title: Surface profile measurement in white-light scanning interferometry using a three-chip color CCD.
abstract: White-light scanning interferometry (WLSI) is a useful technique to measure surface profile when a test object contains discontinuous structures or microstructures. A black and white CCD camera is usually utilized to capture interferograms, and a series of corresponding algorithms is used to achieve the profile measurement. However, the color information in the interferograms is lost. A novel profile measurement method that uses phase information in different color channels (red-green-blue) of an interferogram obtained using a three-chip color CCD in WLSI is proposed. The phase values are extracted by a windowed Fourier transform algorithm. Simulation and experimental results are presented to demonstrate the validity of the proposed method.
authors: Department of Mechanical Engineering, National University of Singapore, Singapore.
authors: Suodong
authors: S
authors: Ma
authors: Chenggen
authors: C
authors: Quan
authors: Rihong
authors: R
authors: Zhu
authors: Cho Jui
authors: CJ
authors: Tay
authors: Lei
authors: L
authors: Chen