title: Development of a graphite polarization analyzer for resonant inelastic x-ray scattering.
abstract: Resonant inelastic x-ray scattering (RIXS) is a powerful technique for studying electronic excitations in correlated electron systems. Current RIXS spectrometers measure the changes in energy and momentum of the photons scattered by the sample. A powerful extension of the RIXS technique is the measurement of the polarization state of the scattered photons which contains information about the symmetry of the excitations. This long-desired addition has been elusive because of significant technical challenges. This paper reports the development of a new diffraction-based polarization analyzer which discriminates between linear polarization components of the scattered photons. The double concave surface of the polarization analyzer was designed as a good compromise between energy resolution and throughput. Such a device was fabricated using highly oriented pyrolytic graphite for measurements at the Cu K-edge incident energy. Preliminary measurements on a CuGeO(3) sample are presented.
authors: Department of Physics, Western Michigan University, Kalamazoo, Michigan 49008-5252, USA.
authors: Xuan
authors: X
authors: Gao
authors: Clement
authors: C
authors: Burns
authors: Diego
authors: D
authors: Casa
authors: Mary
authors: M
authors: Upton
authors: Thomas
authors: T
authors: Gog
authors: Jungho
authors: J
authors: Kim
authors: Chengyang
authors: C
authors: Li