title: Electronic bipolar resistance switching in an anti-serially connected Pt/TiO2/Pt structure for improved reliability.
abstract: Electronic bipolar resistive switching and its degradation in the Pt/TiO2/Pt structure were studied. The electronic bipolar switching was induced from the asymmetric trap distribution of the structure under its unipolar reset state. The imbalanced migration of oxygen accompanied by electronic switching significantly degrades switching endurance. Instead, the anti-serial connection of Pt/TiO2/Pt cells resulted in substantial improvements in endurance, underscoring the importance of vacancy migration in device reliability. In addition, the independent control of resistance states of the two connected cells provides the freedom to control resistance ratio, switching direction, and reliability.
authors.affiliation: WCU Hybrid Materials Program, Department of Materials Science and Engineering and Inter-University Semiconductor Research Center, Seoul National University, Seoul 151-744, Korea.
authors.forename: Kyung Min
authors.initials: KM
authors.lastname: Kim
authors.forename: Seungwu
authors.initials: S
authors.lastname: Han
authors.forename: Cheol Seong
authors.initials: CS
authors.lastname: Hwang