Beam position stabilization for a confocal multiphoton microscope.
The influence of beam-pointing on scanning confocal microscopy is investigated. The beam displacement is measured using a quadrant photodiode, and the apparent movement of a sub-micron-sized particle observed by second-harmonic microscopy is linked to the beam displacement. A simple beam-pointing stabilization is implemented, and improvement of beam stability by three orders of magnitude on long time scales is achieved.
Institute of Applied Physics, University of Münster, Münster, Germany. p.gross@uni‐muenster.de
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Gross
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Kleinschmidt
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Beer
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Fallnich