title: Synthesis of long group IV semiconductor nanowires by molecular beam epitaxy.
abstract: We report the growth of Si and Ge nanowires (NWs) on a Si(111) surface by molecular beam epitaxy. While Si NWs grow perpendicular to the surface, two types of growth axes are found for the Ge NWs. Structural studies of both types of NWs performed with electron microscopies reveal a marked difference between the roughnesses of their respective sidewalls. As the investigation of their length dependence on their diameter indicates that the growth of the NWs predominantly proceeds through the diffusion of adatoms from the substrate up along the sidewalls, difference in the sidewall roughness qualitatively explains the length variation measured between both types of NWs. The formation of atomically flat {111} sidewalls on the <110>-oriented Ge NWs accounts for a larger diffusion length.
authors.affiliation: Département ISEN, Institut d'Electronique, de Microélectronique et de Nanotechnologie, IEMN (CNRS, UMR 8520), 41 bd Vauban, 59046 Lille Cedex, France. bruno.grandidier@isen.fr.
authors.forename: Tao
authors.initials: T
authors.lastname: Xu
authors.forename: Julien
authors.initials: J
authors.lastname: Sulerzycki
authors.forename: Jean Philippe
authors.initials: JP
authors.lastname: Nys
authors.forename: Gilles
authors.initials: G
authors.lastname: Patriarche
authors.forename: Bruno
authors.initials: B
authors.lastname: Grandidier
authors.forename: Didier
authors.initials: D
authors.lastname: Stiévenard