title: Evaluation of the ions release / incorporation of the prototype S-PRG filler-containing endodontic sealer.
abstract: OBJECTIVE
  This study aimed to evaluate a prototype surface reaction-type pre-reacted glass-ionomer (S-PRG) filler-containing endodontic sealer (S-PRG sealer) in terms of its ion-releasing ability and the incorporation of the released ions by root canal dentin.
  
  
  METHODS
  The concentration of ions in the set S-PRG sealer was measured by ICPS and with a fluoride ion electrode. Element mapping and chemical component bulk analysis of the outermost dentin of the S-PRG sealer-dentin interface were performed by SEM-EPMA. The incorporation depth of the elements in dentin was measured by element line scanning.
  
  
  CONCLUSIONS
  Ions released from the S-PRG sealer (Al, B, F, Na, Si, Sr, and Zn) were detected over time. The incorporation of fluoride (F), strontium (Sr), silicon (Si), and boron (B) was observed along the outermost dentin of the S-PRG sealer-dentin interface by EPMA analysis, and the incorporation depth increased with prolonged immersion.
  
  
  CONCLUSIONS
  The continuous release of ions from the S-PRG sealer and their subsequent incorporation by root canal dentin were confirmed.
authors: Division of Cariology, Operative Dentistry, and Endodontics, Department of Oral Health Science, Niigata University Graduate School of Medical and Dental Sciences.
authors: Linlin
authors: L
authors: Han
authors: Takashi
authors: T
authors: Okiji
mesh_terms: D000180:Acrylic Resins / Q000737:chemistry*; D000818:Animals; D002417:Cattle; D001840:Dental Bonding; D003786:Dental Pulp Cavity / Q000737:chemistry*; D003804:Dentin / Q000737:chemistry*; D005899:Glass Ionomer Cements / Q000737:chemistry*; D007477:Ions / Q000737:chemistry*; D010895:Pit and Fissure Sealants / Q000737:chemistry; D012822:Silicon Dioxide / Q000737:chemistry*
chemical_list: D000180:Acrylic Resins; D005899:Glass Ionomer Cements; D007477:Ions; D010895:Pit and Fissure Sealants; C015897:glass ionomer; D012822:Silicon Dioxide