title: A scanning Kelvin probe for synchrotron investigations: the in situ detection of radiation-induced potential changes.
abstract: A wide range of high-performance X-ray surface/interface characterization techniques are implemented nowadays at every synchrotron radiation source. However, these techniques are not always `non-destructive' because possible beam-induced electronic or structural changes may occur during X-ray irradiation. As these changes may be at least partially reversible, an in situ technique is required for assessing their extent. Here the integration of a scanning Kelvin probe (SKP) set-up with a synchrotron hard X-ray interface scattering instrument for the in situ detection of work function variations resulting from X-ray irradiation is reported. First results, obtained on bare sapphire and sapphire covered by a room-temperature ionic liquid, are presented. In both cases a potential change was detected, which decayed and vanished after switching off the X-ray beam. This demonstrates the usefulness of a SKP for in situ monitoring of surface/interface potentials during X-ray materials characterization experiments.
authors.affiliation: Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf, Germany. salgin@mpie.de
authors.forename: Bekir
authors.initials: B
authors.lastname: Salgin
authors.forename: Dirk
authors.initials: D
authors.lastname: Vogel
authors.forename: Diego
authors.initials: D
authors.lastname: Pontoni
authors.forename: Heiko
authors.initials: H
authors.lastname: Schröder
authors.forename: Bernd
authors.initials: B
authors.lastname: Schönberger
authors.forename: Martin
authors.initials: M
authors.lastname: Stratmann
authors.forename: Harald
authors.initials: H
authors.lastname: Reichert
authors.forename: Michael
authors.initials: M
authors.lastname: Rohwerder