title: Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment.
abstract: A key issue for high-resolution frequency-modulation atomic force microscopy imaging in liquids is minimizing the frequency noise, which requires a detailed analysis of the corresponding noise contributions. In this paper, we present a detailed description for modifying a commercial atomic force microscope (Bruker MultiMode V with Nanoscope V controller), aiming at atomic-resolution frequency-modulation imaging in ambient and in liquid environment. Care was taken to maintain the AFMs original stability and ease of operation. The new system builds upon an optimized light source, a new photodiode and an entirely new amplifier. Moreover, we introduce a home-built liquid cell and sample holder as well as a temperature-stabilized isolation chamber dedicated to low-noise imaging in liquids. The success of these modifications is measured by the reduction in the deflection sensor noise density from initially 100 fm/√Hz to around 10 fm/√Hz after modification. The performance of our instrument is demonstrated by atomically resolved images of calcite taken under liquid conditions.
authors.affiliation: Institut für Physikalische Chemie, Fachbereich Chemie, Johannes Gutenberg-Universität Mainz, Jakob-Welder-Weg 11, 55099 Mainz, Germany.
authors.forename: S
authors.initials: S
authors.lastname: Rode
authors.forename: R
authors.initials: R
authors.lastname: Stark
authors.forename: J
authors.initials: J
authors.lastname: Lübbe
authors.forename: L
authors.initials: L
authors.lastname: Tröger
authors.forename: J
authors.initials: J
authors.lastname: Schütte
authors.forename: K
authors.initials: K
authors.lastname: Umeda
authors.forename: K
authors.initials: K
authors.lastname: Kobayashi
authors.forename: H
authors.initials: H
authors.lastname: Yamada
authors.forename: A
authors.initials: A
authors.lastname: Kühnle