title: High precision measurements of atom column positions using model-based exit wave reconstruction.
abstract: In this paper, it has been investigated how to measure atom column positions as accurately and precisely as possible using a focal series of images. In theory, it is expected that the precision would considerably improve using a maximum likelihood estimator based on the full series of focal images. As such, the theoretical lower bound on the variances of the unknown atom column positions can be attained. However, this approach is numerically demanding. Therefore, maximum likelihood estimation has been compared with the results obtained by fitting a model to a reconstructed exit wave rather than to the full series of focal images. Hence, a real space model-based exit wave reconstruction technique based on the channelling theory is introduced. Simulations show that the reconstructed complex exit wave contains the same amount of information concerning the atom column positions as the full series of focal images. Only for thin samples, which act as weak phase objects, this information can be retrieved from the phase of the reconstructed complex exit wave.
authors.affiliation: Electron Microscopy for Materials Science (EMAT), University of Antwerp, Belgium. Annick.DeBacker@ua.ac.be
authors.forename: A
authors.initials: A
authors.lastname: De Backer
authors.forename: S
authors.initials: S
authors.lastname: Van Aert
authors.forename: D
authors.initials: D
authors.lastname: Van Dyck
mesh_terms: D003198:Computer Simulation; D007091:Image Processing, Computer-Assisted / Q000379:methods*; D016013:Likelihood Functions; D046529:Microscopy, Electron, Transmission / Q000706:statistics & numerical data*; D008962:Models, Theoretical