title: Direct probing of nanodimensioned oxide multilayers with the aid of focused ion beam milling.
authors: Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA. ykuru@mit.edu
authors: Yener
authors: Y
authors: Kuru
authors: Helia
authors: H
authors: Jalili
authors: Zhuhua
authors: Z
authors: Cai
authors: Bilge
authors: B
authors: Yildiz
authors: Harry L
authors: HL
authors: Tuller
mesh_terms: D007477:Ions / Q000737:chemistry; D058085:Iron Compounds / Q000737:chemistry*; D007811:Lanthanum / Q000737:chemistry*; D018625:Microscopy, Atomic Force; D020527:Microscopy, Scanning Probe; D010087:Oxides / Q000737:chemistry*; D013324:Strontium / Q000737:chemistry*; D014025:Titanium / Q000737:chemistry*
chemical_list: D007477:Ions; D058085:Iron Compounds; D010087:Oxides; D007811:Lanthanum; D014025:Titanium; D013324:Strontium