title: Five-element Johann-type x-ray emission spectrometer with a single-photon-counting pixel detector.
abstract: A Johann-type spectrometer with five spherically bent crystals and a pixel detector was constructed for a range of hard x-ray photon-in photon-out synchrotron techniques, covering a Bragg-angle range of 60°-88°. The spectrometer provides a sub emission line width energy resolution from sub-eV to a few eV and precise energy calibration, better than 1.5 eV for the full range of Bragg angles. The use of a pixel detector allows fast and easy optimization of the signal-to-background ratio. A concentration detection limit below 0.4 wt% was reached at the Cu Kα(1) line. The spectrometer is designed as a modular mobile device for easy integration in a multi-purpose hard x-ray synchrotron beamline, such as the SuperXAS beamline at the Swiss Light Source.
authors: Paul Scherrer Institut, 5232 Villigen, Switzerland. evgeny.kleymenov@psi.ch
authors: Evgeny
authors: E
authors: Kleymenov
authors: Jeroen A
authors: JA
authors: van Bokhoven
authors: Christian
authors: C
authors: David
authors: Pieter
authors: P
authors: Glatzel
authors: Markus
authors: M
authors: Janousch
authors: Roberto
authors: R
authors: Alonso-Mori
authors: Marco
authors: M
authors: Studer
authors: Markus
authors: M
authors: Willimann
authors: Anna
authors: A
authors: Bergamaschi
authors: Beat
authors: B
authors: Henrich
authors: Maarten
authors: M
authors: Nachtegaal