title: Numerical evaluation on heat transport characteristics between Al2O3 and ZnO materials in nanoscale situation.
abstract: The aim of this article is to provide a systematic method to perform numerical evaluation on the cross-plane thermal conductivity of Al(2)O(3)/ZnO film interface. The Equilibrium Molecular Dynamics (EMD) simulations method is used to investigate the cross-plane thermal conductivity of Al(2)O(3)/ZnO film interface along the direction of Z axis at different equilibrium temperature and film interface thickness. The Buckingham two-body potential function and Green-Kubo linear response theory are used for modeling and calculation. The results show that the size effect is obvious. It implies the film interface thickness is 23.4-52 Å and the equilibrium temperature is 300-600 K. The cross section thermal conductivity of Al(2)O(3)/ZnO film interface increases with the increase of interface thickness, and decreases with the increase in equilibrium temperature.
authors.affiliation: Laboratory of Advanced Design, Manufacturing & Reliability for MEMS/NEMS/ODES, Jiangsu University, Zhenjiang 212013, PR China. yangpingdm@ujs.edu.cn
authors.forename: Ping
authors.initials: P
authors.lastname: Yang
authors.forename: Haifeng
authors.initials: H
authors.lastname: Xu
authors.forename: Liqiang
authors.initials: L
authors.lastname: Zhang
authors.forename: Fangwei
authors.initials: F
authors.lastname: Xie
authors.forename: Jianming
authors.initials: J
authors.lastname: Yang
mesh_terms: D000537:Aluminum Oxide / Q000737:chemistry*; D049329:Nanostructures / Q000737:chemistry*; D013814:Thermal Conductivity; D015034:Zinc Oxide / Q000737:chemistry*
chemical_list: D000537:Aluminum Oxide; D015034:Zinc Oxide