title: Simultaneous measurement of normal and friction forces using a cantilever-based optical interfacial force microscope.
abstract: We measured normal and friction forces simultaneously using a recently developed cantilever-based optical interfacial force microscope technique for studies of interfacial structures and mechanical properties of nanoscale materials. We derived how the forces can be incorporated into the detection signal using the classical Euler equation for beams. A lateral modulation with the amplitude of nanometers was applied to create the friction forces between tip and sample. We demonstrated its capability by measuring normal and friction forces of interfacial water at the molecular scale over all distance ranges.
authors.affiliation: Department of Physics, Boise State University, Boise, Idaho 83725, USA. ByungKim@boisestate.edu
authors.forename: Byung I
authors.initials: BI
authors.lastname: Kim
authors.forename: Jeremy R
authors.initials: JR
authors.lastname: Bonander
authors.forename: Jared A
authors.initials: JA
authors.lastname: Rasmussen
mesh_terms: D002138:Calibration; D004560:Electricity; D005246:Feedback; D017276:Friction; D008853:Microscopy; D055620:Optical Phenomena; D013997:Time Factors