title: A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materials.
abstract: Four-terminal electrical measurement is realized on a microscopic structure in air, without a lithographic process, using a home-built quadruple-scanning-probe force microscope (QSPFM). The QSPFM has four probes whose positions are individually controlled by obtaining images of a sample in the manner of atomic force microscopy (AFM), and uses the probes as contacting electrodes for electrical measurements. A specially arranged tuning fork probe (TFP) is used as a self-detection force sensor to operate each probe in a frequency modulation AFM mode, resulting in simultaneous imaging of the same microscopic feature on an insulator using the four TFPs. Four-terminal electrical measurement is then demonstrated in air by placing each probe electrode in contact with a graphene flake exfoliated on a silicon dioxide film, and the sheet resistance of the flake is measured by the van der Pauw method. The present work shows that the QSPFM has the potential to measure the intrinsic electrical properties of a wide range of microscopic materials in situ without electrode fabrication.
authors.affiliation: International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science, Tsukuba, Ibaraki 305-0044, Japan. higuchi.seiji@nims.go.jp
authors.forename: Seiji
authors.initials: S
authors.lastname: Higuchi
authors.forename: Osamu
authors.initials: O
authors.lastname: Kubo
authors.forename: Hiromi
authors.initials: H
authors.lastname: Kuramochi
authors.forename: Masakazu
authors.initials: M
authors.lastname: Aono
authors.forename: Tomonobu
authors.initials: T
authors.lastname: Nakayama