title: Moiré pattern from a multiple Bragg-Laue interferometer.
abstract: In X-ray section topography of Si 220 diffraction in a multiple Bragg-Laue mode, a moiré pattern is observed when the incident beam is divided into two parts by inserting a platinum wire in the middle of the beam. The moiré pattern can be explained by the summation of two interference fringes corresponding to the two incident beams. The coherency of the X-rays from the bending-magnet beamline is estimated using the moiré pattern.
authors.affiliation: Saitama Institute of Technology, Fukaya, Saitama, Japan. hirano_k@sit.jp
authors.forename: Kenji
authors.initials: K
authors.lastname: Hirano
authors.forename: Tomoe
authors.initials: T
authors.lastname: Fukamachi
authors.forename: Yoshinobu
authors.initials: Y
authors.lastname: Kanematsu
authors.forename: Sukswat
authors.initials: S
authors.lastname: Jongsukswat
authors.forename: Riichirou
authors.initials: R
authors.lastname: Negishi
authors.forename: Dongying
authors.initials: D
authors.lastname: Ju
authors.forename: Keiichi
authors.initials: K
authors.lastname: Hirano
authors.forename: Takaaki
authors.initials: T
authors.lastname: Kawamura