title: X-ray optics simulation using Gaussian superposition technique.
abstract: We present an efficient method to perform x-ray optics simulation with high or partially coherent x-ray sources using Gaussian superposition technique. In a previous paper, we have demonstrated that full characterization of optical systems, diffractive and geometric, is possible by using the Fresnel Gaussian Shape Invariant (FGSI) previously reported in the literature. The complex amplitude distribution in the object plane is represented by a linear superposition of complex Gaussians wavelets and then propagated through the optical system by means of the referred Gaussian invariant. This allows ray tracing through the optical system and at the same time allows calculating with high precision the complex wave-amplitude distribution at any plane of observation. This technique can be applied in a wide spectral range where the Fresnel diffraction integral applies including visible, x-rays, acoustic waves, etc. We describe the technique and include some computer simulations as illustrative examples for x-ray optical component. We show also that this method can be used to study partial or total coherence illumination problem.
authors: Brookhaven National Laboratory – NSLS II 50 Rutherford Dr. Upton, New York 11973-5000, USA. midir@bnl.gov
authors: Mourad
authors: M
authors: Idir
authors: Moisés
authors: M
authors: Cywiak
authors: Arquímedes
authors: A
authors: Morales
authors: Mohammed H
authors: MH
authors: Modi
mesh_terms: D000465:Algorithms; D003198:Computer Simulation; D008027:Light; D016011:Normal Distribution; D055095:Optics and Photonics; D015203:Reproducibility of Results; D012542:Scattering, Radiation; D014965:X-Rays