title: Model for measurement of water layer thickness under lipid bilayers by surface plasmon resonance.
abstract: A multilayered-substrate model is proposed for surface plasmon resonance (SPR)-based measurement of the thickness of a water layer sandwiched between a lipid bilayer and an underlying support. To calculate sensitivity, a 473 nm-wavelength excitation source and a silver layer are used for the SPR sensor. It is theoretically shown that the multilayered substrate design achieves sufficient sensitivity for such measurements and that sensitivity is enhanced with a SiO(2) layer of appropriate thickness and a buffer solution of high refractive index.
authors.affiliation: Unit of Measurement Technology, CEMIS-OULU, University of Oulu, PO Box 51, 87101 Kajaani, Finland.
authors.forename: Koyo
authors.initials: K
authors.lastname: Watanabe