title: X-ray-Raman-scattering-based EXAFS beyond the dipole limit.
abstract: X-ray Raman scattering (XRS) provides a bulk-sensitive method of measuring the extended X-ray absorption fine structure (EXAFS) of soft X-ray absorption edges. Accurate measurements and data analysis procedures for the determination of XRS-EXAFS of polycrystalline diamond are described. The contributions of various angular-momentum components beyond the dipole limit to the atomic background and the EXAFS oscillations are incorporated using self-consistent real-space multiple-scattering calculations. The properly extracted XRS-EXAFS oscillations are in good agreement with calculations and earlier soft X-ray EXAFS results. It is shown, however, that under certain conditions multiple-scattering contributions to XRS-EXAFS deviate from those in standard EXAFS, leading to noticeable changes in the real-space signal at higher momentum transfers owing to non-dipole contributions. These results pave the way for the accurate application of XRS-EXAFS to previously inaccessible light-element systems.
authors.affiliation: Department of Physics, University of Helsinki, Helsinki, Finland. simo.huotari@helsinki.fi
authors.forename: Simo
authors.initials: S
authors.lastname: Huotari
authors.forename: Tuomas
authors.initials: T
authors.lastname: Pylkkänen
authors.forename: J Aleksi
authors.initials: JA
authors.lastname: Soininen
authors.forename: Joshua J
authors.initials: JJ
authors.lastname: Kas
authors.forename: Keijo
authors.initials: K
authors.lastname: Hämäläinen
authors.forename: Giulio
authors.initials: G
authors.lastname: Monaco