title: Non-contact atomic force microscopy study of atomic manipulation on an insulator surface by nanoindentation.
abstract: Experimental results on vertical manipulation on an insulator surface using non-contact atomic force microscopy are presented. Cleaved ionic KCl(100) single crystal is used as an insulator surface. With the nanoindentation method used, the vertical manipulation of a single atom in an ionic crystal surface is more difficult than in a semiconductor surface. Therefore, in many cases, more than one surface atom is manipulated while, in rare cases, single-atom manipulation is successfully performed. Lateral manipulation of a vacancy has occasionally succeeded on the KCl(100) surface. We have presumed that the lateral manipulation was induced by pulling.
authors: Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan.
authors: Ryuji
authors: R
authors: Nishi
authors: Daisuke
authors: D
authors: Miyagawa
authors: Yoshihide
authors: Y
authors: Seino
authors: Insook
authors: I
authors: Yi
authors: Seizo
authors: S
authors: Morita