title: Electrical characteristics and photocurrent spectral response of Si nanowires p-i-n junctions.
abstract: P-i-n junctions were fabricated along Si nanowires (SiNWs) via the conventional top-down approach using optical lithography. Each device comprises 500 identical SiNWs connected in parallel, and each SiNW has triangular cross-section with dimensions of ~6 nm (base) by ~8 nm (height). The photodiodes exhibit very good rectifying electrical characteristics with a low reverse bias current of ~0.2 fA per SiNW. The photocurrent spectral response exhibits three peaks between 400 nm to 700 nm, which arise due to local optical field enhancement associated with diffraction by the periodic SiNW array and interference in an air/SiO2/Si cavity.
authors.affiliation: Microelectronics Center, School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore.
authors.forename: Yongshun
authors.initials: Y
authors.lastname: Sun
authors.lastname: Rusli
authors.forename: Mingbin
authors.initials: M
authors.lastname: Yu
authors.forename: Joe
authors.initials: J
authors.lastname: Salfi
authors.forename: Christina
authors.initials: C
authors.lastname: Souza
authors.forename: Harry E
authors.initials: HE
authors.lastname: Ruda
authors.forename: Navab
authors.initials: N
authors.lastname: Singh
authors.forename: Foo Kai
authors.initials: FK
authors.lastname: Lin
authors.forename: Patrick
authors.initials: P
authors.lastname: Lo
authors.forename: Dim Lee
authors.initials: DL
authors.lastname: Kwong