title: The role of the cantilever in Kelvin probe force microscopy measurements.
abstract: The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever. The calculations show that the cantilever has a very strong effect on the absolute value of the measured contact potential difference even under ultra-high vacuum conditions, and we demonstrate a good agreement between our model and KPFM measurements in ultra-high vacuum of NaCl monolayers grown on Cu(111). The effect of the oscillating cantilever shape on the KPFM resolution and sensitivity has been calculated and found to be relatively small.
authors: School of Electrical Engineering, Faculty of Engineering, Tel-Aviv University, Ramat-Aviv 69978, Israel.
authors: George
authors: G
authors: Elias
authors: Thilo
authors: T
authors: Glatzel
authors: Ernst
authors: E
authors: Meyer
authors: Alex
authors: A
authors: Schwarzman
authors: Amir
authors: A
authors: Boag
authors: Yossi
authors: Y
authors: Rosenwaks