title: Development of a soft X-ray angle-resolved photoemission system applicable to 100 µm crystals.
abstract: A system for angle-resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 µm has been developed. Soft X-ray synchrotron radiation with a spot size of ∼40 µm × 65 µm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 µm × 100 µm × 80 µm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleaved in situ with a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the Γ-X direction reflecting the bulk electronic states were observed with a photon energy of 879 eV.
authors: Japan Synchrotron Radiation Research Institute (JASRI), 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan. muro@spring8.or.jp
authors: Takayuki
authors: T
authors: Muro
authors: Yukako
authors: Y
authors: Kato
authors: Tomohiro
authors: T
authors: Matsushita
authors: Toyohiko
authors: T
authors: Kinoshita
authors: Yoshio
authors: Y
authors: Watanabe
authors: Hiroyuki
authors: H
authors: Okazaki
authors: Takayoshi
authors: T
authors: Yokoya
authors: Akira
authors: A
authors: Sekiyama
authors: Shigemasa
authors: S
authors: Suga