title: Thickness determination of graphene on metal substrate by reflection spectroscopy.
abstract: We show that reflectivity measurements enable the determination of the thickness of multilayered graphene on a metal substrate. The developed technique is based on comparison of the substrate reflectance with and without graphene and relies on the strong absorbance of graphene and high refractive index contrast. We demonstrate the technique by measuring the thickness of the CVD graphene film grown on a copper substrate.
authors.affiliation: Department of Physics and Mathematics, University of Eastern Finland, Joensuu, Finland. tommi.kaplas@uef.fi
authors.forename: Tommi
authors.initials: T
authors.lastname: Kaplas
authors.forename: Aleksey
authors.initials: A
authors.lastname: Zolotukhin
authors.forename: Yuri
authors.initials: Y
authors.lastname: Svirko