title: New views of materials through aberration-corrected scanning transmission electron microscopy.
abstract: The successful correction of third-order and, more recently, fifth-order aberrations has enormously enhanced the capabilities of the scanning transmission electron microscope (STEM), by not only achieving record resolution, but also allowing near 100% efficiency for electron energy loss spectroscopy, and higher currents for two-dimensional spectrum imaging. These advances have meant that the intrinsic advantages of the STEM, incoherent imaging and simultaneous collection of multiple complementary images can now give new insights into many areas of materials physics. Here, we review a number of examples, mostly from the field of complex oxides, and look towards new directions for the future.
authors.affiliation: Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge, TN 37830-6071, USA. pennycooksj@ornl.gov
authors.forename: S J
authors.initials: SJ
authors.lastname: Pennycook
authors.forename: M
authors.initials: M
authors.lastname: Varela