title: Statistical pattern classification with binary variables.
abstract: Binary random variables are regarded as random vectors in a binary-field (modulo-2) linear vector space. A characteristic function is defined and related results derived using this formulation. Minimax estimation of probability distributions using an entropy criterion is investigated, which leads to an A-distribution and bilinear discriminant functions. Nonparametric classification approaches using Hamming distances and their asymptotic properties are discussed. Experimental results are presented.
authors.affiliation: SENIOR MEMBER, IEEE, Department of Electrical Engineering, University of Miami, Coral Gables, FL 33124.
authors.forename: T Y
authors.initials: TY
authors.lastname: Young
authors.forename: P S
authors.initials: PS
authors.lastname: Liu
authors.forename: R J
authors.initials: RJ
authors.lastname: Rondon