title: Measuring phase shifts and energy dissipation with amplitude modulation atomic force microscopy.
abstract: By recording the phase angle difference between the excitation force and the tip response in amplitude modulation AFM it is possible to image compositional variations in heterogeneous samples. In this contribution we address some of the experimental issues relevant to perform phase contrast imaging measurements. Specifically, we study the dependence of the phase shift on the tip-surface separation, interaction regime, cantilever parameters, free amplitude and tip-surface dissipative processes. We show that phase shift measurements can be converted into energy dissipation values. Energy dissipation curves show a maximum (∼10 eV/cycle) with the amplitude ratio. Furthermore, energy dissipation maps provide a robust method to image material properties because they do not depend directly on the tip-surface interaction regime. Compositional contrast images are illustrated by imaging conjugated molecular islands deposited on silicon surfaces.
authors: Instituto de Microelectrónica de Madrid, CSIC, Isaac Newton 8, 28760 Tres Cantos, Madrid, Spain.
authors: Nicolás F
authors: NF
authors: Martínez
authors: Ricardo
authors: R
authors: García