title: Scanning noise microscopy on graphene devices.
abstract: We developed a scanning noise microscopy (SNM) method and demonstrated the nanoscale noise analysis of a graphene strip-based device. Here, a Pt tip made a direct contact on the surface of a nanodevice to measure the current noise spectrum through it. Then, the measured noise spectrum was analyzed by an empirical model to extract the noise characteristics only from the device channel. As a proof of concept, we demonstrated the scaling behavior analysis of the noise in graphene strips. Furthermore, we performed the nanoscale noise mapping on a graphene channel, allowing us to study the effect of structural defects on the noise of the graphene channel. The SNM method is a powerful tool for nanoscale noise analysis and should play a significant role in basic research on nanoscale devices.
authors: Department of Physics and Astronomy,Seoul National University, Seoul 151-747, Korea.
authors: Moon Gyu
authors: MG
authors: Sung
authors: Hyungwoo
authors: H
authors: Lee
authors: Kwang
authors: K
authors: Heo
authors: Kyung-Eun
authors: KE
authors: Byun
authors: Taekyeong
authors: T
authors: Kim
authors: David H
authors: DH
authors: Seo
authors: Sunae
authors: S
authors: Seo
authors: Seunghun
authors: S
authors: Hong
mesh_terms: D006108:Graphite; D008853:Microscopy / Q000379:methods*; D036103:Nanotechnology / Q000295:instrumentation*
chemical_list: D006108:Graphite