title: Planar waveguides with less than 0.1 dB/m propagation loss fabricated with wafer bonding.
abstract: We demonstrate a wafer-bonded silica-on-silicon planar waveguide platform with record low total propagation loss of (0.045 ± 0.04) dB/m near the free space wavelength of 1580 nm. Using coherent optical frequency domain reflectometry, we characterize the group index, fiber-to-chip coupling loss, critical bend radius, and propagation loss of these waveguides.
authors: Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA 93106, USA. jbauters@ece.ucsb.edu
authors: Jared F
authors: JF
authors: Bauters
authors: Martijn J R
authors: MJ
authors: Heck
authors: Demis D
authors: DD
authors: John
authors: Jonathon S
authors: JS
authors: Barton
authors: Christiaan M
authors: CM
authors: Bruinink
authors: Arne
authors: A
authors: Leinse
authors: René G
authors: RG
authors: Heideman
authors: Daniel J
authors: DJ
authors: Blumenthal
authors: John E
authors: JE
authors: Bowers
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D008027:Light; D012031:Refractometry / Q000295:instrumentation*; D012542:Scattering, Radiation; D012822:Silicon Dioxide / Q000737:chemistry*; D020349:Surface Plasmon Resonance / Q000295:instrumentation*
chemical_list: D012822:Silicon Dioxide