title: Phase noise measurement of a narrow linewidth CW laser using delay line approaches.
abstract: Two different laser phase noise measurement techniques are compared. One of these two techniques is based on a conventional and low-cost delay line system, which is usually set up for the linewidth measurement of semiconductor lasers. The results obtained with both techniques on a high-spectral-purity laser agree well and confirm the interest of the low-cost technique. Moreover, an extraction of the laser linewidth using computer-aided design tools is performed.
authors.affiliation: Laboratoire d’Analyse et d’Architecture des Systèmes (LAAS), CNRS, Université de Toulouse, 7 avenue Du Colonel Roche, 31077 Toulouse, France. llopis@laas.fr
authors.forename: O
authors.initials: O
authors.lastname: Llopis
authors.forename: P H
authors.initials: PH
authors.lastname: Merrer
authors.forename: H
authors.initials: H
authors.lastname: Brahimi
authors.forename: K
authors.initials: K
authors.lastname: Saleh
authors.forename: P
authors.initials: P
authors.lastname: Lacroix