title: Viscoelastic property mapping with contact resonance force microscopy.
abstract: We demonstrate the accurate nanoscale mapping of near-surface loss and storage moduli on a polystyrene-polypropylene blend with contact resonance force microscopy (CR-FM). These viscoelastic properties are extracted from spatially resolved maps of the contact resonance frequency and quality factor of the AFM cantilever. We consider two methods of data acquisition: (i) discrete stepping between mapping points and (ii) continuous scanning. For point mapping and low-speed scanning, the values of the relative loss and storage modulus are in good agreement with the time-temperature superposition of low-frequency dynamic mechanical analysis measurements to the high frequencies probed by CR-FM.
authors: National Institute of Standards and Technology, Boulder, Colorado 80305, USA.
authors: J P
authors: JP
authors: Killgore
authors: D G
authors: DG
authors: Yablon
authors: A H
authors: AH
authors: Tsou
authors: A
authors: A
authors: Gannepalli
authors: P A
authors: PA
authors: Yuya
authors: J A
authors: JA
authors: Turner
authors: R
authors: R
authors: Proksch
authors: D C
authors: DC
authors: Hurley