title: Ferromagnetic resonance of a single magnetic nanowire measured with an on-chip microwave interferometer.
abstract: An on-chip microwave interferometer suitable for high-sensitivity nanoscale magnetic material characterization is proposed. The device cancels the background parasitic common mode noise automatically. The magnetization dynamics of a 240 nm wide, 5 μm long, and 70 nm thick single permalloy nanowire is investigated. Compared with a prototype device proposed previously, the proposed device has a more than 20 dB sensitivity improvement. Full wave three-dimensional simulation shows that the device has the capability of studying the fundamental physics of nanoscale magnetic devices.
authors.affiliation: Intel Corporation, Columbia Design Center, South Carolina 29229, USA.
authors.forename: Hanqiao
authors.initials: H
authors.lastname: Zhang
authors.forename: Ralu
authors.initials: R
authors.lastname: Divan
authors.forename: Pingshan
authors.initials: P
authors.lastname: Wang