title: Influences of the thickness, misalignment, and dispersion of the Savart polariscope on the optical path difference and spectral resolution in the polarization interference imaging spectrometer.
abstract: After reviewing the spectrum-dividing principle of the Savart polariscope (SP) in the polarization interference imaging spectrometer (PIIS) that we developed, we analyze the influences of the thickness, misalignment, and dispersion of the SP on the optical path difference (OPD). The theoretical expression of the OPD for the misalignment of the SP optical axis is deduced, and the OPD is analyzed when the incident plane is parallel, at 45°, or orthogonal to the principal section of the left plate of the SP. The selective thickness of the single Savart plate is analyzed when it is placed at the ideal and misalignment positions. The influence of dispersion of the SP on the OPD is analyzed when the misalignment error is ±1'. The relationships between the OPD and wavelength are simulated and validated with experiments. This work can provide theoretical and practical guidance for the design, calibration, modulation, innovation, experiment, and engineering of the PIIS.
authors: Ministry of Education Key Laboratory for Nonequilibrium Synthesis and Modulation of Condensed Matter, School of Science, Xi’an Jiaotong University, Xi'an 710049, China. zcm@mail.xjtu.edu.cn
authors: Chunmin
authors: C
authors: Zhang
authors: Jianke
authors: J
authors: Zhao
authors: Yao
authors: Y
authors: Sun
mesh_terms: D002138:Calibration; D003198:Computer Simulation; D004738:Engineering / Q000379:methods; D004867:Equipment Design; D007368:Interferometry / Q000379:methods*; D007909:Lenses; D008027:Light; D008422:Materials Testing; D015233:Models, Statistical; D055095:Optics and Photonics; D015203:Reproducibility of Results; D013053:Spectrophotometry / Q000379:methods*