title: Measurement of carrier envelope offset frequency for a 10 GHz etalon-stabilized semiconductor optical frequency comb.
abstract: We report Carrier Envelope Offset (CEO) frequency measurements of a 10 GHz harmonically mode-locked, Fabry-Perot etalon-stabilized, semiconductor optical frequency comb source. A modified multi-heterodyne mixing technique with a reference frequency comb was utilized for the measurement. Also, preliminary results from an attempt at f-2f self-referencing measurement are presented. The CEO frequency was found to be ~1.47 GHz for the particular etalon that was used.
authors.affiliation: CREOL: The College of Optics and Photonics, University of Central Florida, Orlando, FL 32816 USA.
authors.forename: M
authors.initials: M
authors.lastname: Akbulut
authors.forename: J
authors.initials: J
authors.lastname: Davila-Rodriguez
authors.forename: I
authors.initials: I
authors.lastname: Ozdur
authors.forename: F
authors.initials: F
authors.lastname: Quinlan
authors.forename: S
authors.initials: S
authors.lastname: Ozharar
authors.forename: N
authors.initials: N
authors.lastname: Hoghooghi
authors.forename: P J
authors.initials: PJ
authors.lastname: Delfyett