title: Revealing low-dose radiation damage using single-crystal spectroscopy.
abstract: The structural information and functional insight obtained from X-ray crystallography can be enhanced by the use of complementary spectroscopies. Here the information that can be obtained from spectroscopic methods commonly used in conjunction with X-ray crystallography and best-practice single-crystal UV-Vis absorption data collection are briefly reviewed. Using data collected with the in situ system at the Swiss Light Source, the time and dose scales of low-dose X-ray-induced radiation damage and solvated electron generation in metalloproteins at 100 K are investigated. The effect of dose rate on these scales is also discussed.
authors.affiliation: Diamond Light Source Ltd, Diamond House, Harwell Science and Innovation Campus, Didcot OX11 0DE, UK. robin.owen@diamond.ac.uk
authors.forename: Robin L
authors.initials: RL
authors.lastname: Owen
authors.forename: Briony A
authors.initials: BA
authors.lastname: Yorke
authors.forename: James A
authors.initials: JA
authors.lastname: Gowdy
authors.forename: Arwen R
authors.initials: AR
authors.lastname: Pearson