title: Quantitative measurement of in-plane cantilever torsion for calibrating lateral piezoresponse force microscopy.
abstract: A simple quantitative measurement procedure of in-plane cantilever torsion for calibrating lateral piezoresponse force microscopy is presented. This technique enables one to determine the corresponding lateral inverse optical lever sensitivity (LIOLS) of the cantilever on the given sample. Piezoelectric coefficient, d(31) of BaTiO(3) single crystal (-81.62 ± 40.22 pm/V) which was calculated using the estimated LIOLS was in good agreement with the reported value in literature.
authors: Materials Science Division, Argonne National Laboratory, Lemont, Illinois 60439, USA.
authors: Hyunwoo
authors: H
authors: Choi
authors: Seungbum
authors: S
authors: Hong
authors: Kwangsoo
authors: K
authors: No