title: Modelling and analysis of autonomous micro-cantilever oscillations.
abstract: Tapping mode atomic force microscopy provides good resolution in imaging applications, but it still requires a time-consuming initial configuration and features quite low scanning velocity. In this paper we present a new dynamic mode in which the cantilever gets excited by a feedback loop containing a saturation function. The proposed scheme is then analysed in the frequency domain and simulated against the standard set-up, showing good performance and elimination of some of the known drawbacks. Preliminary results in experiments confirm the effectiveness of this operating mode.
authors.affiliation: Dipartimento di Sistemi e Informatica, Università di Firenze, via Santa Marta 3, I-50139, Firenze, Italy. CSDC, Via Sansone 1, I-50019, Sesto Fiorentino, Firenze, Italy.
authors.forename: M
authors.initials: M
authors.lastname: Basso
authors.forename: P
authors.initials: P
authors.lastname: Paoletti
authors.forename: B
authors.initials: B
authors.lastname: Tiribilli
authors.forename: M
authors.initials: M
authors.lastname: Vassalli