title: Imaging scarred states in quantum dots.
abstract: We have used the scanning gate microscopy technique to image scar structures in an open quantum dot, fabricated in an InAs quantum well and defined by electron beam lithography. These are shown to have a periodicity in magnetic field that correlates with that found in the conductance fluctuations. Simulations have shown that these magnetic transform images bear a strong resemblance to actual scars found in the dots.
authors.affiliation: Department of Electrical Engineering and Center for Solid State Electronics Research, Arizona State University, Tempe, AZ 85287-5706, USA.
authors.forename: A M
authors.initials: AM
authors.lastname: Burke
authors.forename: R
authors.initials: R
authors.lastname: Akis
authors.forename: T
authors.initials: T
authors.lastname: Day
authors.forename: G
authors.initials: G
authors.lastname: Speyer
authors.forename: D K
authors.initials: DK
authors.lastname: Ferry
authors.forename: B R
authors.initials: BR
authors.lastname: Bennett