title: Chemical modifications of atomic force microscopy tips.
abstract: Atomic force microscopy (AFM) works by scanning a very tiny tip over a surface with great precision. The microscope tips can be chemically functionalized to improve the images obtained. Well-defined chemical functionalization of AFM tips is especially important for experiments, such as chemical force microscopy and single molecule recognition force microscopy, to examine specific interactions at the single molecular level. In this chapter, we present an overview of chemical modifications of tips that have been reported to date with regards to the proper fixation of probe molecules, focusing particularly on chemical procedures developed to anchor biological molecules on AFM tips.
authors.affiliation: Département de chimie, Université Laval, Quebec, QC, Canada.
authors.forename: Régis
authors.initials: R
authors.lastname: Barattin
authors.forename: Normand
authors.initials: N
authors.lastname: Voyer
mesh_terms: D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods*; D057054:Molecular Imaging / Q000295:instrumentation* / Q000379:methods*; D012825:Silicon / Q000737:chemistry*; D017655:Silicon Compounds / Q000737:chemistry*; D013499:Surface Properties
chemical_list: D017655:Silicon Compounds; C032734:silicon nitride; D012825:Silicon