title: A novel method for acquiring large-scale automated scanning electron microscope data.
abstract: Recent software and hardware advances in the field of electron backscatter diffraction have led to an increase in the rate of data acquisition. Combining automated stage movements with conventional beam control have allowed researchers to collect data from significantly larger areas of samples than was previously possible. This paper describes a LabVIEW™ and AutoIT(©)  code which allows for increased flexibility compared to commercially available software. The source code for this software has been made available in the online version of this paper.
authors.affiliation: Air Force Research Laboratory, Materials and Manufacturing Directorate, WPAFB, OH 45433, USA. adam.shiveley@wpafb.af.mil
authors.forename: A R
authors.initials: AR
authors.lastname: Shiveley
authors.forename: P A
authors.initials: PA
authors.lastname: Shade
authors.forename: A L
authors.initials: AL
authors.lastname: Pilchak
authors.forename: J S
authors.initials: JS
authors.lastname: Tiley
authors.forename: R
authors.initials: R
authors.lastname: Kerns