title: High resolution extreme ultraviolet spectrometer for an electron beam ion trap.
abstract: An extreme ultraviolet spectrometer has been developed for spectroscopic studies of highly charged ions with an electron beam ion trap. It has a slit-less configuration with a spherical varied-line-spacing grating that provides a flat focal plane for grazing incidence light. Alternative use of two different gratings enables us to cover the wavelength range 1-25 nm. Test observations with the Tokyo electron beam ion trap demonstrate the high performance of the present spectrometer such as a resolving power of above 1000.
authors: Institute for Laser Science, The University of Electro-Communications, Chofu, Tokyo, Japan. h_ohashi@ils.uec.ac.jp
authors: Hayato
authors: H
authors: Ohashi
authors: Junji
authors: J
authors: Yatsurugi
authors: Hiroyuki A
authors: HA
authors: Sakaue
authors: Nobuyuki
authors: N
authors: Nakamura