title: Temperature field analysis of single layer TiO2 film components induced by long-pulse and short-pulse lasers.
abstract: To study the differences between the damaging of thin film components induced by long-pulse and short-pulse lasers, a model of single layer TiO(2) film components with platinum high-absorptance inclusions was established. The temperature rises of TiO(2) films with inclusions of different sizes and different depths induced by a 1 ms long-pulse and a 10 ns short-pulse lasers were analyzed based on temperature field theory. The results show that there is a radius range of inclusions that corresponds to high temperature rises. Short-pulse lasers are more sensitive to high-absorptance inclusions and long-pulse lasers are more easily damage the substrate. The first-damage decision method is drawn from calculations.
authors: School of Science, Nanjing University of Science & Technology, Nanjing 210094, China. wangbin0108@gmail.com
authors: Bin
authors: B
authors: Wang
authors: Hongchao
authors: H
authors: Zhang
authors: Yuan
authors: Y
authors: Qin
authors: Xi
authors: X
authors: Wang
authors: Xiaowu
authors: X
authors: Ni
authors: Zhonghua
authors: Z
authors: Shen
authors: Jian
authors: J
authors: Lu