title: Characterization of an x-ray phase contrast imaging system based on the miniature synchrotron MIRRORCLE-6X.
abstract: OBJECTIVE
  The implementation of in-line x-ray phase contrast imaging (PCI) for soft-tissue patient imaging is hampered by the lack of a bright and spatially coherent x-ray source that fits into the hospital environment. This article provides a quantitative characterization of the phase-contrast enhancement of a PCI system based on the miniature synchrotron technology MIRRORCLE-6X.
  
  
  METHODS
  The phase-contrast effect was measured using an edge response of a plexiglass plate as a function of the incident angle of radiation. We have developed a comprehensive x-ray propagation model based on the system's components, properties, and geometry in order to interpret the measurement data. Monte-Carlo simulations are used to estimate the system's spectral properties and resolution.
  
  
  RESULTS
  The measured ratio of the detected phase-contrast to the absorption contrast is currently in the range 100% to 200%. Experiments show that with the current implementation of the MIRRORCLE-6X, a target smaller than 30-40 μm does not lead to a larger phase-contrast. The reason for this is that the fraction of x-rays produced by the material (carbon filament and glue) that is used for mounting the target in the electron beam is more than 25% of the total amount of x-rays produced. This increases the apparent source size. The measured phase-contrast is at maximum two times larger than the absorption contrast with the current set-up.
  
  
  CONCLUSIONS
  Calculations based on our model of the present imaging system predict that the phase-contrast can be up to an order of magnitude larger than the absorption contrast in case the materials used for mounting the target in the electron beam do not (or hardly) produce x-rays. The methods described in this paper provide vital feedback for guiding future modifications to the design of the x-ray target of MIRRORCLE-type system and configuration of the in-line PCI systems in general.
authors: Department of Imaging Science and Technology, Delft University of Technology, Delft, The Netherlands.
authors: Joop
authors: J
authors: van Heekeren
authors: Alexander
authors: A
authors: Kostenko
authors: Takayasu
authors: T
authors: Hanashima
authors: Hironari
authors: H
authors: Yamada
authors: Sjoerd
authors: S
authors: Stallinga
authors: S Erik
authors: SE
authors: Offerman
authors: Lucas J
authors: LJ
authors: van Vliet
mesh_terms: D004583:Electrons; D007091:Image Processing, Computer-Assisted; D008904:Miniaturization / Q000295:instrumentation*; D017356:Synchrotrons; D014057:Tomography, X-Ray Computed / Q000295:instrumentation*