title: Real-time ellipsometric characterization of the initial growth stage of poly(3,4-ethylene dioxythiophene): poly(styrene sulfonic acid) films by electrospray deposition.
abstract: Kinetic spectroscopic ellipsometry have been used to study the initial growth stage of poly(3,4-polyethylene dioxythiophene):poly(styrenesulfonic acid)(PEDOT:PSS) films by the electrospray deposition (ESD) method. The real-time spectra analysis revealed that the surface overlayer decreased in thickness once the first bulk layer monolayer was formed, indicating a smoothening effect as the nucleation-related microstructure coalesced into the bulk layer. Once the coalescence was completed and the nucleation-induced surface roughness layer was stabilized, the underlying bulk layer increased linearly with time. These results originate from the degrees of the evaporation of solvent material during the transferring the precursors to the surface and/or of the diffusion of deposition precursors after sticking at the growing surface.
authors.affiliation: Graduate School of Science and Engineering, Saitama University, 255 Shimo-Okubo, Sakura-ku, Saitama 338-8570, Japan.
authors.forename: Tomohisa
authors.initials: T
authors.lastname: Ino
authors.forename: Takashi
authors.initials: T
authors.lastname: Asano
authors.forename: Takeshi
authors.initials: T
authors.lastname: Fukuda
authors.forename: Keiji
authors.initials: K
authors.lastname: Ueno
authors.forename: Hajime
authors.initials: H
authors.lastname: Shirai