title: Combining scanning probe microscopy and x-ray spectroscopy.
abstract: A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO4 thin layers are in perfect agreement with that obtained with other conventional techniques. Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown. Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample. Preliminary results on Co-Ti sample analysis are presented.
authors.affiliation: Université de la Méditerranée, CNRS-CINaM, Faculté des Sciences de Luminy, case 913, 13288 Marseille cedex 09, France. fauquet@cinam.univ-mrs.fr.
authors.forename: Carole
authors.initials: C
authors.lastname: Fauquet
authors.forename: Maël
authors.initials: M
authors.lastname: Dehlinger
authors.forename: Franck
authors.initials: F
authors.lastname: Jandard
authors.forename: Sylvain
authors.initials: S
authors.lastname: Ferrero
authors.forename: Daniel
authors.initials: D
authors.lastname: Pailharey
authors.forename: Sylvia
authors.initials: S
authors.lastname: Larcheri
authors.forename: Roberto
authors.initials: R
authors.lastname: Graziola
authors.forename: Juris
authors.initials: J
authors.lastname: Purans
authors.forename: Aniouar
authors.initials: A
authors.lastname: Bjeoumikhov
authors.forename: Alexei
authors.initials: A
authors.lastname: Erko
authors.forename: Ivo
authors.initials: I
authors.lastname: Zizak
authors.forename: Brahim
authors.initials: B
authors.lastname: Dahmani
authors.forename: Didier
authors.initials: D
authors.lastname: Tonneau