title: Note: vibration reduction control of an atomic force microscope using an additional cantilever.
abstract: Since an atomic force microscope is used to measure sub-nanometer level precision, it is sensitive to external vibration. If the vibration can be measured by using an additional sensor, we can obtain the vibration-free signal by subtracting the vibration signal from the signal containing the vibration. To achieve a highly effective vibration rejection ratio, it is important to decide where to locate the additional sensor. This is because the vibration measured at the sensing position should have the same phase as that of the vibration in the signal. Vibration reduction control using this electrical sensing method is verified through time domain analysis and topology images of a standard grid sample.
authors: ICE/EV Convergence Technology Research Center, Korea Automotive Technology Institute, 74 Yongjung-Ri, Pungse-Myun, Dongnam-Gu, Chonan-Si, Chungnam 330-912, Republic of Korea. cskim@katech.re.kr
authors: Chulsoo
authors: C
authors: Kim
authors: Jongkyu
authors: J
authors: Jung
authors: Kyihwan
authors: K
authors: Park