title: Automatic XAFS measurement system developed at BL14B2 in SPring-8.
abstract: A novel XAFS measurement system has been developed in which XAFS measurements can be performed including sample-loading and detector adjustments. With this system, XAFS measurements of up to 80 samples in both transmission and fluorescence modes can be carried out. The adjustment of the optical components has also been automated. It not only saves manpower and measurement time, but also improves the accuracy and reliability of sample alignments.
authors.affiliation: Japan Synchrotron Radiation Research Institute (JASRI), Sayo-gun, Hyogo, Japan. oji-h@spring8.or.jp
authors.forename: Hiroshi
authors.initials: H
authors.lastname: Oji
authors.forename: Yosuke
authors.initials: Y
authors.lastname: Taniguchi
authors.forename: Sayaka
authors.initials: S
authors.lastname: Hirayama
authors.forename: Hironori
authors.initials: H
authors.lastname: Ofuchi
authors.forename: Masashi
authors.initials: M
authors.lastname: Takagaki
authors.forename: Tetsuo
authors.initials: T
authors.lastname: Honma