title: Scaling behaviors of the voltage distribution in dielectric breakdown networks.
abstract: We study the distribution of voltage drops across bonds in dielectric breakdown networks and its qth moments in the two-dimensional Euclidean space. Performing numerical simulations, we find that the distribution is composed of three different power-law regimes which are distinguished by two crossover voltages V(1) and V(2). The scaling behaviors of these crossover voltages with respect to the system size govern those of the qth moments of the voltage distribution. This feature differs from the multifractal behavior of the qth moment in random resistor networks. We discuss the implications of these scaling behaviors in relation to the application of the dielectric breakdown network to memory devices.
authors: Department of Physics and Astronomy, Seoul National University, Seoul, Korea.
authors: J S
authors: JS
authors: Lee
authors: B
authors: B
authors: Kahng