title: In situ conductance measurements of copper phthalocyanine thin film growth on sapphire [0001].
abstract: The current flowing through a thin film of copper phthalocyanine vacuum deposited on a single crystal sapphire [0001] surface was measured during film growth from 0 to 93 nm. The results, expressed as conductance vs. nominal film thickness, indicate three distinct film growth regions. Conductive material forms below about 5 nm and again above 35 nm, but in the intermediate thicknesses the film conductance was observed to decrease with increasing film thickness. With the aid of ac-AFM topology images taken ex situ, the conductance results are explained based on the Stranski-Krastanov (2D + 3D) film growth mechanism, in which the formation of a thin wetting layer is followed by the growth of discrete islands that eventually coalesce into an interpenetrating, conductive network.
authors.affiliation: Institute for Chemical Research, Kyoto University, Kyoto 611-0011, Japan. rmurdey@e.kuicr.kyoto-u.ac.jp
authors.forename: Richard
authors.initials: R
authors.lastname: Murdey
authors.forename: Naoki
authors.initials: N
authors.lastname: Sato
mesh_terms: D000537:Aluminum Oxide / Q000737:chemistry*; D007211:Indoles / Q000737:chemistry*; D008567:Membranes, Artificial; D009942:Organometallic Compounds / Q000737:chemistry*; D010316:Particle Size; D013499:Surface Properties; D017155:Wettability
chemical_list: D007211:Indoles; D008567:Membranes, Artificial; D009942:Organometallic Compounds; C015445:copper phthalocyanine; D000537:Aluminum Oxide