; C022088:silicon carbide