title: Direct determination of diffusion properties of random media from speckle contrast.
abstract: We present a simple scheme to determine the diffusion properties of a thin slab of strongly scattering material by measuring the speckle contrast resulting from the transmission of a femtosecond pulse with controlled bandwidth. In contrast with previous methods, our scheme does not require time measurements nor interferometry. It is well adapted to the characterization of samples for pulse shaping, nonlinear excitation through scattering media, and biological imaging.
authors: Institut Langevin, École Supérieure de Physique et de Chimie Industrielles de la ville de Paris (ESPCI Paris-Tech), CNRS UMR 7587, UPMC Université Paris 6, Paris, France.
authors: Nathan
authors: N
authors: Curry
authors: Pierre
authors: P
authors: Bondareff
authors: Mathieu
authors: M
authors: Leclercq
authors: Niek F
authors: NF
authors: van Hulst
authors: Riccardo
authors: R
authors: Sapienza
authors: Sylvain
authors: S
authors: Gigan
authors: Samuel
authors: S
authors: Grésillon