title: Advanced materials nanocharacterization.
abstract: This special issue of Nanoscale Research Letters contains scientific contributions presented at the Symposium D "Multidimensional Electrical and Chemical Characterization at the Nanometer-scale of Organic and Inorganic Semiconductors" of the E-MRS Fall Meeting 2010, which was held in Warsaw, Poland from 13th to 17th September, 2010.
authors.affiliation: CNR-IMM, Strada VIII, 5, 95121 Catania, Italy. filippo.giannazzo@imm.cnr.it.
authors.forename: Filippo
authors.initials: F
authors.lastname: Giannazzo
authors.forename: Pierre
authors.initials: P
authors.lastname: Eyben
authors.forename: Jacek
authors.initials: J
authors.lastname: Baranowski
authors.forename: Jean
authors.initials: J
authors.lastname: Camassel
authors.forename: Stefan
authors.initials: S
authors.lastname: Lányi