title: Measuring Si-C60 chemical forces via single molecule spectroscopy.
abstract: We measure the short-range chemical force between a silicon-terminated tip and individual adsorbed C(60) molecules using frequency modulation atomic force microscopy. The interaction with an adsorbed fullerene is sufficiently strong to drive significant atomic rearrangement of tip structures.
authors.affiliation: School of Physics and Astronomy, University of Nottingham, Nottingham NG7 2RD, UK.
authors.forename: Cristina
authors.initials: C
authors.lastname: Chiutu
authors.forename: Andrew
authors.initials: A
authors.lastname: Stannard
authors.forename: Adam M
authors.initials: AM
authors.lastname: Sweetman
authors.forename: Philip
authors.initials: P
authors.lastname: Moriarty