title: Local chemical composition of nanophase-separated polymer brushes.
abstract: Using scattering scanning nearfield infrared microscopy (s-SNIM), we have imaged the nanoscale phase separation of mixed polystyrene-poly(methyl methacrylate) (PS-PMMA) brushes and investigated changes in the top layer as a function of solvent exposure. We deduce that the top-layer of the mixed brushes is composed primarily of PMMA after exposure to acetone, while after exposure to toluene this changes to PS. Access to simultaneously measured topographic and chemical information allows direct correlation of the chemical morphology of the sample with topographic information. Our results demonstrate the potential of s-SNIM for chemical mapping based on distinct infrared absorption properties of polymers with a high spatial resolution of 80 nm × 80 nm.
authors: Department of Physical Chemistry II, Ruhr University Bochum, Universitätsstr. 150, 44780 Bochum, Germany.
authors: M
authors: M
authors: Filimon
authors: I
authors: I
authors: Kopf
authors: D A
authors: DA
authors: Schmidt
authors: E
authors: E
authors: Bründermann
authors: J
authors: J
authors: Rühe
authors: S
authors: S
authors: Santer
authors: M
authors: M
authors: Havenith