title: An atomic resolution scanning tunneling microscope that applies external tensile stress and strain in an ultrahigh vacuum.
abstract: We have developed an ultrahigh vacuum scanning tunneling microscope with an in situ external stress application capability in order to determine the effects of stress and strain on surface atomistic structures. It is necessary to understand these effects because controlling them will be a key technology that will very likely be used in future nanometer-scale fabrication processes. We used our microscope to demonstrate atomic resolution imaging under external tensile stress and strain on the surfaces of wafers of Si(111) and Si(001). We also successfully observed domain redistribution induced by applying uniaxial stress at an elevated temperature on the surface of a wafer of vicinal Si(100). We confirmed that domains for which an applied tensile stress is directed along the dimer bond become less stable and shrink. This suggests that it may be feasible to fabricate single domain surfaces in a process that controls surface stress and strain.
authors.affiliation: Advanced Nano Characterization Center, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan.
authors.forename: D
authors.initials: D
authors.lastname: Fujita
authors.forename: M
authors.initials: M
authors.lastname: Kitahara
authors.forename: K
authors.initials: K
authors.lastname: Onishi
authors.forename: K
authors.initials: K
authors.lastname: Sagisaka