title: Mean field approach for describing thin film morphology.
abstract: A mean field approach is employed for determining the kinetics of two main quantities for film morphology, namely the number of islands and the film perimeter. These two quantities have been computed for both coalescence and impingement growth regimes. For each case the growth of two- and three-dimensional islands has been considered. In addition, the effect of the spatial correlation among nuclei has been taken into account on the grounds of the hard core interaction. Analytic formulae have been derived for each case.
authors.affiliation: Dipartimento di Scienze e Tecnologie Chimiche, Università di Roma Tor Vergata, Via della Ricerca Scientifica, 00133 Roma, Italy.
authors.forename: M
authors.initials: M
authors.lastname: Tomellini
authors.forename: M
authors.initials: M
authors.lastname: Fanfoni