Beyond the lateral resolution limit by phase imaging.
We present a theory to extend the classical Abbe resolution limit by introducing a spatially varying phase into the illumination beam of a phase imaging system. It allows measuring lateral and axial distance differences between point sources to a higher accuracy than intensity imaging alone. Various proposals for experimental realization are debated. Concretely, the phase of point scatterers' interference is experimentally visualized by high numerical aperture (NA = 0.93) digital holographic microscopy combined with angular scanning. Proof-of-principle measurements are presented by using sub-wavelength nanometric holes on an opaque metallic film. In this manner, Rayleighs classical two-point resolution condition can be rebuilt. With different illumination phases, enhanced bandpass information content is demonstrated, and its spatial resolution is theoretically shown to be potentially signal-to-noise ratio limited.
Ecole Polytechnique Fédérale de Lausanne (EPFL), Microvision and Microdiagnostics Group (MVD), Lausanne, 1015, Switzerland. yann.cotte@a3.epfl.ch
Yann
Y
Cotte
M Fatih
MF
Toy
Christian
C
Depeursinge
D006696:Holography / Q000379:methods / Q000706:statistics & numerical data; D008855:Microscopy, Electron, Scanning / Q000379:methods / Q000706:statistics & numerical data; D008857:Microscopy, Interference / Q000379:methods* / Q000706:statistics & numerical data; D008858:Microscopy, Phase-Contrast / Q000379:methods / Q000706:statistics & numerical data; D008962:Models, Theoretical; D049329:Nanostructures / Q000648:ultrastructure; D055620:Optical Phenomena; D012542:Scattering, Radiation; D059629:Signal-To-Noise Ratio