title: Depth from structured defocus that is independent of the object reflectivity function.
abstract: Depth from defocus using structured light is a useful optical metrology technique since the camera and projector can be placed on the same optical axis and it can cope with depth discontinuities. However, the technique can suffer from large errors when used on surfaces with differing reflective properties. This paper demonstrates a method for overcoming this problem.
authors.affiliation: School of Engineering and Design, University of Sussex, Brighton, BN1 9QT, UK. p.m.birch@sussex.ac.uk
authors.forename: Philip
authors.initials: P
authors.lastname: Birch
authors.forename: Alastair
authors.initials: A
authors.lastname: Buchanan
authors.forename: Rupert
authors.initials: R
authors.lastname: Young
authors.forename: Chris
authors.initials: C
authors.lastname: Chatwin