title: Shear-mode magnetic force microscopy with a quartz tuning fork in ambient conditions.
abstract: We have demonstrated high-resolution shear-mode magnetic force microscopy (MFM) using a quartz tuning fork in ambient conditions. A commercial magnetic cantilever tip was attached to one prong of the tuning fork to realize shear-mode MFM operation. We have obtained MFM images with a spatial resolution of less than 100 nm and demonstrated a frequency resolution of ∼1 mHz, values which are achieved by phase shift detection methods.
authors: Center for Nearfield Atom-Photon Technology and School of Physics, Seoul National University, Seoul 151-747, Korea.
authors: Kyungho
authors: K
authors: Kim
authors: Yongho
authors: Y
authors: Seo
authors: Hyunjun
authors: H
authors: Jang
authors: Sungjin
authors: S
authors: Chang
authors: Mun-Heon
authors: MH
authors: Hong
authors: Wonho
authors: W
authors: Jhe