title: Fabrication and electric measurements of nanostructures inside transmission electron microscope.
abstract: Using manipulation holders specially designed for transmission electron microscope (TEM), nanostructures can be characterized, measured, modified and even fabricated in-situ. In-situ TEM techniques not only enable real-time study of structure-property relationships of materials at atomic scale, but also provide the ability to control and manipulate materials and structures at nanoscale. This review highlights in-situ electric measurements and in-situ fabrication and structure modification using manipulation holder inside TEM.
authors.affiliation: Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871, People's Republic of China. qingchen@pku.edu.cn
authors.forename: Qing
authors.initials: Q
authors.lastname: Chen
authors.forename: Lian-Mao
authors.initials: LM
authors.lastname: Peng
mesh_terms: D004560:Electricity; D004583:Electrons; D046529:Microscopy, Electron, Transmission / Q000379:methods*; D049329:Nanostructures / Q000032:analysis* / Q000737:chemistry*; D036103:Nanotechnology / Q000379:methods*