title: 'Wrong bonds' in sputtered amorphous Ge(2)Sb(2)Te(5).
abstract: The structure of sputtered amorphous Ge(2)Sb(2)Te(5) was investigated by high energy x-ray diffraction, neutron diffraction and Ge-, Sb- and Te K-edge EXAFS measurements. The five datasets were modelled simultaneously in the framework of the reverse Monte Carlo simulation technique. It was found that apart from Te-Sb and Te-Ge bonds existing in the crystalline phases, Ge-Ge and Sb-Ge bonding is also significant in sputtered amorphous Ge(2)Sb(2)Te(5). According to our results, all components obey the '8-N' rule.
authors.affiliation: Research Institute for Solid State Physics and Optics, Hungarian Academy of Sciences, Budapest POB 49, H-1525 Hungary.
authors.forename: P
authors.initials: P
authors.lastname: Jóvári
authors.forename: I
authors.initials: I
authors.lastname: Kaban
authors.forename: J
authors.initials: J
authors.lastname: Steiner
authors.forename: B
authors.initials: B
authors.lastname: Beuneu
authors.forename: A
authors.initials: A
authors.lastname: Schöps
authors.forename: A
authors.initials: A
authors.lastname: Webb