title: Compact and accurate concept of laser wavemeters based on ellipsometry.
abstract: Common laser wavemeters are based on a scanning Michelson interferometer. Displacements of the moving mirror as long as tens of centimeters are needed to reach a relative accuracy of 1 × 10(-6) (1σ) on the unknown laser wavelengths. Such a long displacement range makes the system very sensitive to mechanical vibrations and to misalignments of the laser beams. The purpose of this paper is to demonstrate a new concept of laser wavemeter based on the measurements of the ellipsometric parameters ψ and Δ of the laser beams. Experimental results show that a 10(-6) (1σ) accuracy level could be reach with a displacement range of only 4 μm. Implementations of the device are described. Comparisons between our polarimetric wavemeter and a calibrated wavemeter are presented for two lasers, an extended cavity laser diode at 656 nm and a 532 nm green line Nd:YAG laser.
authors.affiliation: LISV/University of Versailles, 78035 Versailles, France.
authors.forename: K
authors.initials: K
authors.lastname: Ouedraogo
authors.forename: S
authors.initials: S
authors.lastname: Topsu
authors.forename: L
authors.initials: L
authors.lastname: Chassagne
authors.forename: P
authors.initials: P
authors.lastname: Ruaux
authors.forename: B
authors.initials: B
authors.lastname: Cagneau
authors.forename: Y
authors.initials: Y
authors.lastname: Alayli