title: Electronic structure investigation of highly compressed aluminum with K edge absorption spectroscopy.
abstract: The electronic structure evolution of highly compressed aluminum has been investigated using time resolved K edge x-ray absorption spectroscopy. A long laser pulse (500 ps, I(L)≈8×10(13) W/cm(2)) was used to create a uniform shock. A second ps pulse (I(L)≈10(17)  W/cm(2)) generated an ultrashort broadband x-ray source near the Al K edge. The main target was designed to probe aluminum at reshocked conditions up to now unexplored (3 times the solid density and temperatures around 8 eV). The hydrodynamical conditions were obtained using rear side visible diagnostics. Data were compared to ab initio and dense plasma calculations, indicating potential improvements in either description. This comparison shows that x-ray-absorption near-edge structure measurements provide a unique capability to probe matter at these extreme conditions and severally constrains theoretical approaches currently used.
authors: LULI, École Polytechnique, CNRS, CEA, UPMC, Palaiseau, France. alessandra.benuzzi-mounaix@polytechnique.fr
authors: A
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authors: Benuzzi-Mounaix
authors: F
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authors: Dorchies
authors: V
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authors: Recoules
authors: F
authors: F
authors: Festa
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authors: Peyrusse
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authors: Levy
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authors: Ravasio
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authors: Hall
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authors: Koenig
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authors: Amadou
authors: E
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authors: Brambrink
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authors: Mazevet