title: Column-parallel correlated multiple sampling circuits for CMOS image sensors and their noise reduction effects.
abstract: For low-noise complementary metal-oxide-semiconductor (CMOS) image sensors, the reduction of pixel source follower noises is becoming very important. Column-parallel high-gain readout circuits are useful for low-noise CMOS image sensors. This paper presents column-parallel high-gain signal readout circuits, correlated multiple sampling (CMS) circuits and their noise reduction effects. In the CMS, the gain of the noise cancelling is controlled by the number of samplings. It has a similar effect to that of an amplified CDS for the thermal noise but is a little more effective for 1/f and RTS noises. Two types of the CMS with simple integration and folding integration are proposed. In the folding integration, the output signal swing is suppressed by a negative feedback using a comparator and one-bit D-to-A converter. The CMS circuit using the folding integration technique allows to realize a very low-noise level while maintaining a wide dynamic range. The noise reduction effects of their circuits have been investigated with a noise analysis and an implementation of a 1Mpixel pinned photodiode CMOS image sensor. Using 16 samplings, dynamic range of 59.4 dB and noise level of 1.9 e(-) for the simple integration CMS and 75 dB and 2.2 e(-) for the folding integration CMS, respectively, are obtained.
authors.affiliation: Research of Institute, Shizuoka University, 3-5-1 Johoku Nakaku Hmamatsu, Shizuoka, Japan. shsuh@idl.rie.shizuoka.ac.jp
authors.forename: Sungho
authors.initials: S
authors.lastname: Suh
authors.forename: Shinya
authors.initials: S
authors.lastname: Itoh
authors.forename: Satoshi
authors.initials: S
authors.lastname: Aoyama
authors.forename: Shoji
authors.initials: S
authors.lastname: Kawahito
mesh_terms: D008670:Metals / Q000737:chemistry*; D009622:Noise; D010087:Oxides / Q000737:chemistry*; D018401:Sample Size; D012666:Semiconductors / Q000295:instrumentation*; D012815:Signal Processing, Computer-Assisted / Q000295:instrumentation*
chemical_list: D008670:Metals; D010087:Oxides