title: Mueller matrix measurements of algae with different shape and size distributions.
abstract: The full Mueller matrix was measured to obtain the polarization state of the scattered light for a variety of algae with different shapes, wall compositions, sizes, and refractive indices. The experimental setup was a multiple laser Mueller matrix ellipsometer, by which measurements were performed for scattering angles from 16° to 160° sampled at every second degree for wavelengths of 473 nm and 532 nm. Previously, the polarization of light scattered from microalgae was investigated only for a few species, and the Mueller matrix was found to have little variation between the species. In our work a total of 11 algal species were investigated, representing diatoms, dinoflagellates, coccolithophorids, green algae, and a cryptophyte. The selection of species was made to obtain high variability in shape, size, cell wall, and refractive index. As in previous investigations, very small variations were found between species for most of the Mueller matrix elements, but noticeable variations were found for M(11), (M(12)+M(21))/2 and (M(33)+M(44))/2.
authors.affiliation: Department of Physics and Technology, University of Bergen, Bergen, Norway. oyvind.svensen@ift.uib.no
authors.forename: Øyvind
authors.initials: Ø
authors.lastname: Svensen
authors.forename: Jakob J
authors.initials: JJ
authors.lastname: Stamnes
authors.forename: Morten
authors.initials: M
authors.lastname: Kildemo
authors.forename: Lars Martin Sandvik
authors.initials: LM
authors.lastname: Aas
authors.forename: Svein Rune
authors.initials: SR
authors.lastname: Erga
authors.forename: Øyvind
authors.initials: Ø
authors.lastname: Frette
mesh_terms: D000465:Algorithms; D002473:Cell Wall / Q000145:classification; D002696:Chlamydomonas / Q000166:cytology; D017377:Diatoms / Q000145:classification / Q000166:cytology; D004141:Dinoflagellida / Q000166:cytology; D058087:Haptophyta / Q000166:cytology; D007090:Image Interpretation, Computer-Assisted / Q000379:methods; D008027:Light; D008859:Microscopy, Polarization / Q000379:methods*; D012031:Refractometry / Q000295:instrumentation / Q000379:methods; D012542:Scattering, Radiation