title: Note: Vector reflectometry in a beam waveguide.
abstract: We present a one-port calibration technique for characterization of beam waveguide components with a vector network analyzer. This technique involves using a set of known delays to separate the responses of the instrument and the device under test. We demonstrate this technique by measuring the reflected performance of a millimeter-wave variable-delay polarization modulator.
authors: Department of Physics and Astronomy, The Johns Hopkins University, Baltimore, Maryland 21218, USA. eimer@pha.jhu.edu
authors: J R
authors: JR
authors: Eimer
authors: C L
authors: CL
authors: Bennett
authors: D T
authors: DT
authors: Chuss
authors: E J
authors: EJ
authors: Wollack