title: Optical-force-induced artifacts in scanning probe microscopy.
abstract: In the practice of near-field scanning probe microscopy, it is typically assumed that the distance regulation is independent of the optical signal. However, we demonstrate that these two signals are entangled due to the inherent action of optically induced force. This coupling leads to artifacts in both estimating the magnitude of optical fields and recording topographic maps.
authors.affiliation: CREOL, The College of Optics and Photonics, University of Central Florida, Orlando, Florida 32816, USA.
authors.forename: Dana C
authors.initials: DC
authors.lastname: Kohlgraf-Owens
authors.forename: Sergey
authors.initials: S
authors.lastname: Sukhov
authors.forename: Aristide
authors.initials: A
authors.lastname: Dogariu
mesh_terms: D016477:Artifacts; D060733:Electromagnetic Radiation; D004867:Equipment Design; D008853:Microscopy / Q000379:methods; D018625:Microscopy, Atomic Force / Q000379:methods; D020527:Microscopy, Scanning Probe / Q000379:methods*; D055095:Optics and Photonics / Q000379:methods*; D015203:Reproducibility of Results; D012815:Signal Processing, Computer-Assisted; D013314:Stress, Mechanical