Diffractive light trapping in crystal-silicon films: experiment and electromagnetic modeling.
Diffractive light trapping in 1.5 μm thick crystal silicon films is studied experimentally through hemispherical reflection measurements and theoretically through rigorous coupled-wave analysis modeling. The gratings were fabricated by nanoimprinting of dielectric precursor films. The model data, which match the experimental results well without the use of any fitting parameters, are used to extract the light trapping efficiency. Diffractive light trapping is studied as a function of incidence angle, and an enhancement of light absorption is found for incidence angles up to 50° for both TE and TM polarizations.
Washington Technology Center and University of Washington, Department of Electrical Engineering, Seattle, Washington 98195, USA. dnweiss@uw.edu
Dirk N
DN
Weiss
Benjamin G
BG
Lee
Dustin A
DA
Richmond
William
W
Nemeth
Qi
Q
Wang
Douglas A
DA
Keszler
Howard M
HM
Branz