title: The current image of single SnO2 nanobelt nanodevice studied by conductive atomic force microscopy.
abstract: A single SnO2 nanobelt was assembled on a pair of Au electrodes by electric-field assembly method. The electronic transport property of single SnO2 nanobelt was studied by conductive atomic force microscopy (C-AFM). Back-to-back Schottky barrier-type junctions were created between AFM tip/SnO2 nanobelt/Au electrode which can be concluded from the I-V curve. The current images of single SnO2 nanobelt nanodevices were also studied by C-AFM techniques, which showed stripes patterns on the nanobelt surface. The current images of the nanobelt devices correlate the microscopy with separate transport properties measurement together.
authors.affiliation: Key Laboratory for Special Functional Materials, Henan University, Kaifeng 475004, People's Republic of China. zld@henu.edu.cn.
authors.forename: Shujie
authors.initials: S
authors.lastname: Wang
authors.forename: Gang
authors.initials: G
authors.lastname: Cheng
authors.forename: Ke
authors.initials: K
authors.lastname: Cheng
authors.forename: Xiaohong
authors.initials: X
authors.lastname: Jiang
authors.forename: Zuliang
authors.initials: Z
authors.lastname: Du