title: Twin-electron biprism.
abstract: In order to obtain a large deflection angle without increasing the applied voltage to an electron biprism, we have developed a 'twin-electron biprism' (TBP), which is composed of two filament electrodes and a pair of ground plates. The observed interference-fringe spacing revealed that the deflection angle created by a TBP was about twice larger than that by a 'conventional electron biprism'. Also, we have suggested, in a double-electron biprism interferometry, the optimal disposition of a TBP for reducing the intensity of Fresnel fringes recorded in an electron hologram.
authors: Central Research Laboratory, Hitachi Ltd, Akanuma, Hatoyama, Hiki, Saitama 350-0395, Japan. masaki.ikeda.jf@hitachi.com
authors: M
authors: M
authors: Ikeda
authors: A
authors: A
authors: Sugawara
authors: K
authors: K
authors: Harada
mesh_terms: D004583:Electrons; D006696:Holography / Q000379:methods*; D007368:Interferometry / Q000379:methods*; D046529:Microscopy, Electron, Transmission / Q000295:instrumentation* / Q000379:methods; D008857:Microscopy, Interference / Q000379:methods