title: A study of capacitance-voltage characteristics of lead zirconate titanate ferroelectric thin films and their usage to investigate polarization and coercive field.
abstract: Capacitance-voltage (C-V) characteristics of lead zirconate titanate (PZT) thin films with a thickness of 130 nm were measured between 300 and 533 K. The transition between ferroelectric and paraelectric phases was revealed to be of second order in our case, with a Curie temperature at around 450 K. A linear relationship was found between the measured capacitance and the inverse square root of the applied voltage. It was shown that such a relationship could be fitted well by a universal expression of C/A = k(V+V(0))(-1/2) and that this expression could be derived by expanding the Landau-Devonshire free energy at an effective equilibrium position of the Ti/Zr ion in a PZT unit cell. By using the derived equations in this work, the free energy parameters for an individual material can be obtained solely from the corresponding C-V data, and the temperature dependences of both remnant polarization and coercive voltage are shown to be in quantitative agreement with the experimental data.
authors: College of Electronic Information and Control Engineering, Beijing University of Technology, 100 Pingle Yuan, Chaoyang District, Beijing 100124, People's Republic of China.
authors: H
authors: H
authors: Zhu
authors: D P
authors: DP
authors: Chu
mesh_terms: D025802:Electric Capacitance; D004560:Electricity; D058085:Iron Compounds / Q000737:chemistry; D007854:Lead / Q000737:chemistry*; D008280:Magnetics; D049329:Nanostructures; D014025:Titanium / Q000737:chemistry*; D015040:Zirconium / Q000737:chemistry*
chemical_list: D058085:Iron Compounds; C065536:lead titanate zirconate; D007854:Lead; D015040:Zirconium; D014025:Titanium