title: InN thin film lattice dynamics by grazing incidence inelastic x-ray scattering.
abstract: Achieving comprehensive information on thin film lattice dynamics so far has eluded well established spectroscopic techniques. We demonstrate here the novel application of grazing incidence inelastic x-ray scattering combined with ab initio calculations to determine the complete elastic stiffness tensor, the acoustic and low-energy optic phonon dispersion relations of thin wurtzite indium nitride films. Indium nitride is an especially relevant example, due to the technological interest for optoelectronic and solar cell applications in combination with other group III nitrides.
authors.affiliation: ICREA-Departament de Física Aplicada, EPSC, Universitat Politècnica de Catalunya, Carrer Esteve Terradas 5, E-08860 Castelldefels, Spain. jserrano@fa.upc.edu
authors.forename: J
authors.initials: J
authors.lastname: Serrano
authors.forename: A
authors.initials: A
authors.lastname: Bosak
authors.forename: M
authors.initials: M
authors.lastname: Krisch
authors.forename: F J
authors.initials: FJ
authors.lastname: Manjón
authors.forename: A H
authors.initials: AH
authors.lastname: Romero
authors.forename: N
authors.initials: N
authors.lastname: Garro
authors.forename: X
authors.initials: X
authors.lastname: Wang
authors.forename: A
authors.initials: A
authors.lastname: Yoshikawa
authors.forename: M
authors.initials: M
authors.lastname: Kuball