title: Conduction mechanisms and environmental sensitivity of solution-processed silicon nanoparticle layers for thin-film transistors.
authors.affiliation: University of Erlangen-Nuremberg, Cauerstrasse 6, Erlangen, Germany.
authors.forename: Sebastian
authors.initials: S
authors.lastname: Weis
authors.forename: Richard
authors.initials: R
authors.lastname: Körmer
authors.forename: Michael P M
authors.initials: MP
authors.lastname: Jank
authors.forename: Martin
authors.initials: M
authors.lastname: Lemberger
authors.forename: Michael
authors.initials: M
authors.lastname: Otto
authors.forename: Heiner
authors.initials: H
authors.lastname: Ryssel
authors.forename: Wolfgang
authors.initials: W
authors.lastname: Peukert
authors.forename: Lothar
authors.initials: L
authors.lastname: Frey
mesh_terms: D008855:Microscopy, Electron, Scanning; D053758:Nanoparticles / Q000737:chemistry* / Q000648:ultrastructure; D036103:Nanotechnology / Q000379:methods*; D012825:Silicon / Q000737:chemistry*; D014173:Transistors, Electronic
chemical_list: D012825:Silicon