title: Quantitative analysis and measurements of near-field interactions in terahertz microscopes.
abstract: We demonstrated quantitative analysis and measurements of near-fields interactions in a terahertz pulse near-field microscope. We developed a self-consistent line dipole image method for the quantitative analysis of the near-field interaction in THz scattering-type scanning optical microscopes. The measurements of approach curves and relative contrasts on gold and silicon substrates were in excellent agreement with calculations.
authors.affiliation: National Laboratory for Nano-THz Photonics, Department of Electrical and Computer Engineering, POSTECH, Pohang, Gyeongbuk, Korea.
authors.forename: Kiwon
authors.initials: K
authors.lastname: Moon
authors.forename: Euna
authors.initials: E
authors.lastname: Jung
authors.forename: Meehyun
authors.initials: M
authors.lastname: Lim
authors.forename: Youngwoong
authors.initials: Y
authors.lastname: Do
authors.forename: Haewook
authors.initials: H
authors.lastname: Han