title: High-resolution study of (222, 113) three-beam diffraction in Ge.
abstract: The results of high-resolution analysis of the (222, >113) three-beam diffraction in Ge are presented. For monochromatization and angular collimation of the incident synchrotron beam a multi-crystal arrangement in a dispersive setup in both vertical and horizontal planes was used in an attempt to experimentally approach plane-wave incident conditions. Using this setup, for various azimuthal angles the polar angular curves which are very close to theoretical computer simulations for the plane monochromatic wave were measured. The effect of the strong two-beam 222 diffraction was observed for the first time with the maximum reflectivity close to 60% even though the total reflection of the incident beam into a forbidden reflection was not achieved owing to absorption. The structure factor of the 222 reflection in Ge was experimentally determined.
authors.affiliation: Cornell High Energy Synchrotron Source, Cornell University, Ithaca, NY 14853, USA. ayk7@cornell.edu
authors.forename: A
authors.initials: A
authors.lastname: Kazimirov
authors.forename: V G
authors.initials: VG
authors.lastname: Kohn
mesh_terms: D018360:Crystallography, X-Ray / Q000379:methods; D005857:Germanium / Q000737:chemistry*; D056004:Molecular Dynamics Simulation; D017356:Synchrotrons; D014961:X-Ray Diffraction / Q000379:methods*
chemical_list: D005857:Germanium