title: Three-dimensional orientation mapping in the transmission electron microscope.
abstract: Over the past decade, efforts have been made to develop nondestructive techniques for three-dimensional (3D) grain-orientation mapping in crystalline materials. 3D x-ray diffraction microscopy and differential-aperture x-ray microscopy can now be used to generate 3D orientation maps with a spatial resolution of 200 nanometers (nm). We describe here a nondestructive technique that enables 3D orientation mapping in the transmission electron microscope of mono- and multiphase nanocrystalline materials with a spatial resolution reaching 1 nm. We demonstrate the technique by an experimental study of a nanocrystalline aluminum sample and use simulations to validate the principles involved.
authors.affiliation: Center for Fundamental Research: Metal Structures in Four Dimensions, Materials Research Division, Risø National Laboratory for Sustainable Energy, Technical University of Denmark, DK-4000 Roskilde, Denmark.
authors.forename: H H
authors.initials: HH
authors.lastname: Liu
authors.forename: S
authors.initials: S
authors.lastname: Schmidt
authors.forename: H F
authors.initials: HF
authors.lastname: Poulsen
authors.forename: A
authors.initials: A
authors.lastname: Godfrey
authors.forename: Z Q
authors.initials: ZQ
authors.lastname: Liu
authors.forename: J A
authors.initials: JA
authors.lastname: Sharon
authors.forename: X
authors.initials: X
authors.lastname: Huang