title: Field-of-view analysis of a polarization interference Fourier transform imaging spectrometer.
abstract: The Fourier transform imaging spectrometer (FTIS) is an important tool for the measurement of spectral information in a scene. Advances in electro-optic crystal systems have led to the advent of the FTIS based on polarization interference filters. The operation of these devices as spectrometers has been well characterized, but the imaging capabilities have yet to be thoroughly explored. We explore the field-of-view limitations that occur when using this particular type of FTIS.
authors.affiliation: Physical Optics Corporation, Torrance, California 90501, USA. edehoog@poc.com
authors.forename: Edward
authors.initials: E
authors.lastname: DeHoog
authors.forename: Xiaowei
authors.initials: X
authors.lastname: Xia
authors.forename: Alexander
authors.initials: A
authors.lastname: Parfenov
authors.forename: Min-Yi
authors.initials: MY
authors.lastname: Shih
mesh_terms: D000465:Algorithms; D003198:Computer Simulation; D004867:Equipment Design; D005583:Fourier Analysis; D007368:Interferometry; D013057:Spectrum Analysis / Q000379:methods*