title: Slightly off-axis interferometry for microscopy with second wavelength assistance.
abstract: Slightly off-axis interferometry for microscopy has been performed, where the dc term of the interferogram is suppressed by the object wave in another wavelength. One wavelength of the laser beam (red light) is used to generate the slightly off-axis interferogram, while the second wavelength (blue light) is employed to measure the transmittance of the specimen. Both the red light and blue light are recorded simultaneously by a color CCD camera and can be separated without cross talk via the red-green-blue components. The dc term of the slightly off-axis interferogram of red light is suppressed with the object wave of blue light. As a consequence, the requirement on the off-axis angle between the object and reference waves is relaxed as well as the requirement on the resolving power of CCD camera.
authors.affiliation: School of Physics and Electronics, Henan University, Kaifeng 475004, China. junhh@henu.edu.cn
authors.forename: Junhe
authors.initials: J
authors.lastname: Han
authors.forename: Peng
authors.initials: P
authors.lastname: Gao
authors.forename: Baoli
authors.initials: B
authors.lastname: Yao
authors.forename: Yuzong
authors.initials: Y
authors.lastname: Gu
authors.forename: Mingju
authors.initials: M
authors.lastname: Huang