title: Electron microscopy at a sub-50 pm resolution.
abstract: An aberration-corrected electron microscope developed in CREST project has been applied for imaging atoms and clusters buried inside crystals. The resolution of the microscope in scanning transmission electron microscopy (STEM) has experimentally proved to be better than 47 pm by use of a cold-field emission gun at 300 kV. The high resolution has given an advantage for imaging light elements such as lithium atoms discriminating one by one. Moreover, a three-dimensional structure imaging has been demonstrated for dopant clusters by a sub-50 pm STEM, using its high depth resolution.
authors.affiliation: Physics Department, Tokyo Institute of Technology, Japan. takayang@phys.titech.ac.jp
authors.forename: K
authors.initials: K
authors.lastname: Takayanagi
authors.forename: S
authors.initials: S
authors.lastname: Kim
authors.forename: S
authors.initials: S
authors.lastname: Lee
authors.forename: Y
authors.initials: Y
authors.lastname: Oshima
authors.forename: T
authors.initials: T
authors.lastname: Tanaka
authors.forename: Y
authors.initials: Y
authors.lastname: Tanishiro
authors.forename: H
authors.initials: H
authors.lastname: Sawada
authors.forename: F
authors.initials: F
authors.lastname: Hosokawa
authors.forename: T
authors.initials: T
authors.lastname: Tomita
authors.forename: T
authors.initials: T
authors.lastname: Kaneyama
authors.forename: Y
authors.initials: Y
authors.lastname: Kondo