title: Annealing sequence dependent open-circuit voltage of inverted polymer solar cells attributable to interfacial chemical reaction between top electrodes and photoactive layers.
abstract: The ability to laminate and delaminate top metal contacts during the processing and testing of inverted polymer solar cells has led us to uncover the peculiar dependence of their open-circuit voltage (V(oc)) on the annealing sequence. Specifically, thermally annealing inverted polymer solar cells having bulk-heterojunction photoactive layers after top electrode deposition above 100 °C leads to lower V(oc) compared to analogous devices with unannealed photoactive layers or photoactive layers that have been annealed prior to metal electrode deposition. This reduction in V(oc), however, can be reversed when the top electrodes are replaced. This observation is thus a strong indication that such changes in V(oc) with annealing sequence are manifestations of changes at the top electrode-photoactive layer interface, and not structural changes in the bulk of the photoactive layer. Electronic characterization conducted on the photoactive layers and metal contacts after dissection of the polymer solar cells via delamination suggests the reduction of V(oc) on thermal annealing in the presence of the metal top contacts to stem from an interfacial chemical reaction between the photoactive layers and the metal electrodes. This chemically generated interfacial layer is removed upon electrode delamination, effectively reverting the V(oc) to its original value prior to thermal annealing when the top electrodes are replaced.
authors.affiliation: Department of Chemical and Biological Engineering, Princeton University, Princeton, New Jersey 08544, USA.
authors.forename: Jong Bok
authors.initials: JB
authors.lastname: Kim
authors.forename: Ze-Lei
authors.initials: ZL
authors.lastname: Guan
authors.forename: Andrew L
authors.initials: AL
authors.lastname: Shu
authors.forename: Antoine
authors.initials: A
authors.lastname: Kahn
authors.forename: Yueh-Lin
authors.initials: YL
authors.lastname: Loo