Patterned ion beam implantation of Co ions into a SiO2 thin film via ordered nanoporous alumina masks.
Spatially patterned ion beam implantation of 190 keV Co(+) ions into a SiO(2) thin film on a Si substrate has been achieved by using nanoporous anodic aluminum oxide with a pore diameter of 125 nm as a mask. The successful synthesis of periodic embedded Co regions using pattern transfer is demonstrated for the first time using cross-sectional (scanning) transmission electron microscopy (TEM) in combination with analytical TEM. Implanted Co regions are found at the correct relative lateral periodicity given by the mask and at a depth of about 120 nm.
NanoLAB Centre, Department of Materials Science and Engineering, University of Sheffield, Sheffield, UK. w.guan@sheffield.ac.uk
Wei
W
Guan
Jay
J
Ghatak
Yong
Y
Peng
Nianhua
N
Peng
Chris
C
Jeynes
Beverley
B
Inkson
Günter
G
Möbus