title: Charge circuit timeout: a sequence of events leading to failure of an implantable cardioverter-defibrillator to deliver therapy.
authors.affiliation: Long Island Jewish Medical Center, New York, NY, USA. jncatanzaro@yahoo.com
authors.forename: John N
authors.initials: JN
authors.lastname: Catanzaro
authors.forename: Joonhyuk
authors.initials: J
authors.lastname: Kim
authors.forename: Apoor
authors.initials: A
authors.lastname: Patel
authors.forename: David
authors.initials: D
authors.lastname: Slotwiner
authors.forename: Bruce
authors.initials: B
authors.lastname: Goldner
mesh_terms: D000368:Aged; D000465:Algorithms; D001281:Atrial Fibrillation / Q000150:complications / Q000209:etiology; D016757:Death, Sudden, Cardiac / Q000517:prevention & control*; D017147:Defibrillators, Implantable; D004562:Electrocardiography; D004868:Equipment Failure; D005260:Female; D006333:Heart Failure / Q000175:diagnosis* / Q000209:etiology; D006801:Humans; D012984:Software; D014481:United States; D014486:United States Food and Drug Administration