title: Near field phase mapping exploiting intrinsic oscillations of aperture NSOM probe.
abstract: An innovative, simple, compact and low cost approach for phase mapping based on the intrinsic modulation of an aperture Near Field Scanning Optical Microscope probe is analyzed and experimentally demonstrated. Several nanoscale silicon waveguides are phase-mapped using this approach, and the different modes of propagation are obtained via Fourier analysis. The obtained measured results are in good agreement with the effective indexes of the modes calculated by electromagnetic simulations. Owing to its simplicity and effectiveness, the demonstrated system is a potential candidate for integration with current near field systems for the characterization of nanophotonic components and devices.
authors.affiliation: Department of Applied Physics, The Benin School of Engineering and Computer Science, The Center for Nanoscience and Nanotechnology, The Hebrew University of Jerusalem, Jerusalem, 91904, Israel.
authors.forename: Liron
authors.initials: L
authors.lastname: Stern
authors.forename: Boris
authors.initials: B
authors.lastname: Desiatov
authors.forename: Ilya
authors.initials: I
authors.lastname: Goykhman
authors.forename: Gilad M
authors.initials: GM
authors.lastname: Lerman
authors.forename: Uriel
authors.initials: U
authors.lastname: Levy
mesh_terms: D003198:Computer Simulation; D004574:Electromagnetic Fields; D004867:Equipment Design; D005583:Fourier Analysis; D020527:Microscopy, Scanning Probe / Q000295:instrumentation* / Q000379:methods*; D008962:Models, Theoretical; D036103:Nanotechnology / Q000295:instrumentation* / Q000379:methods*; D055095:Optics and Photonics / Q000379:methods; D012825:Silicon / Q000737:chemistry
chemical_list: D012825:Silicon