title: Measurement methods in atomic force microscopy.
abstract: This chapter is introductory to the measurements: it explains different measurement techniques both for imaging and for force spectroscopy, on which most of the AFM experiments rely. It gives a general overview of the different techniques and of the output expected from the instrument; therefore it is, at a basic level, a good tool to properly start a new experiment. Concepts introduced in this chapter give the base for understanding the applications shown in the following chapters. Subheading 1 introduces the distinction between spectroscopy and imaging experiments and, within the last ones, between DC and AC mode. Subheading 2 is focused on DC mode (contact), explaining the topography and the lateral force channel. Subheading 3 introduces AC mode, both in noncontact and intermittent contact case. Phase imaging and force modulation are also discussed. Subheading 4 explains how the AFM can be used to measure local mechanical and adhesive properties of specimens by means of force spectroscopy technique. An overview on the state of the art and future trends in this field is also given.
authors.affiliation: Robotics, Brain and Cognitive Sciences Department, Italian Institute of Technology, Genoa, Italy.
authors.forename: Bruno
authors.initials: B
authors.lastname: Torre
authors.forename: Claudio
authors.initials: C
authors.lastname: Canale
authors.forename: Davide
authors.initials: D
authors.lastname: Ricci
authors.forename: Pier Carlo
authors.initials: PC
authors.lastname: Braga
mesh_terms: D018625:Microscopy, Atomic Force / Q000295:instrumentation / Q000379:methods*; D013499:Surface Properties