title: Development of a backscattering type ultraviolet apertureless near-field scanning optical microscope.
abstract: A backscattering type ultraviolet apertureless near-field scanning optical microscope (ANSOM) for the correlated measurement of topographical and optical characteristics of photonic materials with high optical resolution was developed. The near-field Rayleigh scattering image of GaN covered with periodic submicron Cr dots showed that optical resolution around 40 nm was achievable. By measuring the tip scattered photoluminescence of InGaN/GaN multi quantum wells, the applicability of the developed microscope for high resolution fluorescence measurement was also demonstrated.
authors: School of Mechatronics, Gwangju Institute of Science and Technology, Gwangju 500-712, Republic of Korea.
authors: Sangjin
authors: S
authors: Kwon
authors: Hyun
authors: H
authors: Jeong
authors: Mun Seok
authors: MS
authors: Jeong
authors: Sungho
authors: S
authors: Jeong