title: Nanoscale electrowetting effects observed by using friction force microscopy.
abstract: We report the study of electrowetting (EW) effects under strong electric field on poly(methyl methacrylate) (PMMA) surface by using friction force microscopy (FFM). The friction force dependence on the electric field at nanometer scale can be closely related to electrowetting process based on the fact that at this scale frictional behavior is highly affected by capillary phenomena. By measuring the frictional signal between a conductive atomic force microscopy (AFM) tip and the PMMA surface, the ideal EW region (Young-Lippmann equation) and the EW saturation were identified. The change in the interfacial contact between the tip and the PMMA surface with the electric field strength is closely associated with the transition from the ideal EW region to the EW saturation. In addition, a reduction of the friction coefficient was observed when increasing the applied electric field in the ideal EW region.
authors: Key Laboratory of Standardization and Measurement for Nanotechnology, the Chinese Academy of Sciences, National Center for Nanoscience and Technology, Beijing 100190, China.
authors: Reynier
authors: R
authors: Revilla
authors: Li
authors: L
authors: Guan
authors: Xiao-Yang
authors: XY
authors: Zhu
authors: Yan-Lian
authors: YL
authors: Yang
authors: Chen
authors: C
authors: Wang