title: Fast localized wavefront correction using area-mapped phase-shift interferometry.
abstract: We propose an innovative method for localized wavefront correction based on area-mapped phase-shift (AMPS) interferometry. In this Letter, we present the theory and then experimentally compare it with a previously demonstrated method based on spot-optimized phase-stepping (SOPS) interferometry. We found that AMPS outperforms SOPS interferometry in terms of speed by threefold, although in noisy environments the improvements may be larger. AMPS yielded similar point-spread functions (PSF) as SOPS for moderate system-induced aberrations, but yielded a slightly less ideal PSF for larger aberrations. The method described in this Letter may prove crucial for applications where the phase-stepping solution does not have sufficient speed.
authors.affiliation: Department of Biomedical Engineering & Laboratory for Optical and Computational Instrumentation, University of Wisconsin - Madison, 1675 Observatory Drive, Madison, Wisconsin 53706, USA.
authors.forename: Gunnsteinn
authors.initials: G
authors.lastname: Hall
authors.forename: Gabriel C
authors.initials: GC
authors.lastname: Spalding
authors.forename: Paul J
authors.initials: PJ
authors.lastname: Campagnola
authors.forename: John G
authors.initials: JG
authors.lastname: White
authors.forename: Kevin W
authors.initials: KW
authors.lastname: Eliceiri
mesh_terms: D016477:Artifacts; D007368:Interferometry / Q000295:instrumentation*; D055620:Optical Phenomena; D013997:Time Factors