title: Scanning tunneling microscopy and X-ray photoelectron spectroscopy studies of graphene films prepared by sonication-assisted dispersion.
abstract: We describe scanning tunneling microscopy and X-ray photoelectron spectroscopy studies of graphene films produced by sonication-assisted dispersion. Defects in these samples are not randomly distributed, and the graphene films exhibit a "patchwork" structure where unperturbed graphene areas are adjacent to heavily functionalized ones. Adjacent graphene layers are likely in poor mechanical contact due to adventitious species trapped between the carbon sheets of the sample.
authors: Graphene Laboratories Inc, Reading, Massachusetts 01867, USA. elena.polyakova@graphenelab.com
authors: Elena Y
authors: EY
authors: Polyakova Stolyarova
authors: Kwang Taeg
authors: KT
authors: Rim
authors: Daejin
authors: D
authors: Eom
authors: Keith
authors: K
authors: Douglass
authors: Robert L
authors: RL
authors: Opila
authors: Tony F
authors: TF
authors: Heinz
authors: Andrew V
authors: AV
authors: Teplyakov
authors: George W
authors: GW
authors: Flynn
mesh_terms: D006108:Graphite / Q000737:chemistry*; D016252:Microscopy, Scanning Tunneling; D036103:Nanotechnology / Q000379:methods*; D056951:Photoelectron Spectroscopy; D013010:Sonication / Q000379:methods*
chemical_list: D006108:Graphite