title: Wavelength dispersive X-ray fluorescence imaging.
abstract: A new wavelength-dispersive X-ray fluorescence (WD-XRF) imaging spectrometer equipped with a two-dimensional X-ray detector was developed in the laboratory. Straight polycapillary optics was applied instead of a soller slit, which is used in conventional WD-XRF spectrometers. X-rays were guided through the straight polycapillary to the exit of the optics by X-ray external total reflections. X-ray fluorescence was dispersed by an analyzing crystal (LiF(200)), keeping the information of elemental distribution on the surface of the sample. The energy resolution of the developed spectrometer was 130-152 eV at the Zn Kα peak. X-ray elemental images of Cu Kα and Ni Kα were successfully obtained by an X-ray CCD detector at the corresponding diffraction angles. The analytical performance of this technique, and further improvements are discussed.
authors: Department of Applied Chemistry & Bioengineering, Graduate School of Engineering, Osaka City University, Sumiyoshi-ku, Osaka, Japan. tsuji@a-chem.eng.osaka-cu.ac.jp
authors: Kouichi
authors: K
authors: Tsuji
authors: Takashi
authors: T
authors: Ohmori
authors: Makoto
authors: M
authors: Yamaguchi