title: Roughness of CdTe thin films grown on glass by hot wall epitaxy.
abstract: Cadmium telluride films were grown on glass substrates using the hot wall epitaxy (HWE) technique. The samples were polycrystalline with a preferential (111) orientation. Scanning electron micrographs reveal a grain size between 0.1 and 0.5 µm. The surface morphology of the samples was studied by measuring the roughness profile using a stylus profiler. The roughness as a function of growth time and scale size were investigated to determine the growth and roughness exponents, β and α, respectively. From the results we can conclude that the growth surface has a self-affine character with a roughness exponent α equal to 0.69 ± 0.03 and almost independent of growth time. The growth exponent β was equal to 0.38 ± 0.06. These values agree with that determined previously for CdTe(111) films grown on GaAs(100).
authors.affiliation: Departamento de Física, Universidade Federal de Viçosa, Viçosa, MG, Brazil.
authors.forename: F F
authors.initials: FF
authors.lastname: Leal
authors.forename: S O
authors.initials: SO
authors.lastname: Ferreira
authors.forename: I L
authors.initials: IL
authors.lastname: Menezes-Sobrinho
authors.forename: T E
authors.initials: TE
authors.lastname: Faria