title: High quality factor nitride-based optical cavities: microdisks with embedded GaN/Al(Ga)N quantum dots.
abstract: We compare the quality factor values of the whispering gallery modes of microdisks (μ-disks) incorporating GaN quantum dots (QDs) grown on AlN and AlGaN barriers by performing room temperature photoluminescence (PL) spectroscopy. The PL measurements show a large number of high Q factor resonant modes on the whole spectrum, which allows us to identify the different radial mode families and to compare them with simulations. We report a considerable improvement of the Q factor, which reflects the etching quality and the relatively low cavity loss by inserting QDs into the cavity. GaN/AlN QDs-based μ-disks show very high Q values (Q>7000) whereas the Q factor is only up to 2000 in μ-disks embedding QDs grown on the AlGaN barrier layer. We attribute this difference to the lower absorption below bandgap for AlN barrier layers at the energies of our experimental investigation.
authors.affiliation: Laboratoire Charles Coulomb, UMR5221, CNRS/UM2, Université Montpellier 2, F-34095, Montpellier, France.
authors.forename: M
authors.initials: M
authors.lastname: Mexis
authors.forename: S
authors.initials: S
authors.lastname: Sergent
authors.forename: T
authors.initials: T
authors.lastname: Guillet
authors.forename: C
authors.initials: C
authors.lastname: Brimont
authors.forename: T
authors.initials: T
authors.lastname: Bretagnon
authors.forename: B
authors.initials: B
authors.lastname: Gil
authors.forename: F
authors.initials: F
authors.lastname: Semond
authors.forename: M
authors.initials: M
authors.lastname: Leroux
authors.forename: D
authors.initials: D
authors.lastname: Néel
authors.forename: S
authors.initials: S
authors.lastname: David
authors.forename: X
authors.initials: X
authors.lastname: Chécoury
authors.forename: P
authors.initials: P
authors.lastname: Boucaud