title: Six common errors cause dangerous mistakes in interpretation of electron micrographs.
abstract: The highly complex techniques of electron microscopy made it bound to the sensitive and critical micrograph analysis. The accurately interpreted micrographs are of paramount values in basic investigations. Interpretation skills and quality of the micrographs are the two fundamental keys in accomplishment of these goals but there are many mistakes and errors that can happen during the sample preparation, sectioning, EM operation, and photo publishing. The mentioned mistakes and errors effect directly in the final result which is a micrograph and can lead the analyzer who can be a pathologist to an interpretation followed by serious danger for patient. Artifacts caused by any given stimuli expected to be bothersome for investigators. Even best qualified equipments can be regarded as source of artifact generation. In this article, seven serious errors in electron micrographs which usually occur in transmission electron microscopy are addressed.
authors.affiliation: Nanotechnology Consultancy and Development Center, Italy.
authors.forename: Iman
authors.initials: I
authors.lastname: Moradi
authors.forename: Mohaddeseh
authors.initials: M
authors.lastname: Behjati
mesh_terms: D016477:Artifacts; D035843:Biomedical Research / Q000379:methods; D046529:Microscopy, Electron, Transmission / Q000379:methods*; D010336:Pathology / Q000379:methods