title: Structural comparison of n-type and p-type LaAlO3/SrTiO3 interfaces.
abstract: Using a surface x-ray diffraction technique, we investigated the atomic structure of two types of interfaces between LaAlO3 and SrTiO3, that is, p-type (SrO/AlO2) and n-type (TiO2/LaO) interfaces. Our results demonstrate that the SrTiO3 in the sample with the n-type interface has a large polarized region, while that with the p-type interface has a limited polarized region. In addition, atomic intermixing was observed to extend deeper into the SrTiO3 substrate at the n-type interface compared to the p type. These differences result in distinct degrees of band bending, which likely contributes to the striking contrast in electrical conductivity between the two types of interfaces.
authors.affiliation: Division of Materials Physics, Graduate School of Engineering Science, Osaka University, Toyonaka 560-8531, Japan.
authors.forename: Ryosuke
authors.initials: R
authors.lastname: Yamamoto
authors.forename: Christopher
authors.initials: C
authors.lastname: Bell
authors.forename: Yasuyuki
authors.initials: Y
authors.lastname: Hikita
authors.forename: Harold Y
authors.initials: HY
authors.lastname: Hwang
authors.forename: Hiroyuki
authors.initials: H
authors.lastname: Nakamura
authors.forename: Tsuyoshi
authors.initials: T
authors.lastname: Kimura
authors.forename: Yusuke
authors.initials: Y
authors.lastname: Wakabayashi