title: Shape-independent lateral force calibration.
abstract: Current methods for lateral force calibration are often time-consuming, expensive, or cause significant wear of the tip. A quick and simple alternative is presented in which the linear relationship between force and voltage is exploited. The technique is independent of the shapes of the sample and cantilever and eliminates common problems, while maintaining better than 10% precision. This advance will facilitate quantitative comparisons between experiments.
authors.affiliation: Physics Department, Worcester Polytechnic Institute, 100 Institute Road, Worcester, Massachussetts 01609, United States.
authors.forename: Evan V
authors.initials: EV
authors.lastname: Anderson
authors.forename: Saonti
authors.initials: S
authors.lastname: Chakraborty
authors.forename: Taylor
authors.initials: T
authors.lastname: Esformes
authors.forename: Derek
authors.initials: D
authors.lastname: Eggiman
authors.forename: Colin
authors.initials: C
authors.lastname: Degraf
authors.forename: Keeley M
authors.initials: KM
authors.lastname: Stevens
authors.forename: Deli
authors.initials: D
authors.lastname: Liu
authors.forename: Nancy A
authors.initials: NA
authors.lastname: Burnham
mesh_terms: D002138:Calibration; D018625:Microscopy, Atomic Force / Q000379:methods* / Q000592:standards; D036103:Nanotechnology / Q000379:methods / Q000592:standards