title: Full optical characterization of coherent x-ray nanobeams by ptychographic imaging.
abstract: Scanning coherent diffraction microscopy (ptychography) is an emerging hard x-ray microscopy technique that yields spatial resolutions well below the lateral size of the probing nanobeam. Besides a high resolution image of the object, the complex wave field of the probe can be reconstructed at the position of the object. By verifying the consistency of several independent wave field measurements along the optical axis, we address the question of how well the reconstruction represents the nanobeam. With a single ptychogram the wave field can be properly determined over a large range along the optical axis, also at positions inaccessible otherwise.
authors.affiliation: Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany.
authors.forename: Susanne
authors.initials: S
authors.lastname: Hönig
authors.forename: Robert
authors.initials: R
authors.lastname: Hoppe
authors.forename: Jens
authors.initials: J
authors.lastname: Patommel
authors.forename: Andreas
authors.initials: A
authors.lastname: Schropp
authors.forename: Sandra
authors.initials: S
authors.lastname: Stephan
authors.forename: Sebastian
authors.initials: S
authors.lastname: Schöder
authors.forename: Manfred
authors.initials: M
authors.lastname: Burghammer
authors.forename: Christian G
authors.initials: CG
authors.lastname: Schroer