title: Quantitative in situ TEM tensile testing of an individual nickel nanowire.
abstract: In this paper, we have demonstrated the usage of a novel micro-mechanical device (MMD) to perform quantitative in situ tensile tests on individual metallic nanowires inside a transmission electron microscope (TEM). Our preliminary experiment on a 360 nm diameter nickel nanowire showed that the sample fractured at an engineering stress of ∼ 1.2 GPa and an engineering strain of ∼ 4%, which is consistent with earlier experiments performed inside a scanning electron microscope (SEM). With in situ high resolution TEM imaging and diffraction capabilities, this novel experimental set-up could provide unique opportunities to reveal the underlying deformation and damage mechanisms for metals at the nanoscale.
authors.affiliation: Department of Mechanical Engineering and Materials Science, Rice University, Houston, TX 77005, USA.
authors.forename: Yang
authors.initials: Y
authors.lastname: Lu
authors.forename: Cheng
authors.initials: C
authors.lastname: Peng
authors.forename: Yogeeswaran
authors.initials: Y
authors.lastname: Ganesan
authors.forename: Jian Yu
authors.initials: JY
authors.lastname: Huang
authors.forename: Jun
authors.initials: J
authors.lastname: Lou