title: Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II.
abstract: Characterization and testing of an L-shaped laterally graded multilayer mirror are presented. This mirror is designed as a two-dimensional collimating optics for the analyzer system of the ultra-high-resolution inelastic X-ray scattering (IXS) spectrometer at National Synchrotron Light Source II (NSLS-II). The characterization includes point-to-point reflectivity measurements, lattice parameter determination and mirror metrology (figure, slope error and roughness). The synchrotron X-ray test of the mirror was carried out reversely as a focusing device. The results show that the L-shaped laterally graded multilayer mirror is suitable to be used, with high efficiency, for the analyzer system of the IXS spectrometer at NSLS-II.
authors: National Synchrotron Light Source II, Brookhaven National Laboratory, USA.
authors: Marcelo G
authors: MG
authors: Honnicke
authors: Jeffrey W
authors: JW
authors: Keister
authors: Raymond
authors: R
authors: Conley
authors: Konstantine
authors: K
authors: Kaznatcheev
authors: Peter Z
authors: PZ
authors: Takacs
authors: David Scott
authors: DS
authors: Coburn
authors: Leo
authors: L
authors: Reffi
authors: Yong Q
authors: YQ
authors: Cai