title: Systematic analyses of vibration noise of a vibration isolation system for high-resolution scanning tunneling microscopes.
abstract: We designed and constructed an effective vibration isolation system for stable scanning tunneling microscopy measurements using a separate foundation and two vibration isolation stages (i.e., a combination of passive and active vibration isolation dampers). Systematic analyses of vibration data along the horizontal and vertical directions are present, including the vibration transfer functions of each stage and the overall vibration isolation system. To demonstrate the performance of the system, tunneling current noise measurements are conducted with and without the vibration isolation. Combining passive and active vibration isolation dampers successfully removes most of the vibration noise in the tunneling current up to 100 Hz. These comprehensive vibration noise data, along with details of the entire system, can be used to establish a clear guideline for building an effective vibration isolation system for various scanning probe microscopes and electron microscopes.
authors: WPI-Advanced Institute for Materials Research, Tohoku University, Sendai, Japan. iwaya@wpi-aimr.tohoku.ac.jp
authors: Katsuya
authors: K
authors: Iwaya
authors: Ryota
authors: R
authors: Shimizu
authors: Tomihiro
authors: T
authors: Hashizume
authors: Taro
authors: T
authors: Hitosugi