Phase in nanooptics.
Quantitative phase measurements in imaging, microscopy, and nanooptics provide information not carried in amplitude measurements alone. In this issue of ACS Nano, Honigstein et al. present a new method in phase measurement. In this Perspective, we comment on this work and more broadly on the emerging role of phase and phase measurements in nanooptics.
Department Electrical and Computer Engineering and The Beckman Institute for Advanced Science and Technology, University of Illinois, Urbana, Illinois 61801, USA. carney@uiuc.edu
P Scott
PS
Carney
Bradley
B
Deutsch
Alexander A
AA
Govyadinov
Rainer
R
Hillenbrand
D016477:Artifacts; D003461:Crystallography / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D021621:Imaging, Three-Dimensional / Q000379:methods*; D020527:Microscopy, Scanning Probe / Q000379:methods*; D053758:Nanoparticles / Q000648:ultrastructure*