title: Doping of a dielectric layer as a new alternative for increasing sensitivity of the contactless conductivity detection in microchips.
abstract: This communication describes a new procedure to increase the sensitivity of C(4)D in PDMS/glass microchips. The method consists in doping the insulating layer (PDMS) over the electrodes with nanoparticles of TiO(2), increasing thus its dielectric constant. The experimental protocol is simple, inexpensive, and fast.
authors: Instituto de Química de São Carlos, Universidade de São Paulo, São Carlos, Brazil.
authors: Renato Sousa
authors: RS
authors: Lima
authors: Thiago Pinotti
authors: TP
authors: Segato
authors: Angelo Luiz
authors: AL
authors: Gobbi
authors: Wendell Karlos Tomazelli
authors: WK
authors: Coltro
authors: Emanuel
authors: E
authors: Carrilho
mesh_terms: D004129:Dimethylpolysiloxanes / Q000737:chemistry; D004553:Electric Conductivity; D004566:Electrodes; D056656:Lab-On-A-Chip Devices; D053768:Metal Nanoparticles / Q000737:chemistry; D014025:Titanium / Q000737:chemistry
chemical_list: D004129:Dimethylpolysiloxanes; C009495:titanium dioxide; C013830:baysilon; D014025:Titanium